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    • 27. 发明授权
    • Optical angle measurement
    • 光学角度测量
    • US09435641B2
    • 2016-09-06
    • US13924797
    • 2013-06-24
    • Analog Devices, Inc.
    • Shrenik Deliwala
    • G01B11/26
    • G01B11/26G01B11/27G01B11/272G01C15/002G01C15/004
    • An optical detector may include an epitaxial layer having a continuous surface provided on a surface of a substrate. Two or more electrodes may be arranged at different positions in the epitaxial layer so that the electron-hole pairs generated in the epitaxial layer from incident light passing through the aperture and reaching the epitaxial layer have a varying probability of being collected by each of the electrodes as the angle of the incident light changes. The electrodes may be arranged at different depths in the epitaxial layer. The epitaxial layer may be continuous and have a continuous aperture-facing surface between each of the electrodes associated with a particular aperture to ensure that more light passing through the aperture is absorbable in the epitaxial layer and subsequently detectable by the electrodes. This may result in improved light detection capabilities.
    • 光学检测器可以包括具有设置在基板的表面上的连续表面的外延层。 两个或更多个电极可以布置在外延层中的不同位置处,使得在外延层中产生的入射光通过孔径并到达外延层的电子 - 空穴对具有被每个电极收集的变化的可能性 随着入射光的角度变化。 电极可以布置在外延层中的不同深度处。 外延层可以是连续的并且在与特定孔径相关联的每个电极之间具有连续的面向孔的表面,以确保穿过孔的更多的光在外延层中是可吸收的并且随后可被电极检测。 这可能导致改进的光检测能力。