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1. 发明申请

US20200271720A1 Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation 审中-公开
公开(公告)号：US20200271720A1
公开(公告)日：2020-08-27
申请号：US16870940
申请日：2020-05-09
申请人： HEFEI UNIVERSITY OF TECHNOLOGY
发明人： Yigang He , Wei He , Baiqiang Yin , Bing Li , Zhigang Li , Lei Zuo , Chaolong Zhang
IPC分类号： G01R31/3163 , G06N3/00 , G06N20/00 , G06N5/04
摘要： A method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation, includes steps of: step (1) acquiring a fault response voltage signal of an analog circuit; step (2) carrying out wavelet packet transform on the collected signal, and calculating a wavelet packet coefficient energy value as a characteristic parameter; step (3) utilizing a quantum particle swarm optimization algorithm to optimize a regularization parameter and kernel parameter of vector-valued regularized kernel function approximation, and training a fault diagnosis model; and step (4) utilizing the trained diagnosis model to recognize circuit faults.

2. 发明申请

US20190205683A1 FINGERPRINT RECOGNITION METHOD AND APPARATUS AND COMPUTER READABLE STORAGE MEDIUM 审中-公开
公开(公告)号：US20190205683A1
公开(公告)日：2019-07-04
申请号：US16232825
申请日：2018-12-26
申请人： BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
发明人： Xuebin HUANG
IPC分类号： G06K9/03 , G06K9/00 , G06K9/20 , G01R31/3163
摘要： A fingerprint recognition method includes: acquiring a prestored number of historical defect pixels after a fingerprint recognition sensor captures a first fingerprint image; prohibiting performing matching recognition on the first fingerprint image upon the number of the historical defect pixels being greater than or equal to a first preset number threshold; detecting a number of damaged capturing modules of the fingerprint recognition sensor to obtain a number of current defect pixels; and updating the number of the historical defect pixels by using the number of the current defect pixels, the updated number of the historical defect pixels being used for determining whether to perform matching recognition on a fingerprint image captured next time.

3. 发明授权

US09897649B2 Method for testing comparator and device therefor 有权
公开(公告)号：US09897649B2
公开(公告)日：2018-02-20
申请号：US14853090
申请日：2015-09-14
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Juxiang Ren , Chris C. Dao , Stefano Pietri
IPC分类号： G01R33/02 , H03K5/153 , G01R31/317 , G01R35/00 , G01R31/3163 , H03K5/24 , G01R31/3167
CPC分类号： G01R31/31703 , G01R31/3163 , G01R31/3167 , G01R35/00 , H03K5/24
摘要： An integrated circuit facilitates a self test routine that verifies proper operation of an analog comparator. In response to entering the self test routine, the voltage provided to an input of a comparator is changed from being at an operating voltage supply to being at a self test voltage that is used to verify operation of the comparator. In response to the comparator operating properly, the self test voltage provided to the input of the comparator is replaced with the operating voltage supply, and normal operation resumes. The duration of the self test cycle is based upon the amount of time during which the self test voltage is provided to the comparator is asynchronous in nature, and therefore not a function of a clock signal.

4. 发明申请

US20170045578A1 SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD 审中-公开
标题翻译：半导体器件和故障检测方法
公开(公告)号：US20170045578A1
公开(公告)日：2017-02-16
申请号：US15218006
申请日：2016-07-23
申请人： Renesas Electronics Corporation
发明人： Yuichi OKUDA , Hideo NAKANE , Takaya YAMAMOTO , Keisuke KIMURA , Takashi OSHIMA
IPC分类号： G01R31/3163
CPC分类号： G01R35/00 , G01R19/2509 , H03M1/1038 , H03M1/1076 , H03M1/468
摘要： The present invention provides a semiconductor device and a failure detection method capable of detecting an excessive variation among elements that constitute an analog circuit as a failure. According to an embodiment, a semiconductor device 1 includes: an AD converter 11; a digital assist circuit 12 that corrects an error of a digital signal Do corresponding to an analog signal Ain processed by the AD converter 11; and a failure detection circuit 13 that detects whether the AD converter 11 has a failure based on a correction amount by the digital assist circuit. The semiconductor device 1 is therefore able to detect the excessive variation among the elements that constitute the AD converter 11 as a failure.
摘要翻译：本发明提供能够检测构成模拟电路的元件之间的过度变化的故障的半导体器件和故障检测方法。根据实施例，半导体器件1包括：AD转换器11; 数字辅助电路12，其对与由AD转换器11处理的模拟信号Ain相对应的数字信号Do的错误进行校正; 以及故障检测电路13，其基于数字辅助电路的校正量来检测AD转换器11是否具有故障。因此，半导体器件1能够检测作为失败的构成AD转换器11的元件之间的过度变化。

5. 发明授权

US08836366B2 Method for testing integrated circuits with hysteresis 有权
标题翻译：用滞后检测集成电路的方法
公开(公告)号：US08836366B2
公开(公告)日：2014-09-16
申请号：US13454830
申请日：2012-04-24
申请人： Anh T. Hoang , Brian S. Park , Patrick D. McNamara
发明人： Anh T. Hoang , Brian S. Park , Patrick D. McNamara
IPC分类号： G01R31/02 , G01R31/28 , G01R31/3163
CPC分类号： G01R31/2834 , G01R31/2837 , G01R31/2841 , G01R31/2884 , G01R31/3163
摘要： A system and method for testing circuits. A generated input voltage waveform for a first phase of a test may use transitions with a voltage swing between expected low and high trigger points for an integrated circuit (IC) with hysteresis. A generated input voltage waveform for a second phase of the test may use transitions with a voltage swing between the expected low trigger point and a high sub-threshold value. The high sub-threshold value may be a tolerable voltage difference below the expected high trigger point. A generated input voltage waveform for a third phase of the test may use transitions with a voltage swing between the expected high trigger point and a low sub-threshold value. The low sub-threshold value may be a tolerable voltage difference above the expected low trigger point. The expected trigger points and sub-threshold values may be found from earlier characterization studies for the IC.
摘要翻译：一种用于测试电路的系统和方法。用于测试的第一阶段的生成的输入电压波形可以使用具有滞后的集成电路（IC）的期望的低和高触发点之间的电压摆幅的转换。用于测试的第二阶段的生成的输入电压波形可以使用具有期望低触发点和高次阈值之间的电压摆幅的转换。高子阈值可能是低于预期高触发点的可容忍电压差。用于测试的第三阶段的生成的输入电压波形可以使用在期望的高触发点和低子阈值之间的电压摆幅的转换。低子阈值可以是高于预期低触发点的容许电压差。预期的触发点和次阈值可以从IC的早期特征研究中找到。

6. 发明授权

US07434450B2 Method and apparatus for detecting exhaust gas sensor defect 失效
标题翻译：检测废气传感器缺陷的方法和装置
公开(公告)号：US07434450B2
公开(公告)日：2008-10-14
申请号：US11448794
申请日：2006-06-08
申请人： Kenji Tashiro , Yasushi Iwazaki , Masanobu Kanamaru , Hiroshi Sawada , Masaya Kawaji , Takashi Matsui
发明人： Kenji Tashiro , Yasushi Iwazaki , Masanobu Kanamaru , Hiroshi Sawada , Masaya Kawaji , Takashi Matsui
IPC分类号： G01R31/30 , G01R31/3163 , G01N27/12 , G01N27/30
CPC分类号： G01N27/4065
摘要： An air-fuel ratio sensor that outputs a sensor signal used for the feedback control of an air-fuel ratio is provided. It is determined whether an element crack is present by applying a reverse voltage to the air-fuel ratio sensor. The value of the sensor signal output from the air-fuel ratio sensor is corrected during a time period “A”. The time period “A” consists of a reverse-voltage application time period in which the reverse voltage is applied, and a return time period “T” after application of the reverse voltage ends. The return time period “T” is set based on sensor impedance correlated with the internal resistance of the air-fuel ratio sensor. The return time period “T” decreases as the sensor impedance decreases.
摘要翻译：提供输出用于空燃比的反馈控制的传感器信号的空燃比传感器。通过向空燃比传感器施加反向电压来确定是否存在元件裂纹。在空燃比传感器输出的传感器信号的值在时间段“A”期间被校正。时间段“A”包括施加反向电压的反向电压施加时间段，反向电压施加后的返回时间段“T”结束。基于与空燃比传感器的内阻相关的传感器阻抗来设定返回时间段“T”。返回时间段“T”随着传感器阻抗的减小而减小。

7. 发明公开

US20240125849A1 RF TESTING METHOD AND TESTING SYSTEM 审中-公开
公开(公告)号：US20240125849A1
公开(公告)日：2024-04-18
申请号：US18180243
申请日：2023-03-08
申请人： MEDIATEK INC.
发明人： Jung-Yin CHIEN , Po-Yen TSENG , Pin-Lin HUANG , Wen-Chih CHEN
IPC分类号： G01R31/3163 , G01R31/28 , H04B17/00
CPC分类号： G01R31/3163 , G01R31/2834 , H04B17/0085
摘要： An RF testing method is applied between a testing instrument and multiple devices under test at least including a first DUT and a second DUT. The testing instrument includes a signal generator and a signal analyzer. A sync signal is sent to the testing instrument and the first DUT, so that the first DUT occupies the signal generator to receive a testing signal from the signal generator. The first DUT sends an uplink signal to the signal analyzer based on the testing signal to occupy the signal analyzer for signal analysis at a first point in time. The sync signal is sent to the testing instrument and the second DUT, so that the second DUT occupies the signal generator to receive the testing signal from the signal generator at a second point in time. The first point in time is parallel to the second point in time.

8. 发明授权

US10691965B2 Fingerprint recognition method and apparatus and computer readable storage medium 有权
公开(公告)号：US10691965B2
公开(公告)日：2020-06-23
申请号：US16232825
申请日：2018-12-26
申请人： BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
发明人： Xuebin Huang
IPC分类号： G06K9/03 , G01R31/3163 , G06K9/00 , G06K9/20
摘要： A fingerprint recognition method includes: acquiring a prestored number of historical defect pixels after a fingerprint recognition sensor captures a first fingerprint image; prohibiting performing matching recognition on the first fingerprint image upon the number of the historical defect pixels being greater than or equal to a first preset number threshold; detecting a number of damaged capturing modules of the fingerprint recognition sensor to obtain a number of current defect pixels; and updating the number of the historical defect pixels by using the number of the current defect pixels, the updated number of the historical defect pixels being used for determining whether to perform matching recognition on a fingerprint image captured next time.

9. 发明授权

US10310049B2 Semiconductor device and failure detection method 有权
公开(公告)号：US10310049B2
公开(公告)日：2019-06-04
申请号：US15218006
申请日：2016-07-23
申请人： Renesas Electronics Corporation
发明人： Yuichi Okuda , Hideo Nakane , Takaya Yamamoto , Keisuke Kimura , Takashi Oshima
IPC分类号： G01R31/3163 , H03M1/10 , G01R19/25 , G01R35/00 , H03M1/46
摘要： The present invention provides a semiconductor device and a failure detection method capable of detecting an excessive variation among elements that constitute an analog circuit as a failure. According to an embodiment, a semiconductor device 1 includes: an AD converter 11; a digital assist circuit 12 that corrects an error of a digital signal Do corresponding to an analog signal Ain processed by the AD converter 11; and a failure detection circuit 13 that detects whether the AD converter 11 has a failure based on a correction amount by the digital assist circuit. The semiconductor device 1 is therefore able to detect the excessive variation among the elements that constitute the AD converter 11 as a failure.

10. 发明申请

US20120038378A1 METHOD AND DEVICE FOR SUPPLYING CLOCK 有权
标题翻译：用于提供时钟的方法和装置
公开(公告)号：US20120038378A1
公开(公告)日：2012-02-16
申请号：US13204971
申请日：2011-08-08
申请人： Hiroyoshi Yoda
发明人： Hiroyoshi Yoda
IPC分类号： G01R31/3163
CPC分类号： H03L3/00
摘要： A clock supplying device for supplying a clock signal to be used in an operation of a communication apparatus, includes an oscillator for generating the clock signal; a measurement unit for acquiring a reference clock signal extracted from a transmission line connected to the communication apparatus, and measuring a frequency difference between the clock signal and the reference clock signal; and a determiner for determining whether a warm-up operation of the oscillator unit has been completed or not, in accordance with measurement results of the frequency difference and a status of power supplying.
摘要翻译：提供用于通信装置的操作的时钟信号的时钟提供装置包括用于产生时钟信号的振荡器; 测量单元，用于获取从连接到所述通信设备的传输线提取的参考时钟信号，以及测量所述时钟信号和所述参考时钟信号之间的频率差; 以及根据频率差的测量结果和供电状态来确定振荡器单元的预热操作是否已经完成的确定器。

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