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31. 发明授权

US11523490B2 Plasma device, plasma generation method 有权
公开(公告)号：US11523490B2
公开(公告)日：2022-12-06
申请号：US16970561
申请日：2018-03-20
申请人： FUJI CORPORATION
发明人： Takahiro Jindo
IPC分类号： H05H1/24 , H05H1/36
摘要： The object of the present disclosure is to efficiently generate plasma. In the plasma device of the present disclosure, a dielectric barrier discharger and an arc discharger are included, but the arc discharger is provided downstream from the dielectric barrier discharger in a discharge space where a gas for generating plasma is supplied. Dielectric barrier discharge occurs at the dielectric barrier discharger, and arch discharge occurs at the arc discharger. As a result of the gas for generating plasma being activated in the dielectric barrier discharge, the aforementioned gas can be adequately converted to plasma in the arc discharger.

32. 发明申请

US20220378396A1 ULTRASOUND PROBE OPERATION SYSTEM AND METHOD 有权
公开(公告)号：US20220378396A1
公开(公告)日：2022-12-01
申请号：US17886524
申请日：2022-08-12
申请人： ASAHI INTECC CO., LTD. , FUJI CORPORATION
发明人： Naofumi YOSHIDA , Yasuhiro YAMASHITA , Keisuke HIRANO , Hiroyuki SAITO , Makoto NISHIUCHI , Manabu SHIMOGAMI , Fumiyoshi OSHIMA
IPC分类号： A61B8/08 , G01S7/52 , G01S15/89 , A61B8/00
摘要： A system for operating an ultrasound probe that is provided with sensor operation portions for operating the ultrasound probe that acquires ultrasound echo images of a blood vessel, and a control portion that controls operations of the sensor operation portions. The control portion may switch the arrangement of the ultrasound probe using the sensor operation portions between a first arrangement for acquiring an image of a cross section in the transverse direction of the blood vessel and a second arrangement for acquiring an image of a cross section in the longitudinal direction of the blood vessel.

33. 发明申请

US20220378317A1 SYSTEM AND METHOD FOR DETECTING POSITION OF LONG MEDICAL DEVICE 有权
公开(公告)号：US20220378317A1
公开(公告)日：2022-12-01
申请号：US17884177
申请日：2022-08-09
申请人： ASAHI INTECC CO., LTD. , FUJI CORPORATION
发明人： Seigo KODAMA , Takeshi SATO , Joji ISOZUMI , Yasuhiro YAMASHITA , Makoto NISHIUCHI , Manabu SHIMOGAMI , Fumiyoshi OSHIMA
IPC分类号： A61B5/06 , A61B8/12
摘要： A system for detecting a position of a long medical device includes a model acquisition portion that acquires a blood vessel model, a correspondence detection portion 1 that detects a position of a long medical device inserted into a blood vessel and detects a correspondence between the blood vessel model and the position of the long medical device, and a display portion that displays the position of the long medical device in association with the blood vessel model on the basis of a detection result of the correspondence detection portion.

34. 发明授权

US11503753B2 Substrate processing management system 有权
公开(公告)号：US11503753B2
公开(公告)日：2022-11-15
申请号：US16633762
申请日：2017-07-25
申请人： FUJI CORPORATION
发明人： Toshiya Suzuki
IPC分类号： B23P19/00 , H05K13/08 , G06T7/00
摘要： The substrate processing management system for a substrate processing line including a defect tallying section to calculate a defect rate representing a rate of occurrence of substrates or electronic components determined to be defective with the substrate inspection machine, or obtain a number of defective products having substrates or electronic components determined to be defective; an attribute change recognition section to recognize when an attribute, among the attributes of the electronic component, having a possibility of affecting the inspection, has changed in the component mounting machine; a fault point estimation section to estimate, when the defect rate or the number of defective products exceeds a predetermined value, which of the component mounting machine or the substrate inspection machine is a fault point depending on whether an attribute has changed; and a countermeasure calling section configured to call for a defect countermeasure to the estimated fault point.

35. 发明授权

US11503752B2 Component mounting machine 有权
公开(公告)号：US11503752B2
公开(公告)日：2022-11-15
申请号：US16333464
申请日：2016-09-20
申请人： FUJI CORPORATION
发明人： Hiroaki Ina
IPC分类号： B23P19/00 , H05K13/04 , H05K13/08 , B23K1/00 , B23K3/08 , B23K3/06 , H05K3/34 , B23K101/36 , B23K101/42
摘要： Component mounting machine includes head, a device for moving head, transfer unit, and a mounting controller. Circular plate is an example of a container in which paste is placed. The bottom face of circular plate and the upper surface of the side wall have a predetermined height relationship. Height sensor is disposed on the lower face of head. Height sensor measures the height of the upper surface of the side wall of circular plate, which is a measurement point. The mounting controller recognizes the height of the bottom face of circular plate or the height of the surface of coating film disposed on circular plate from the height of the top surface of the side wall of circular plate measured by height sensor.

36. 发明授权

US11470724B2 Manufacturing apparatus for performing additive manufacturing of an electrical device 有权
公开(公告)号：US11470724B2
公开(公告)日：2022-10-11
申请号：US16688579
申请日：2019-11-19
申请人： FUJI CORPORATION
发明人： Masato Suzuki , Akihiro Kawajiri , Masatoshi Fujita , Kenji Tsukada , Yoshitaka Hashimoto
IPC分类号： H05K3/00 , B33Y30/00 , B33Y10/00 , B22F3/105 , B29C67/00 , H05K3/12 , H05K1/09 , H05K3/46 , B33Y80/00 , B23P21/00 , H05K3/10
摘要： A manufacturing apparatus that includes a conveyance device that moves a stage, where an electronic device shaped by multiple layers is placed, in X-axis and Y-axis directions. A first shaping unit, a second shaping unit, and a component mounting unit are arranged within a range in which the stage can move. The manufacturing apparatus performs additive manufacturing of the electronic device on the stage by performing a sequential movement of the stage to respective working positions of different units. As a result, in this manufacturing apparatus, a workpiece on the stage does not have to be removed and repositioned during each work process such as shaping by a first shaping unit, shaping by a second shaping unit, and electronic component mounting by a component mounting unit.

37. 发明申请

US20220322593A1 ALLOWANCE SETTING SYSTEM, SUBSTRATE INSPECTION DEVICE, ALLOWANCE SETTING METHOD, AND SUBSTRATE INSPECTION METHOD 有权
公开(公告)号：US20220322593A1
公开(公告)日：2022-10-06
申请号：US17619957
申请日：2019-06-21
申请人： FUJI CORPORATION
发明人： Yuta YOKOI , Mitsutaka INAGAKI , Kazuya KOTANI , Keiichi ONO
IPC分类号： H05K13/08
摘要： An allowance setting system, a substrate inspection device, an allowance setting method, and a substrate inspection method that can set an appropriate inspection allowance are provided in which a normal mounting position of electronic component on a component mounting surface of substrate is defined as normal position. A deviation of an actual mounting position of electronic component in a surface direction of the component mounting surface with respect to the normal position is defined as surface direction deviation. A deviation of the actual mounting position of electronic component in a rotation direction within the component mounting surface with respect to normal position is defined as angular deviation. Allowance setting system sets multiple surface direction inspection allowances according to angular deviation for evaluating surface direction deviation in a substrate inspection before reflow.

38. 发明授权

US11454660B2 Measurement device for measuring an electrical characteristic of a component 有权
公开(公告)号：US11454660B2
公开(公告)日：2022-09-27
申请号：US17261465
申请日：2018-07-20
申请人： FUJI CORPORATION
发明人： Toshihiko Sasaki , Toshiyuki Sawada
IPC分类号： G01R27/02 , H05K13/08
摘要： A measurement device to automatically measure an electrical characteristic of a component is mounted on a mounter for mounting a component on a circuit board. The measurement device includes a main body, a loading stand on which a component is placed, a pair of measuring elements provided in such a manner as to move towards and away from each other, and a loading stand moving device for moving the loading stand. The loading stand moving device includes a guide rail provided on the main body, and the loading stand is held movably onto the guide rail. This configuration enables an electrical charge stored in a component held onto the loading stand and an electrical charge stored in the loading stand to be removed well by way of the guide rail and the main body. As a result, an electrical characteristic held by the component can be measured stably.

39. 发明授权

US11452248B2 Work machine 有权
公开(公告)号：US11452248B2
公开(公告)日：2022-09-20
申请号：US16483058
申请日：2017-02-08
申请人： FUJI CORPORATION
发明人： Toru Matsumoto
IPC分类号： H05K13/02 , H05K13/04 , B25J15/06 , G05B19/4061 , H05K13/08 , B25J9/16
摘要： A work machine including a work head including a holding tool to pick up and hold a component, a rotating device to rotate the holding tool about an axis of the holding tool, a pivoting device to pivot the holding tool between a first attitude in which a distal end portion of the holding tool faces downward and a second attitude in which the distal end portion of the holding tool faces sideways; a moving device to move the work head; and a control device to control operation of the work head and the moving device, the control device including an operation control section to cause the holding tool to pivot from the first attitude to the second attitude, and to cause the holding tool to rotate from a holding angle that is a rotation angle when the component was picked up to a target angle.

40. 发明授权

US11445648B2 Feeder 有权
公开(公告)号：US11445648B2
公开(公告)日：2022-09-13
申请号：US16316113
申请日：2016-07-08
申请人： FUJI CORPORATION
发明人： Yukinori Takada
IPC分类号： H05K13/02 , H05K13/04 , H05K13/08
摘要： A feeder including: a feeder main body with a supply position, the feeder being configured to supply an electronic component from an electronic component housing section that houses many of the electronic components one by one to the supply position; and a handle attached to an upper surface of the feeder main body, the handle being made from a flexible strip member so as to be able to change shape.

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