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    • 94. 发明公开
    • Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
    • 通过光网络分析interferometerbasierender的装置,用于光学部件的两个端口同时表征测试结构
    • EP1365525A2
    • 2003-11-26
    • EP02022707.0
    • 2002-10-10
    • Agilent Technologies, Inc.
    • Tan, Tun SeinBaney, Douglas M.
    • H04B10/08
    • G01M11/338G01M11/331
    • A test structure (200; 300; 400) supports simultaneous characterization of a two port optical component. The test structure includes an input port (226; 326; 426) for receiving an input signal from an optical source, two test ports (222, 224; 322, 324; 422, 424) for connecting the test structure to a component under test (202; 302; 402), separate optical paths for supplying reflected and transmitted optical response signals from the component under test to separate receivers (238, 240; 338, 340; 438, 440), and optical components (232, 234; 332, 334; 432, 434) for combining a first portion of the input signal with the reflected optical response signal before the first portion of the input signal and the reflected optical response signal are detected by a first receiver and for combining a second portion of the input signal with the optical response signal before the second signal and the optical response signal are detected by a second receiver. The optical component of the test structure may be connected by optical fibers or integrated into a single substrate.
    • 测试结构(200; 300; 400)支持的双端口光学部件的同时表征。 (226; 326; 426)的测试结构包括在输入端口,用于从光源,两个测试端口(222,224; 322,324; 422,424)在输入信号接收用于下测试的测试结构连接到一个组件 (202; 302; 402),用于测试被分离的接收器从所述部件供给反射和反式mitted光学响应信号分离的光学路径(238,240; 338,340; 438,440),和光学组件(232,234; 332 ,334; 432,434),用于将输入信号和反射光的响应信号的所述第一部分之前的输入信号的第一部分与所述反射光的响应信号组合由第一接收机和用于组合的第二部分检测到的 与所述第二信号之前的光学响应信号和所述光学响应信号的输入信号由第二接收器检测到。 测试结构的光学部件可以通过光纤连接或集成到单个基片。
    • 99. 发明公开
    • WAVELENGTH DISPERSION MEASURING DEVICE AND WAVELENGTH DISPERSION MEASURING METHOD USING SAME
    • 用于测量波长色散和方法测量波长分散体
    • EP2631627A1
    • 2013-08-28
    • EP11834338.3
    • 2011-10-18
    • Fujikura Co., Ltd.
    • OGAWA Kensuke
    • G01M11/02
    • G01J3/45G01M11/331G01M11/335G01M11/336
    • A chromatic dispersion measurement device may include a light branching unit that divides a incident measured light signal into a first measured light signal and a second measured light signal and causes a frequency difference between the first measured light signal and the second measured light signal when the signals are output, an optical phase shifter provided in either one of the first branch path and the second branch path having a polarization maintaining characteristic and periodically changing a phase α i of the measured light signal, an optical combination unit that combines the first measured light signal and the second measured light signal and outputs an interference element of an i-th optical component obtained by interference of the first measured light signal and the second measured light signal when the phase difference is the phase α i , as a combined measured light signal, a light frequency sweep unit that performs sweep of a frequency in a frequency range for passing the combined measured light signal performs frequency decomposition to extract a spectral component in the frequency range and outputs the result of the frequency decomposition as a measured component light signal, a light detection unit that converts the measured component light signal as an interference signal, and a control unit that performs a process of sequentially acquiring the interference signal corresponding to the i-th optical component in synchronization with a change in a phase of the optical phase shifter.
    • 色散测量装置可以包括光分支单元确实把一个入射光测量的光信号分成第一测量的光信号和第二测量的光信号,并且使所述第一测量的光信号和所述第二测量的光信号。当信号之间的频率差 输出到在所述第一分支通路中的一个和具有偏振保持特性,并周期性地改变相位±i中的测量的光信号的光学合成单元所做的第二分支路提供的光学移相器,将第一测量的光信号 和所述第二测量的光信号,并输出由所述第一测量的光信号和所述第二测量的光信号的干涉而获得的第i个光学部件的干涉元件当相位差是相位±I,作为组合的测得的光信号, 光频率扫描单元做了频率的执行扫描在适合的频率范围 荷兰国际集团的组合测量的光信号进行频率分解以提取在频率范围内的频谱分量和频率分解作为测定成分光信号的结果输出,光检测单元所做的测量的成分光信号转换为干扰信号,和 控制单元没有执行获取顺序地干扰信号对应于第i个光学部件同步地在光移相器的相位的变化的处理。