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    • 5. 发明申请
    • Image Exposing Apparatus and Microlens Array Unit
    • 图像曝光装置和微透镜阵列单元
    • US20080158532A1
    • 2008-07-03
    • US11813814
    • 2006-01-06
    • Hiromi Ishikawa
    • Hiromi Ishikawa
    • G03B27/34G02B27/10
    • G03F7/70916G02B6/4249G03F7/70275G03F7/70291G03F7/70808
    • In an image exposing apparatus that includes: a spatial optical modulation device having multitudes of pixel sections arranged two-dimensionally, each for modulating irradiated light; a light source for irradiating light on the spatial optical modulation device; and an image focusing optical system for focusing an image represented by the light modulated by the spatial optical modulation device on a photosensitive material, which includes image focusing lenses, and a microlens array disposed such that a plurality of microlenses are positioned at the image location of each of the pixel sections focused by the image focusing lenses, degradation in the image quality of an exposed image due to dust adhered to the microlens array is prevented by accommodating the microlens array in a housing having two transparent sections for transmitting the light to be passed through the microlens array and the light passed through the array.
    • 一种图像曝光装置,包括:空间光调制装置,其具有二维排列的多个像素部,每个用于调制照射光; 用于在所述空间光调制装置上照射光的光源; 以及用于将由空间光调制装置调制的光表示的图像聚焦在包括图像聚焦透镜的感光材料上的图像聚焦光学系统和布置成使得多个微透镜位于图像位置处的微透镜阵列 通过图像聚焦透镜聚焦的每个像素部分,通过将微透镜阵列容纳在具有两个透明部分的壳体中来防止由于附着在微透镜阵列上的灰尘引起的曝光图像的图像质量的劣化,用于透射要通过的光 通过微透镜阵列和光穿过阵列。
    • 7. 发明授权
    • System for correcting aberrations and distortions in EUV lithography
    • 用于校正EUV光刻中的像差和畸变的系统
    • US06897940B2
    • 2005-05-24
    • US10455254
    • 2003-06-04
    • Michael Sogard
    • Michael Sogard
    • G03F7/20G03F7/207H01L21/027G03B27/52G03B27/62G03B27/32G03B27/34
    • G03F7/70233G03F7/70258G03F7/70266G03F7/703G03F7/707G03F7/70708G03F7/70783G03F7/70875G03F7/70891Y10T428/24802
    • A system for correcting aberration and distortion in EUV lithography places a reticle on a deformable reticle chuck, and a reticle height sensor is used to measure the surface height of the reticle placed on the deformable reticle chuck. An optical system projects EUV radiation onto the reticle and collects and projects reflected EUV radiation from the reticle through its exit pupil onto a wafer placed on a wafer chuck. A deformable mirror disposed proximal to the exit pupil may also be controlled for this purpose. The deformable reticle chuck and the deformable mirror are controlled such that aberration and distortion of an image of the reticle formed on the wafer by the optical system are corrected based on the height measured by the reticle height sensor. The deformable reticle chuck includes a supporting structure, a deformable membrane disposed above and being comprised of a dielectric layer and a conductive layer, a voltage source connected to the conductive coating on the reticle and the conductive layer to generate an electrostatic attractive force between them, a plurality of actuator rods each connected to a corresponding one of actuators, and a coolant gas inside a chamber formed between the membrane and the top surface of the supporting structure. A deformable wafer chuck and wafer height sensor may be included to provide further correction of the image.
    • 用于校正EUV光刻中的像差和畸变的系统将光罩放置在可变形的光罩卡盘上,并且使用标线高度传感器来测量放置在可变形标线盘卡盘上的掩模版的表面高度。 光学系统将EUV辐射投射到掩模版上,并将来自掩模版的反射EUV辐射通过其出射光瞳聚集并投射到放置在晶片卡盘上的晶片上。 为了此目的也可以控制靠近出射光瞳设置的可变形反射镜。 控制可变形的光罩卡盘和可变形反射镜,使得基于由光罩高度传感器测量的高度来校正通过光学系统在晶片上形成的掩模版图像的像差和畸变。 可变形标线盘卡盘包括支撑结构,设置在电介质层和导电层之上并由导电层构成的可变形膜,连接到标线片上的导电涂层和导电层的电压源,以在它们之间产生静电引力, 多个致动器杆,每个致动器杆连接到相应的一个致动器,以及在膜和支撑结构的顶表面之间形成的室内的冷却剂气体。 可以包括可变形的晶片卡盘和晶片高度传感器以提供图像的进一步校正。
    • 8. 发明授权
    • Apparatus for producing photographic prints
    • 用于制作照片的设备
    • US6072562A
    • 2000-06-06
    • US150725
    • 1998-09-10
    • Beat Frick
    • Beat Frick
    • G03B27/32G03B27/34G03B27/40G03B27/46G03B27/47G03B27/68G03B27/42G03B27/52
    • G03B27/68G03B27/40G03B27/462G03B27/47G03B2227/005
    • A printing apparatus is disclosed which includes an original positioning device (3) for transporting an original (F) to and positioning it in a printing position, a printing material positioning device (2a) for transporting the photographic printing material (P) to and positioning it in an exposure position, a lighting device (4) for exposing the original, located in the printing position, to print light, an adjustable lens (5) for projecting the original, located in the printing position, onto the printing material located in the exposure position with an variable enlargement, a lens focusing device (6) for varying the enlargement of the lens (5), and a control device (10) for the original positioning device (3), the printing material positioning device (2a) and the lens focusing device (6). In order to produce arbitrary enlargements of sections, the lens (5) is disposed so as to be adjustable substantially crosswise to the transport direction (L) of the original (F), by means of a lens positioning device (12) that cooperates with the control device (10). In order to define a section to be copied from the original and to define a desired enlargement, a control device (13, 14) cooperating with the control device (10) is provided. The control device (10), on the basis of the detail and enlargement defined by the control device, controls the original positioning device (3), the lens positioning device (12), and the lens focusing device (6).
    • 本发明公开了一种打印装置,其中包括用于将原稿(F)输送到打印位置并将其定位在打印位置的原始定位装置(3),用于将照相打印材料(P)传送到和定位的打印材料定位装置 位于曝光位置的照明装置(4),用于使位于打印位置的原稿曝光以打印光;可调透镜(5),用于将位于打印位置的原稿投影到位于打印位置的打印材料 具有可变放大的曝光位置,用于改变透镜(5)的放大的透镜聚焦装置(6)和用于原始定位装置(3)的控制装置(10),打印材料定位装置(2a) 和透镜聚焦装置(6)。 为了产生部分的任意放大,透镜(5)通过与下述方式配合的透镜定位装置(12)设置成可以与原稿(F)的输送方向(L)基本上交叉地调节 控制装置(10)。 为了定义要从原件复制的部分并且限定期望的放大,提供了与控制装置(10)协作的控制装置(13,14)。 控制装置(10)基于由控制装置限定的细节和放大来控制原始定位装置(3),透镜定位装置(12)和透镜聚焦装置(6)。
    • 9. 发明授权
    • Carriage positioning structure for a scanner
    • 扫描仪的支架定位结构
    • US5875376A
    • 1999-02-23
    • US114266
    • 1998-07-13
    • Jason Chou
    • Jason Chou
    • H04N1/00H04N1/10H04N1/193G03B27/34G03G15/04G03G15/28H04N1/04
    • H04N1/00827H04N1/00795H04N1/1013H04N1/1021H04N1/1039H04N1/193H04N2201/0442
    • A carriage positioning structure includes a carriage pivoted to a longitudinal guide rod and reciprocated along a longitudinal sliding rail inside a scanner between a bottom shell and a flat glass plate, an image pick-up mechanism carried on the carriage and moved with the carriage to pick up the image of an object placed on the flat glass plate, a bottom guide wheel mounted on the carriage at the bottom and supported on the longitudinal sliding rail to guide reciprocating movement of the carriage along the longitudinal sliding rail, and a top guide wheel mounted on the carriage at the top and spaced below the flat glass plate by a gap, the top guide wheel being forced into contact with the flat glass plate by the gravity weight of the carriage when the scanner is turned upside down, permitting the carriage to be reciprocated on the flat glass plate along the longitudinal guide rod so that the image pick-up mechanism can pick up the image of a 3-D document placed below the scanner.
    • 托架定位结构包括一个转动到纵向引导杆上的托架,并沿着底壳和平板玻璃板之间的扫描仪内的纵向滑动轨道往复运动,一个承载在滑架上并与托架一起移动的图像拾取机构 放置在平板玻璃板上的物体的图像,底部引导轮,其安装在底部的托架上并被支撑在纵向滑轨上以引导托架沿着纵向滑轨的往复运动,以及安装在顶部导向轮 在顶部的滑架上并且通过间隙在平板玻璃板下方间隔开时,当扫描仪上下颠倒时,顶部导向轮由于托架的重力被迫与平板玻璃板接触,允许滑架为 沿着纵向导杆在平板玻璃板上往复运动,使得图像拾取机构可以拾取放置在扫描仪下方的3-D文档的图像。
    • 10. 发明授权
    • Auto focus system using twice reflection
    • 自动对焦系统使用两次反射
    • US5825469A
    • 1998-10-20
    • US953410
    • 1997-10-17
    • Byung-Ho NamJae-Keun Jeong
    • Byung-Ho NamJae-Keun Jeong
    • G02B7/28G02B3/10G03F7/207G03F9/00H01L27/14G03B27/34G03B27/42
    • G03F9/70
    • An auto focus system incudes a light source; a beam splitting means for transmitting a first beam emitted from the light source and reflecting a second beam emitted from the light source; a reflective mirror for reflecting the first beam from the beam splitting means; a wafer mounted on a wafer stage for receiving and reflecting the first beam reflected by the reflective mirror; a total reflection means for reversing a direction of the first beam from the wafer; a detector for detecting the first beam after the first beam is reflected from the total reflection means, the wafer, the reflective mirror, and the beam splitter, and for converting the first beam into an electrical signal; and a control unit for controlling the wafer stage in accordance with the electrical signal generated from the detector.
    • 自动对焦系统包含光源; 用于发射从光源发射的第一光束并反射从光源发出的第二光束的光束分离装置; 反射镜,用于从分束装置反射第一光束; 安装在晶片台上的晶片,用于接收和反射由反射镜反射的第一光束; 用于使来自晶片的第一光束的方向反转的全反射装置; 用于检测在第一光束从全反射装置,晶片,反射镜和分束器反射之后的第一光束的检测器,并用于将第一光束转换成电信号; 以及控制单元,用于根据从检测器产生的电信号来控制晶片台。