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1. 发明授权

US12044692B2 Automatic analyzer 有权
公开(公告)号：US12044692B2
公开(公告)日：2024-07-23
申请号：US17053844
申请日：2019-03-20
申请人： Hitachi High-Tech Corporation
发明人： Susumu Sakairi , Takenori Okusa , Takahiro Kumagai
IPC分类号： G01N35/10 , G01N35/00
CPC分类号： G01N35/1011 , G01N35/1002 , G01N2035/0091
摘要： A countersunk hole is added to a back surface of a dispensing chip mounting position of a sample dispensing chip installation table such that, when the dispensing chip is pulled up from the installation table, the amount of contact of a chip side surface is reduced and the chip is stably mounted. In addition, a posture control member during falling is added to a chip waste position, and the chip is caused to fall vertically and attachment of a sample to a waste route is suppressed. When a dispensing probe moves upward during dispensing chip separation, an upper end of the chip is moved upward up to a position in contact with a base and stopped and then is moved upward again. Thus, the posture of the chip during separation is stable. Further, plural positions for separating the chip are provided such that the position changes depending on waste timing.

2. 发明授权

US11933804B2 Automatic analyzer 有权
公开(公告)号：US11933804B2
公开(公告)日：2024-03-19
申请号：US17266674
申请日：2019-05-29
申请人： HITACHI HIGH-TECH CORPORATION
发明人： Takahiro Kumagai , Kazuhiro Noda , Yukinori Sakashita
IPC分类号： G01N35/10
CPC分类号： G01N35/1016 , G01N35/1011 , G01N2035/103
摘要： In a case where a dispensing tip is imaged from below, liquid attached to the tip falls downward and contaminates an imaging mechanism. An automatic analyzer includes: a buffer that has a hole for holding a tip for dispensing, the hole passing through the tip; a probe for dispensing having a tip to which the tip is attached; an imaging unit that images the tip; and a controller that controls the tip such that the tip is mounted on the probe by pressing the probe against the tip that passes through the hole to be held by the buffer, in which the imaging unit is disposed to image the tip from an upper side to a lower side in a gravity direction.

3. 发明授权

US11885824B2 Automatic analyzer 有权
公开(公告)号：US11885824B2
公开(公告)日：2024-01-30
申请号：US17437499
申请日：2020-02-04
申请人： Hitachi High-Tech Corporation
发明人： Takahiro Kumagai , Kazuhiro Noda , Nobuya Fukuda
IPC分类号： G01N35/10 , G01N35/00
CPC分类号： G01N35/1002 , G01N2035/00277 , G01N2035/00306 , G01N2035/00425 , G01N2035/00455
摘要： An automatic analyzer keeps the inside of a reagent cooler that stores a reagent vessel clean. The automatic analyzer includes: a reagent cooler that stores a reagent vessel containing a reagent to be reacted with a sample at a predetermined temperature. A reagent vessel replacement unit includes an opening configured to put the reagent vessel into and take the regent vessel out of the reagent cooler, wherein the opening is opened and closed to replace the reagent vessel. A positive pressure unit positively pressurizes the inside of the reagent cooler with respect to a periphery of the reagent cooler when the opening is opened.

4. 发明申请

US20230044702A1 ELECTROLYTE ANALYSIS APPARATUS 有权
公开(公告)号：US20230044702A1
公开(公告)日：2023-02-09
申请号：US17790784
申请日：2020-12-03
申请人： HITACHI HIGH-TECH CORPORATION
发明人： Yuichi Iwase , Takushi Miyakawa , Takahiro Kumagai , Haruyoshi Yamamoto , Tetsuji Kawahara
IPC分类号： B01F23/40 , G01N27/416 , B01F23/45 , B01F25/433 , G01N35/10
摘要： Provided is an electrolyte analysis apparatus capable of diluting and preparing a reagent with higher accuracy with a simpler device configuration, comprising a first flow path configured to send a high-concentration reagent from a high-concentration reagent bottle, a second flow path configured to send a reagent diluent from a reagent diluent bottle that stores the reagent diluent for diluting the high-concentration reagent, a junction unit configured to join the first flow path and the second flow path, a third flow path configured to send a mixed liquid, a dilution tank configured to store the prepared reagent, a prepared reagent discharge nozzle configured to discharge the prepared reagent, a liquid sending mechanism configured to send the reagent and the reagent diluent to the junction unit at a predetermined ratio so that the prepared reagent has a predetermined concentration, and an analysis unit configured to perform analysis with the prepared reagent.

5. 发明申请

US20210318350A1 AUTOMATIC ANALYZER 有权
公开(公告)号：US20210318350A1
公开(公告)日：2021-10-14
申请号：US17266674
申请日：2019-05-29
申请人： HITACHI HIGH-TECH CORPORATION
发明人： Takahiro Kumagai , Kazuhiro Noda , Yukinori Sakashita
IPC分类号： G01N35/10
摘要： In a case where a dispensing tip is imaged from below, liquid attached to the tip falls downward and contaminates an imaging mechanism. An automatic analyzer includes: a buffer that has a hole for holding a tip for dispensing, the hole passing through the tip; a probe for dispensing having a tip to which the tip is attached; an imaging unit that images the tip; and a controller that controls the tip such that the tip is mounted on the probe by pressing the probe against the tip that passes through the hole to be held by the buffer, in which the imaging unit is disposed to image the tip from an upper side to a lower side in a gravity direction.

6. 发明授权

US11041872B2 Automatic analysis device 有权
公开(公告)号：US11041872B2
公开(公告)日：2021-06-22
申请号：US16086844
申请日：2017-01-30
申请人： Hitachi High-Tech Corporation
发明人： Kazuhiro Noda , Tatsuya Fukugaki , Takahiro Kumagai
IPC分类号： G01N35/04 , G01N35/02 , G01N35/00
摘要： The present invention provides an automatic analysis device and an automatic specimen processing system having a component-rack supply mechanism that, in a state where a plurality of component racks each having a disposable component mounted thereon are stacked, separates only a component rack at the leading stage of the stack from the other component racks, and supplies the separated component rack to the automatic analysis device or the automatic specimen processing system. Specifically, the automatic analysis device and the automatic specimen processing system have a supply mechanism including a separation mechanism that, in a state where a plurality of component racks are stacked, separates only a component rack at the leading stage of the stack from the other component racks, where the separation mechanism includes a movable mechanism having a pair of downward-movement prevention members that can separate the leading stage from the second stage of the stacked component racks; and a correction mechanism having a pair of correction members that correct a positional deviation of the component racks in order to avoid an influence of the positional deviation of the stacked component racks.

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