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    • 1. 发明授权
    • Electron beam type pattern transfer apparatus
    • 电子束式图案转印装置
    • US4366383A
    • 1982-12-28
    • US165618
    • 1980-07-03
    • Shunichi SanoToshiaki ShinozakiIchiro Mori
    • Shunichi SanoToshiaki ShinozakiIchiro Mori
    • H01L21/027H01J37/317H01L21/30A61K27/02G01N21/64
    • H01J37/3175B82Y10/00B82Y40/00H01L21/30H01J2237/04735H01J2237/04922H01J2237/142H01J2237/31779Y10S505/879
    • An electron beam type pattern transfer apparatus has a photoelectric mask and a sample in a vacuum container made of non-magnetic material. The photoelectric mask is adapted to receive an ultraviolet ray from a light source and emit photoelectrons corresponding to a predetermined transfer pattern and the sample is disposed in parallel with the photoelectric mask with a predetermined distance left therebetween and illuminated with the photoelectrons to form a resist image thereon which corresponds to the transfer pattern. A power source for applying a voltage for accelerating the photoelectrons emitted is connected between the photoelectric mask and the sample. A pair of focusing magnets are disposed around the axis of the vacuum container such that they are located one at one outer side and one in an opposite outer side of the vacuum container to permit a vertical magnetic field to be created between the photoelectric mask and the sample. The focusing magnets have superconductive coils and are driven in a persistent mode.
    • 电子束型图案转印装置在由非磁性材料制成的真空容器中具有光电掩模和样品。 光电掩模适于从光源接收紫外线并发射对应于预定转印图案的光电子,并且将样品与光电掩模平行放置并保持在预定距离处并用光电子照射以形成抗蚀剂图像 对应于转印图案。 用于施加用于加速发射的光电子的电压的电源连接在光电掩模和样品之间。 一对聚焦磁铁设置在真空容器的轴线周围,使得它们位于真空容器的一个外侧和一个在相对的外侧中,从而允许在光电面罩和 样品。 聚焦磁体具有超导线圈并以持续模式驱动。
    • 2. 发明申请
    • Charged Particle Beam Orbit Corrector and Charged Particle Beam Apparatus
    • 带电粒子束轨道校正器和带电粒子束装置
    • US20080116391A1
    • 2008-05-22
    • US11943241
    • 2007-11-20
    • Hiroyuki ItoYuko SasakiTohru IshitaniYoshinori Nakayama
    • Hiroyuki ItoYuko SasakiTohru IshitaniYoshinori Nakayama
    • G21K1/087G21K1/093
    • H01J37/141H01J37/09H01J37/12H01J37/153H01J37/28H01J2237/142H01J2237/1534H01J2237/303
    • The present invention relates to an orbit correction method for a charged particle beam, and aims to solve problems inherent in conventional aberration correction systems and to provide a low-cost, high-precision, high-resolution optical converging system for a charged particle beam. To this end, employed is a configuration in which a beam orbit is limited in ring zone form to form a distribution of electromagnetic field converging toward the center of a beam orbit axis. Consequently, a nonlinear action outwardly augmented, typified by spherical aberration of an electron lens, can be cancelled out. Specifically, this effect can be achieved by an electron disposed on the axis and subjected to a voltage to facilitate the occurrence of electrostatic focusing. For a magnetic field, this effect can be achieved by forming a coil radially distributed-wound on a surface equiangularly divided in the direction of rotation to control convergence of a magnetic flux density.
    • 本发明涉及一种用于带电粒子束的轨道校正方法,其目的在于解决常规像差校正系统中固有的问题,并提供一种用于带电粒子束的低成本,高精度,高分辨率的聚光系统。 为此,所采用的是波束轨道受环形形式限制以形成朝向光束轨道中心收敛的电磁场分布的结构。 因此,可以抵消以电子透镜的球面像差为代表的向外扩大的非线性动作。 具体地说,这种效果可以通过设置在轴上的电子元件实现,并且经受电压以便于静电聚焦的发生。 对于磁场,这种效果可以通过在旋转方向上等角地分割的表面上形成径向分布缠绕的线圈来实现,以控制磁通密度的收敛。
    • 5. 发明授权
    • Device for the field emission of particles and production method
    • 颗粒场发射装置及生产方法
    • US08242674B2
    • 2012-08-14
    • US12449919
    • 2008-02-28
    • Josef Sellmair
    • Josef Sellmair
    • H01J1/50
    • H01J37/073H01J37/063H01J37/08H01J37/141H01J37/143H01J37/28H01J2237/06341H01J2237/06375H01J2237/0807H01J2237/0815H01J2237/142
    • The invention relates to an apparatus and a method for production of a device for thermally induced field emission of particles for particle optical devices such as in particular electron or ion microscopes, having at least one particle emitter (3) arranged in or pointing into a vacuum space (2) with at least one field emitter tip (4) for the emission of the particles, and having a magnetic field generator (6) attributed to the particle emitter (3) for focussing of the emitted particle beam (5), with the particle emitter (3) with its field emitter tip (4) is built by emitter structures (9) positioned on the surface (7) of a substrate (8) which is turned away from the magnetic field generator (6), and the substrate (8) formed as separating wall between vacuum space (2) and the atmospheric space (10) situated outside the vacuum space (2) at the side (14) of the substrate (8) which is turned away from the emitter structures (9).
    • 本发明涉及一种用于制造用于颗粒光学器件(例如电子或离子显微镜)的颗粒光学器件的热感应场发射装置的装置和方法,所述装置和方法具有布置在或指向真空中的至少一个粒子发射器(3) 具有用于发射颗粒的至少一个场发射器尖端(4)的空间(2),并且具有归因于用于聚焦发射的粒子束(5)的粒子发射器(3)的磁场发生器(6),与 具有其场发射极尖端(4)的粒子发射器(3)由位于离开磁场发生器(6)的衬底(8)的表面(7)上的发射器结构(9)构成,并且 基板(8),其形成为位于真空空间(2)和位于真空空间(2)外侧的大气空间(10)之间的分离壁,所述空间(2)位于离开发射器结构的基板(8)的侧面(14) 9)。
    • 9. 发明授权
    • Charged particle beam orbit corrector and charged particle beam apparatus
    • 带电粒子束轨道校正器和带电粒子束装置
    • US07947964B2
    • 2011-05-24
    • US11943241
    • 2007-11-20
    • Hiroyuki ItoYuko SasakiTohru IshitaniYoshinori Nakayama
    • Hiroyuki ItoYuko SasakiTohru IshitaniYoshinori Nakayama
    • G21K1/087
    • H01J37/141H01J37/09H01J37/12H01J37/153H01J37/28H01J2237/142H01J2237/1534H01J2237/303
    • The present invention relates to an orbit correction method for a charged particle beam, and aims to solve problems inherent in conventional aberration correction systems and to provide a low-cost, high-precision, high-resolution optical converging system for a charged particle beam. To this end, employed is a configuration in which a beam orbit is limited in ring zone form to form a distribution of electromagnetic field converging toward the center of a beam orbit axis. Consequently, a nonlinear action outwardly augmented, typified by spherical aberration of an electron lens, can be cancelled out. Specifically, this effect can be achieved by an electron disposed on the axis and subjected to a voltage to facilitate the occurrence of electrostatic focusing. For a magnetic field, this effect can be achieved by forming a coil radially distributed-wound on a surface equiangularly divided in the direction of rotation to control convergence of a magnetic flux density.
    • 本发明涉及一种用于带电粒子束的轨道校正方法,其目的在于解决常规像差校正系统中固有的问题,并提供一种用于带电粒子束的低成本,高精度,高分辨率的聚光系统。 为此,所采用的是波束轨道受环形形式限制以形成朝向光束轨道中心收敛的电磁场分布的结构。 因此,可以抵消以电子透镜的球面像差为代表的向外扩大的非线性动作。 具体地说,这种效果可以通过设置在轴上的电子元件实现,并且经受电压以便于静电聚焦的发生。 对于磁场,这种效果可以通过在旋转方向上等角地分割的表面上形成径向分布缠绕的线圈来实现,以控制磁通密度的收敛。
    • 10. 发明申请
    • DEVICE FOR THE FIELD EMISSION OF PARTICLES AND PRODUCTION METHOD
    • 用于颗粒的场发射和生产方法的装置
    • US20100090579A1
    • 2010-04-15
    • US12449919
    • 2008-02-28
    • Josef Sellmair
    • Josef Sellmair
    • H01J1/50H01J9/00
    • H01J37/073H01J37/063H01J37/08H01J37/141H01J37/143H01J37/28H01J2237/06341H01J2237/06375H01J2237/0807H01J2237/0815H01J2237/142
    • The invention relates to an apparatus and a method for production of a device for thermally induced field emission of particles for particle optical devices such as in particular electron or ion microscopes,having at least one particle emitter (3) arranged in or pointing into a vacuum space (2) with at least one field emitter tip (4) for the emission of the particles,and having a magnetic field generator (6) attributed to the particle emitter (3) for focussing of the emitted particle beam (5),with the particle emitter (3) with its field emitter tip (4) is built by emitter structures (9) positioned on the surface (7) of a substrate (8) which is turned away from the magnetic field generator (6),and the substrate (8) formed as separating wall between vacuum space (2) and the atmospheric space (10) situated outside the vacuum space (2) at the side (14) of the substrate (8) which is turned away from the emitter structures (9).
    • 本发明涉及一种用于制造用于颗粒光学器件(例如电子或离子显微镜)的颗粒光学器件的热感应场发射装置的装置和方法,所述装置和方法具有布置在或指向真空中的至少一个粒子发射器(3) 具有用于发射颗粒的至少一个场发射器尖端(4)的空间(2),并且具有归因于用于聚焦发射的粒子束(5)的粒子发射体(3)的磁场发生器(6),与 具有其场发射极尖端(4)的粒子发射器(3)由位于离开磁场发生器(6)的衬底(8)的表面(7)上的发射器结构(9)构成,并且 基板(8),其形成为位于真空空间(2)和位于真空空间(2)外侧的大气空间(10)之间的分离壁,所述空间(2)位于离开发射器结构的基板(8)的侧面(14) 9)。