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    • 23. 发明申请
    • CLIMATE CHAMBER
    • 气候厅
    • US20170038429A1
    • 2017-02-09
    • US15227596
    • 2016-08-03
    • Micronas GmbH
    • Johannes GUTMANN
    • G01R31/28
    • G01R31/2874G01R31/2862
    • A climate chamber for measuring electronic circuits, having a housing that includes an interior space and an opening. The interior space is at least thermally insulated from the surroundings by the housing. Two movable jaws each have an end face. An interior space in a region of an opening is distanced from the surroundings according to the thickness of the jaws, and the jaws each comprise a thermal insulation layer, and each jaw has a front side facing the surroundings and a back side facing the interior space. The two jaws are spaced apart by a clear width being formed between the two end faces, so that the circuits disposed on a carrier can be introduced into the climate chamber and in a second state, the opening for the protection of the interior space is sealed against ambient conditions.
    • 一种用于测量电子电路的气候室,具有包括内部空间和开口的壳体。 内部空间至少与壳体与周围环境隔热。 两个可动夹爪各有一个端面。 开口区域中的内部空间根据夹爪的厚度与周围区域隔开,并且夹爪各自包括绝热层,并且每个夹爪具有面向周围的前侧和面向内部空间的后侧 。 两个钳口间隔开两个端面之间形成的透明宽度,使得设置在载体上的电路可以被引入到气候室中,并且在第二状态下,用于保护内部空间的开口被密封 对环境条件。
    • 24. 发明申请
    • MAGNETIC FIELD MEASURING DEVICE
    • 磁场测量装置
    • US20160363637A1
    • 2016-12-15
    • US15177818
    • 2016-06-09
    • Micronas GmbH
    • Joerg FRANKE
    • G01R33/07H01L43/06H01L43/04
    • G01R33/07G01D5/147H01L43/04H01L43/065
    • A magnetic field measuring device having a first semiconductor body having a surface formed in a first x-y plane, the first semiconductor body having on the surface two magnetic field sensors which are spaced apart and arranged along a first connecting line, and wherein the magnetic field sensors respectively measure a z-component of a magnetic field, and the x-direction and the y-direction and the z-direction are each formed orthogonally to each other. A first magnet is provided with a planar main extension surface formed in a second x-y plane and with a symmetry surface formed in an x-z plane, wherein the direction of magnetization extends substantially or exactly parallel to the main extension surface and substantially or exactly parallel to the plane of symmetry. The first semiconductor body and the first magnet are rigidly fixed to each other.
    • 一种磁场测量装置,具有第一半导体本体,其具有形成在第一xy平面中的表面,所述第一半导体本体在所述表面上具有沿着第一连接线间隔开并布置的两个磁场传感器,并且其中所述磁场传感器 分别测量磁场的z分量,并且x方向和y方向以及z方向各自彼此正交地形成。 第一磁体设置有形成在第二xy平面中并具有形成在xz平面中的对称表面的平面主延伸表面,其中磁化方向基本上或精确地平行于主延伸表面延伸,并且基本上或精确地平行于 平面对称。 第一半导体体和第一磁体彼此刚性地固定。
    • 25. 发明申请
    • METHOD FOR A DETERMINISTIC SELECTION OF A SENSOR FROM A PLURALITY OF SENSORS
    • 传感器多传感器决定性选择传感器的方法
    • US20160247391A1
    • 2016-08-25
    • US15052311
    • 2016-02-24
    • Micronas GmbH
    • Eckart WAGNERThilo RUBEHN
    • G08C19/16
    • G08C19/16H04Q9/00
    • Method for a deterministic selection of a sensor from a plurality of sensors, having a control unit and multiple sensors connected to the control unit by means of a three-wire bus, wherein the sensors are connected parallel to one another at a three-wire bus by at least two lines and a protocol frame according to SENT specification is used between the control unit and the sensors for a data exchange, and within the protocol frame a specified sensor is selected from a plurality of sensors by means of a selection signal sent by the control unit, wherein each sensor is associated with an unambiguous number of pulses for the selection of the sensor, and the selection of the sensor is performed by means of the selection signal having a predetermined number of pulses occurring immediately in succession.
    • 用于从多个传感器确定性地选择传感器的方法,具有通过三线总线连接到控制单元的控制单元和多个传感器,其中传感器以三线总线彼此并联连接 通过至少两行,并且在控制单元和用于数据交换的传感器之间使用根据SENT规范的协议帧,并且在协议帧内,通过选择信号从多个传感器中选择指定的传感器,该选择信号由 控制单元,其中每个传感器与用于选择传感器的明确数量的脉冲相关联,并且传感器的选择通过具有连续发生的预定数量的脉冲的选择信号来执行。
    • 26. 发明授权
    • Method for testing a CMOS transistor
    • CMOS晶体管测试方法
    • US09410921B2
    • 2016-08-09
    • US14664221
    • 2015-03-20
    • Micronas GmbH
    • Oliver Kawaletz
    • G01R31/26G01N27/414G01R31/265G01R31/312
    • G01N27/4143G01N27/4148G01R31/2621G01R31/265G01R31/312
    • A method for testing a CMOS transistor with an electrical testing unit, the CMOS transistor being formed in a semiconductor substrate of a semiconductor wafer. A plurality of CMOS transistors are formed on the semiconductor wafer and the electrical testing unit has a support plate and a metal layer formed on the support plate. The CMOS transistor having a first terminal contact, a second terminal contact and a third terminal contact, the second terminal contact configured as an electrically open control contact and in a process step the metal layer is positioned above the semiconductor wafer over the control contact and a potential difference between the first terminal contact and a third terminal contact is generated. The control contact is capacitively coupled by applying a drive potential to the metal layer, and the function of the CMOS transistor is tested by measuring an electrical variable dependent on the capacitive coupling.
    • 一种用电测试单元测试CMOS晶体管的方法,所述CMOS晶体管形成在半导体晶片的半导体衬底中。 在半导体晶片上形成多个CMOS晶体管,并且电测试单元具有支撑板和形成在支撑板上的金属层。 CMOS晶体管具有第一端子触点,第二端子触点和第三端子触点,第二端子触头被配置为电开控制触点,并且在工艺步骤中,金属层位于半导体晶片上方超过控制触点,并且 产生第一端子触点和第三端子触点之间的电位差。 通过向金属层施加驱动电位来控制触点电容耦合,并且通过测量取决于电容耦合的电变量来测试CMOS晶体管的功能。
    • 27. 发明授权
    • Method for determining an angle of rotation
    • 确定旋转角度的方法
    • US09410790B2
    • 2016-08-09
    • US13961413
    • 2013-08-07
    • Micronas GmbH
    • Dieter Baecher
    • G01B7/30G01D5/14G01B7/31G01D3/036
    • G01B7/30G01B7/31G01D3/0365G01D5/145
    • A method for determining an angle of rotation between a sensor array and a magnetic field of a magnet, whereby the magnetic field is formed substantially parallel and perpendicular to the rotation axis, and the magnet is arranged rotationally symmetric relative to the rotation axis. A first measurement signal and a second measurement signal are generated by the two subsensors of the first magnetic field sensor unit, and the first measurement signal is assigned a first relation and the second measurement signal is assigned a second relation. A third measurement signal and a fourth measurement signal are generated by the two subsensors of the second magnetic field sensor unit, whereby the third measurement signal is assigned a third relation and the fourth measurement signal is assigned a fourth relation. The angle of rotation is then determined.
    • 一种用于确定传感器阵列和磁体的磁场之间的旋转角度的方法,由此形成大致平行且垂直于旋转轴线的磁场,并且磁体相对于旋转轴线旋转对称地布置。 第一测量信号和第二测量信号由第一磁场传感器单元的两个子系统产生,并且第一测量信号被分配第一关系,并且第二测量信号被分配第二关系。 第三测量信号和第四测量信号由第二磁场传感器单元的两个子系统产生,由此第三测量信号被分配第三关系,第四测量信号被分配第四关系。 然后确定旋转角度。
    • 28. 发明申请
    • CIRCUIT PACKAGE
    • 电路封装
    • US20160135298A1
    • 2016-05-12
    • US14939409
    • 2015-11-12
    • Micronas GmbH
    • Thilo RUBEHN
    • H05K1/18
    • H05K1/18G01R33/0047H01L2224/05554H01L2224/48091H01L2224/4813H01L2224/49113H01L2924/00014
    • A circuit package having a first semiconductor body with a first monolithic integrated circuit having a first signal output that is interconnected with a bonding surface, and a first signal input that is interconnected with a bonding surface. The circuit package also has a second semiconductor body with a second monolithic integrated circuit having a second signal output that is interconnected with a bonding surface, and a second signal input that is interconnected with a bonding surface. The circuit package further features a contact element with at least one bonding surface, and a carrier element, wherein the bonding surface of the first signal output and the bonding surface of the second signal input are interconnected with the contact element so that an electrical connection exists between the first signal output and the second signal input, and a portion of the contact element penetrates the circuit package.
    • 一种具有第一半导体本体的电路封装件,具有第一单片集成电路,该第一单片集成电路具有与接合表面互连的第一信号输出端,以及与接合表面互连的第一信号输入端。 电路封装还具有第二半导体本体,其具有第二单片集成电路,该第二单体集成电路具有与接合表面互连的第二信号输出和与接合表面互连的第二信号输入。 该电路封装还具有一个具有至少一个接合表面的接触元件和一个载体元件,其中第一信号输出的接合表面和第二信号输入的接合表面与接触元件互连,从而存在电连接 在第一信号输出和第二信号输入之间,并且接触元件的一部分穿透电路封装。
    • 30. 发明申请
    • MAGNETIC FIELD MEASURING DEVICE
    • 磁场测量装置
    • US20150354984A1
    • 2015-12-10
    • US14735444
    • 2015-06-10
    • Micronas GmbH
    • Stefan ALBRECHT
    • G01D5/14
    • G01D5/142G01D5/145G01D5/2451
    • A magnetic field measuring device having a semiconductor body with a surface parallel to an x-y plane and having a magnet with a flat main extension surface parallel to the x-y plane, the direction of magnetization changes along the main extension surface due to at least two adjacent magnetic poles, the magnet being rotatable relative to the IC package about an axis of rotation extending in a z direction and the z direction being orthogonal to the x-y plane. An imaginary extension of the axis of rotation passes through the magnet. The semiconductor body has three magnetic field sensors spaced apart from one another on the surface, and each of the magnetic field sensors measures the same component of the magnetic field. All magnetic field sensors are located along the imaginary extension of the axis of rotation within the projection of the main extension surface.
    • 一种磁场测量装置,其具有表面平行于xy平面并具有平行于xy平面的平坦主延伸表面的磁体的半导体本体,由于至少两个相邻的磁体,磁化方向沿着主延伸表面改变 所述磁体可相对于所述IC封装围绕在az方向上延伸的旋转轴线旋转,并且所述z方向与xy平面正交。 旋转轴的假想延伸通过磁体。 半导体本体具有在表面上彼此间隔开的三个磁场传感器,并且每个磁场传感器测量相同的磁场分量。 所有磁场传感器沿着主延伸表面的突出部内的旋转轴线的假想延伸部分定位。