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1. 发明专利

JP5210164B2 Using a conceptual segment model, a method to predict the physical properties in the computer and its system 有权
公开(公告)号：JP5210164B2
公开(公告)日：2013-06-12
申请号：JP2008533554
申请日：2006-09-28
申请人：アスペンテクノロジーインコーポレイテッドAspen Technology, Inc.
发明人：チャウ−チュンチェン、
IPC分类号： G06Q10/04 , C07B61/00 , C40B50/02 , G06F9/26 , G06F19/00 , G06G7/48 , G06G7/58
CPC分类号： G06F19/704

2. 发明专利

JP2008198213A Sensor validation apparatus and method 有权
标题翻译：传感器验证装置和方法
公开(公告)号：JP2008198213A
公开(公告)日：2008-08-28
申请号：JP2008033036
申请日：2008-02-14
申请人： Aspen Technology Inc , アスペンテクノロジーインコーポレイテッド
发明人： QIN S JOE , GUIVER JOHN
IPC分类号： G01D21/00 , G05B9/02 , G01M99/00 , G05B23/02
CPC分类号： G05B9/02 , G05B23/0221
摘要： PROBLEM TO BE SOLVED: To provide a new apparatus and a method for detecting, identifying, estimating, restructuring and classifying a faulty sensor. SOLUTION: The apparatus and method is disclosed for detecting, identifying, and classifying faults occurring in sensors measuring a process. If faults are identified in one or more sensors, the apparatus and method provide replacement values for the faulty sensors so that any process controllers and process monitoring systems that use these sensors can remain in operation during the fault period. The identification of faulty sensors is achieved through the use of a set of structured residual transforms that are uniquely designed to be insensitive to specific subsets of sensors, while being maximally sensitive to sensors not in the subset. Identified faults are classified into one of the types Complete Failure, Bias, Drift, Precision Loss, or Unknown. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供用于检测，识别，估计，重组和分类故障传感器的新装置和方法。公开了用于检测，识别和分类在测量过程的传感器中发生的故障的装置和方法。如果在一个或多个传感器中识别故障，则该设备和方法为故障传感器提供替换值，以便使用这些传感器的任何过程控制器和过程监控系统在故障期间都能保持运行。故障传感器的识别通过使用一组结构化的残差变换来实现，该组合被唯一地设计成对传感器的特定子集不敏感，同时对不在子集中的传感器最大程度地敏感。识别的故障分为完全故障，偏差，漂移，精度损失或未知的类型之一。版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2009510619A Using a conceptual segment model, a method to predict the physical properties in the computer and its system 有权
公开(公告)号：JP2009510619A
公开(公告)日：2009-03-12
申请号：JP2008533554
申请日：2006-09-28
申请人：アスペンテクノロジーインコーポレイテッドAspen Technology, Inc.
发明人：チャウ−チュンチェン、
IPC分类号： G06Q10/00 , C07B61/00 , C40B50/02 , G06F9/26 , G06F19/00 , G06G7/48 , G06G7/58
CPC分类号： G06F19/704
摘要：工業的な生産、研究、または開発を行う方法。該方法は、コンピュータによって実行される、化学種の各々に対して少なくとも１つの概念的セグメントを決定することにより、少なくとも２つの化学種の混合物の少なくとも１つの物理的特性をモデル化するステップを有する。化学種の各々に対して少なくとも１つの概念的セグメントを決定する該ステップは、各概念的セグメントの同一性および等価な数を定義することを含んでいる。

4. 发明专利

CA2793508A1 CONFIGURATION ENGINE FOR A PROCESS SIMULATOR 未知
公开(公告)号：CA2793508A1
公开(公告)日：2011-10-27
申请号：CA2793508
申请日：2011-04-21
申请人： ASPEN TECHNOLOGY INC
发明人： BLEACKLEY DAVID , WASSENHOVE WILLEM VAN
IPC分类号： G06F17/50
摘要： A computer modeling apparatus includes an input module enabling user specification of a subject facility design based on limited data. The subject facility design includes design alternatives, and a processor routine coupled to the input module and responsive to the user specification by forming an input data set to a rigorous simulation modeler to model the subject facility design. The rigorous simulation modeler requires input beyond the limited data. The processor routine enables execution of the simulation modeler. The computer modeling apparatus further includes an interface member that enables the production of a rigorous simulation model of the subject facility design from the simulation modeler. The subject facility is one of an oil processing facility, a gas processing facility, an oil and gas separation facility, or a chemical processing facility.

5. 发明专利

CA2762484A1 APPARATUS AND METHOD FOR MODEL QUALITY ESTIMATION AND MODEL ADAPTATION IN MULTIVARIABLE PROCESS CONTROL 未知
公开(公告)号：CA2762484A1
公开(公告)日：2010-12-02
申请号：CA2762484
申请日：2010-05-24
申请人： ASPEN TECHNOLOGY INC
发明人： ZHENG QINGSHENG Q , ZHAO HONG
IPC分类号： G05B13/04
摘要： Apparatuses and methods for model quality estimation and model adaptation in multivariable process control are disclosed. A method for updating a multiple input multiple output (MIMO) dynamical model of a process includes perturbing the process, auditing the controller model, identifying poor performing submodels and re-testing the relevant process variables, re-identifying submodels and adapting the model online while the process continues to operate within normal operating parameters. An apparatus comprises an online multivariable controller, a tester, a database to store data corresponding to manipulated variables and controlled variables, and a performance diagnosis module configured to identify problematic submodels and adapt a model used by the controller.

6. 发明专利

AT472758T 未知
公开(公告)号：AT472758T
公开(公告)日：2010-07-15
申请号：AT04757833
申请日：2004-03-19
申请人： ASPEN TECHNOLOGY INC
发明人： ZHENG QINGSHENG , HARMSE MAGIEL , RASMUSSEN KENT , MCINTYRE BLAINE
IPC分类号： G05B13/04 , G05B17/02
摘要： Systematic methods to detect, verify, and repair a collinear model are presented. After detecting collinearity in a model or subsets of a model, a directional test is carried out to verify if the collinearity is real. The model can then be adjusted in either direction to making a near collinear model exactly collinear or less collinear, subject to model uncertainty bounds or other linear constraints. When doing the model adjustment, deviations from the original model are minimized and the directionality of the model is kept unchanged.

7. 发明专利

CA2736210A1 SYSTEMS AND METHODS FOR MODELING OF CRYSTALLIZATION PROCESSES 未知
公开(公告)号：CA2736210A1
公开(公告)日：2010-03-18
申请号：CA2736210
申请日：2009-08-26
申请人： ASPEN TECHNOLOGY INC
发明人： CHEN CHAU-CHYUN , HE XIANG , ANAVI SELIM
IPC分类号： B01D9/00 , A61K9/16
摘要： A computer system and method of modeling a crystallization process includes representing a plurality of crystals in a solution by different subsets of the plurality, tracking increase of the respective characteristic length of each crystal group, and determining a crystal size distribution to output a model to a user. Ech subset forms a respective crystal group characterized by group attributes of (i) a number of crystals and (ii) a characteristic length. Additionally, the system and method track generation of new crystal groups generated by seeding, nucleation and/or breakage.

8. 发明专利

CA2149169C PLANT SIMULATION AND OPTIMIZATION SOFTWARE APPARATUS AND METHOD USING DUAL EXECUTION MODELS 未知
公开(公告)号：CA2149169C
公开(公告)日：2005-03-29
申请号：CA2149169
申请日：1995-05-11
申请人： ASPEN TECHNOLOGY INC
发明人： BRITT HERBERT I , JOSHI AMOL P , MAHALEC VLADIMIR , PIELA PETER C , VENKATARAMAN SWAMINATHAN
IPC分类号： G06F17/12 , G06F19/00
摘要： A software system simulates and optimizes a processing plant design. The software system includes a plurality of equipment models for simulating each piece of equipment in the processing plant design. A sequential modular simulation routine executes the equipment models in a first mode to define a first set of values of the operating parameters of the processing plant design. An optimization routine executes the equipment models in a second mode. The optimization routine utilizes the first set of values for the operating parameters from the sequential simulation routine and subsequently determines values of the operating parameters at which the processing plant design is optimized. The equipment models after execution by the sequential simulation routine and optimization routine store the first and second sets of values for the operating parameters in a common plant model file. Hence, the plant model file holds values computed during the sequential simulation routine as well as those computed during the optimization routine.

9. 发明专利

DE60102242T2 未知
公开(公告)号：DE60102242T2
公开(公告)日：2005-01-27
申请号：DE60102242
申请日：2001-06-27
申请人： ASPEN TECHNOLOGY INC
发明人： TURNER PAUL , GUIVER P , LINES BRIAN , TREIBER STEVEN
IPC分类号： G06N3/00 , G05B13/02 , G05B13/04 , G05B17/02
摘要： A constrained non-linear approximator for empirical process control is disclosed. The approximator constrains the behavior of the derivative of a subject empirical model without adversely affecting the ability of the model to represent generic non-linear relationships. There are three stages to developing the constrained non-linear approximator. The first stage is the specification of the general shape of the gain trajectory or base non-linear function which is specified graphically, algebraically or generically and is used as the basis for transfer functions used in the second stage. The second stage of the invention is the interconnection of the transfer functions to allow non-linear approximation. The final stage of the invention is the constrained optimization of the model coefficients such that the general shape of the input/output mappings (and their corresponding derivatives) are conserved.

10. 发明专利

AT220222T 未知
公开(公告)号：AT220222T
公开(公告)日：2002-07-15
申请号：AT99912825
申请日：1999-03-25
申请人： ASPEN TECHNOLOGY INC
发明人： HAMIELEC ALVIN E , OSIAS MARTINE , RAMANATHAN SUNDARAM , SIROHI ASHURAJ , CHEN CHAU-CHYUN
IPC分类号： B01J19/00 , C08F2/00 , C08F10/00 , C08G85/00 , G05B17/02 , G06F19/00

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