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    • 8. 发明申请
    • PARTICLE CHARACTERISATION METHOD AND APPARATUS
    • WO2023285841A1
    • 2023-01-19
    • PCT/GB2022/051852
    • 2022-07-18
    • MALVERN PANALYTICAL LIMITED
    • MARWICK, DanielMAZILU, Michael
    • G06F17/16G02B5/00G06N3/00
    • A method of preparing a representative particle size and refractive index database, for use in determining the size and refractive index of one or more particles within a sample (8) is disclosed. A method of determining the size and refractive index of one or more particles contained within a sample (8) is also disclosed. The size and refractive index determination method comprises: obtaining a measured scattering pattern for said particles, the measured scattering pattern comprising a number of data dimensions; reducing, using a processor (14), the number of data dimensions associated with the measured scattering pattern to obtain dimensionally reduced measured data; comparing, using the processor, the dimensionally reduced measured data with a representation of reference scattering patterns, said reference scattering patterns corresponding to particles having a range of known sizes and refractive indices; and selecting, as the size and refractive index of the one or more particles contained within the sample, the known size and refractive index corresponding to the representation of the reference scattering patterns which most closely corresponds to the dimensionally reduced measured data.