专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

91. 发明授权

US11630163B1 Multi-core cable testing device and method for testing the multi-core cable 有权
公开(公告)号：US11630163B1
公开(公告)日：2023-04-18
申请号：US17553346
申请日：2021-12-16
申请人： Hitachi Metals, Ltd.
发明人： Yohei Shirakawa
IPC分类号： G01R31/60 , G01R27/26 , H01B7/00
摘要： A multi-core cable testing device is configured to specify a correspondence between ends of an insulated wire at both ends of a multi-core cable including insulated wires. The device includes a signal input unit for inputting a test signal by capacitive coupling into one end of the insulated wire as a testing object at one end of the multi-core cable, a signal output unit for outputting the test signal by capacitive coupling from each end of the insulated wires at the other end of the multicore cable, a correspondence specifying unit for measuring a voltage of the test signal from the signal output unit and for specifying an other side end of the insulated wire based on a measured voltage. At least one of the signal input unit and the signal output unit includes a signal transmission cable for transmitting the test signal and a substrate configured to be connected to the signal transmission cable. The substrate includes a first electrode to be connected to a signal conductor of the signal transmission cable on one main surface of the substrate, and a second electrode to be capacitively coupled to an end of the insulated wire on the other main surface. A transmission path for transmitting the test signal between the first electrode and the second electrode is provided within the substrate, and a shielding layer is provided at the substrate.

92. 发明授权

US11630158B1 System for electro-magnetic induction spectroscopy (EMIS) of battery cells while forming and cycling 有权
公开(公告)号：US11630158B1
公开(公告)日：2023-04-18
申请号：US17490519
申请日：2021-09-30
申请人： GM GLOBAL TECHNOLOGY OPERATIONS LLC
发明人： Erik Damon Huemiller , Ryan Curtis Sekol , Shaomao Xu , Duane S. Carper , Nahel Eshaq , Raffaello Ardanese
IPC分类号： G01R31/382 , H01M10/48 , G01R31/392 , H01M10/0525 , H01M10/42
摘要： A system for testing a battery cell includes a test fixture configured to enclose the battery cell, a battery cycler configured to alternately charge and discharge the battery cell, an antenna mounted on a surface of the test fixture, the antenna configured to detect an electromagnetic signature of the battery cell and generate a signal indicative of the electromagnetic signature, and a detection module configured to receive the signal and detect characteristics of the battery cell based on the signal.

93. 发明授权

US11630157B2 Apparatus and method with battery state estimation 有权
公开(公告)号：US11630157B2
公开(公告)日：2023-04-18
申请号：US16281438
申请日：2019-02-21
申请人： Samsung Electronics Co., Ltd.
发明人： Kaeweon You , Sangdo Park
IPC分类号： G01R31/367 , G01R31/3828 , G01R31/3842 , G01R31/388 , B60L53/10 , B60L58/12 , G01R31/36 , G06N3/08
摘要： A processor-implemented method of estimating a state of a battery includes acquiring current information and voltage information of a battery; determining time interval values based on the acquired current information such that current integration values corresponding to the time variation values satisfy a condition; determining voltage values corresponding to the determined time interval values in the acquired voltage information; and determining state information of the battery based on the determined voltage values.

94. 发明授权

US11630153B2 Chip testing apparatus and system with sharing test interface 有权
公开(公告)号：US11630153B2
公开(公告)日：2023-04-18
申请号：US17239688
申请日：2021-04-26
申请人： Winbond Electronics Corp.
发明人： Chih-Chiang Lai , Cheng-Ching Huang
IPC分类号： G01R31/3185 , G01R1/067 , G11C29/12
摘要： A chip testing apparatus and system suitable for performing testing on multiple chips in a chip cluster are provided. The chip testing apparatus includes a signal interface and a test design circuit. The signal interface transmits an input signal and multiple driving signals in parallel from a test equipment to each of the chips. The test design circuit receives multiple output signals from the chips through the signal interface and serially outputs a test data to the test equipment according to the output signals.

95. 发明授权

US11630149B2 Method and system for wafer-level testing 有权
公开(公告)号：US11630149B2
公开(公告)日：2023-04-18
申请号：US17353543
申请日：2021-06-21
申请人： TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
发明人： Jun He , Yu-Ting Lin , Wei-Hsun Lin , Yung-Liang Kuo , Yinlung Lu
IPC分类号： G01R31/28
摘要： The present disclosure provides a method and a system for testing semiconductor device. The method includes the following operations. A wafer having an IC formed thereon is provided. The IC is energized by raising the voltage of the IC to a first voltage level during a first period. A stress signal is applied to the IC. The stress signal includes a plurality of sequences during a second period subsequent to the first period. Each of the sequence has a ramp-up stage and a ramp-down stage. The stress signal causes the voltage of the IC to fluctuate between a second voltage level and a third voltage level. Whether the IC complies with a test criterion is determined after applying the stress signal.

96. 发明授权

US11630147B2 Low-thermal resistance pressing device for a socket 有权
公开(公告)号：US11630147B2
公开(公告)日：2023-04-18
申请号：US17551246
申请日：2021-12-15
申请人： CHROMA ATE INC.
发明人： Ming Cheng Huang , Tsung-I Lin , Hui-Jung Wu , Chien-Ming Chen
IPC分类号： G01R31/28 , G01R1/04
摘要： The present invention relates to a low-thermal resistance pressing device for a socket, which mainly comprises a housing, an inner collar, a heat conductive pressing block, a bearing collar and a locking member. The locking member on the housing is used to lock the socket. The inner collar is threadedly engaged with the housing. The bearing collar is located between the inner collar and the heat conductive pressing block. In the case of rotating the inner collar in the housing, the bearing collar drives the heat conductive pressing block to move axially so as to exert an axial force to a device to be tested. Because the heat conductive pressing block protrudes from the upper and lower surfaces of the housing, one end thereof can be in contact with a temperature control module, and the other end thereof can be in contact with the device to be tested.

97. 发明授权

US11630143B2 Microwave sensor using autler-townes splitting 有权
公开(公告)号：US11630143B2
公开(公告)日：2023-04-18
申请号：US17734706
申请日：2022-05-02
申请人： ColdQuanta, Inc.
发明人： Evan Salim , Dana Zachary Anderson , Jayson Denney , Farhad Majdeteimouri
IPC分类号： G01R29/08 , G01R33/60
摘要： A microwave sensor determines an electric-field strength of a microwave field populated by quantum particles in an ultra-high vacuum (UHV) cell. A probe laser beam and a coupling laser beam are directed into the UHV cell so that they are generally orthogonal to each other and intersect to define a “Rydberg” intersection, so-called as the quantum particles within the Rydberg intersection transition to a pair of Rydberg states. The frequency of the probe laser beam is swept so that a frequency spectrum of the probe laser beam can be captured. The frequency spectrum is analyzed to determine a frequency difference between Autler-Townes peaks. The electric-field strength of the microwave field within the Rydberg intersection is then determined based on this frequency difference.

98. 发明授权

US11630139B2 System and method for wideband spectral estimation using joint space-time array manifold vectors 有权
公开(公告)号：US11630139B2
公开(公告)日：2023-04-18
申请号：US17072989
申请日：2020-10-16
申请人： Raytheon Company
发明人： James M. Bowden
IPC分类号： G01R23/175
摘要： Embodiments of systems and method for determining a joint space-time spectral estimate (P) for a wideband spectrum are generally described herein. To determine a joint space-time spectral estimate (P) for a wideband spectrum, a random time delay may be applied to received signals for each channel of a plurality of receive channels to generate time-delayed signals for each receive channel. The time-delayed signals may be sampled for each receive channel to generate time-delayed samples and form array manifold vectors based on the random time delays and position of each antenna element in an array of antenna elements. An inverse (Q) of the joint-space time spectral estimate (P) may be determined by projecting the array manifold vectors through a mixing matrix (M). The mixing matrix (M) may be based on the time-delayed samples. The joint space-time spectral estimate (P) may comprise spatial and temporal properties of the wideband spectrum.

99. 发明授权

US11630132B2 Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams 有权
公开(公告)号：US11630132B2
公开(公告)日：2023-04-18
申请号：US17151055
申请日：2021-01-15
申请人： Fermi Research Alliance, LLC
发明人： Ding Sun , Alexander Shemyakin
IPC分类号： G01R19/00 , G01N27/00 , G01N27/62 , H01L21/67
摘要： A Fast Faraday Cup includes a group of electrodes including a grounded electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the grounded electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.

100. 发明授权

US11630131B2 Electrically-isolated high-voltage sensor with low power dissipation 有权
公开(公告)号：US11630131B2
公开(公告)日：2023-04-18
申请号：US17375394
申请日：2021-07-14
申请人： U.S. Army DEVCOM, Army Research Laboratory
发明人： Damian P. Urciuoli , Erik S. Schroen
IPC分类号： G01R15/22 , G01R19/32 , H05B45/18
摘要： Novel electrically-isolated high-voltage sensors are provided which have low power dissipation. The sensors are formed of a circuit comprising first and second portions separated by an electrical isolation boundary with the first portion used for high-voltage, and the second portion for low-voltage. While they are decoupled electrically, they are coupled both optically and magnetically. The first portion comprises an LED which generates an optical signal corresponding to a high-voltage signal across the electrical-isolation boundary. The second portion comprises a photodiode which receives the optical signal emitted from the LED and outputs a corresponding low-voltage electrical signal. A temperature-compensating LED biasing sub-circuit may span both portions and include a temperature sensor, a coupled inductor magnetically coupling the electrical isolation boundary, and a rectifier and filter, to provide a bias to the LED which biases the LED to operate in a substantially-linear manner irrespective of the ambient temperature.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式