基本信息:
- 专利标题： 一种测量短时闪变的方法及系统
- 专利标题（英）：Method and system for measuring short-time flicker
- 申请号：CN201210417193.1 申请日：2012-10-26
- 公开(公告)号：CN102928703A 公开(公告)日：2013-02-13
- 发明人： 程许平 , 张进军 , 顾莉娜 , 文小龙
- 申请人： 深圳市华力特电气股份有限公司
- 申请人地址： 广东省深圳市南山区高新技术工业村R2栋B5
- 专利权人： 深圳市华力特电气股份有限公司
- 当前专利权人： 深圳市华力特电气有限公司
- 当前专利权人地址： 广东省深圳市南山区高新技术工业村R2栋B5
- 代理机构： 北京集佳知识产权代理有限公司
- 代理人： 王宝筠
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01R19/25
The invention discloses a method and a system for measuring short-time flicker. The method comprises the following steps of: obtaining instantaneous flicker values within a preset time; classifying the instantaneous flicker values, wherein each grade corresponds to one values of the instantaneous flicker values; recording the number of the instantaneous flicker values under each grade; according to the grade and the number of the instantaneous flicker values under each grade, confirming the five instantaneous flicker values which are just less than 0.1%, 1%, 3%, 10% and 50% in all the instantaneous flicker values; and computing the short-time flicker within the preset time according to a formula Pst=sqrt(0.0314P0.1+0.0525P1+0.0657P3+0.28P10+0.08P50). After the method or the system provided by the invention is adopted, the data size which needs to be stored in the process of computation can be reduced, the computation process of the short-time flicker can be supported by a mini type computation system, the computation process can be simplified, and the short-time flicker value can be timely obtained.
公开/授权文献:
- CN102928703B 一种测量短时闪变的方法及系统 公开/授权日：2015-01-21
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |