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    • 31. 发明授权
    • Method and apparatus for reducing three-dimensional shape data
    • 减少三维形状数据的方法和装置
    • US06958753B2
    • 2005-10-25
    • US09748141
    • 2000-12-27
    • Yoshihisa Abe
    • Yoshihisa Abe
    • G06T17/20G06T15/30
    • G06T17/205
    • A method and apparatus for reducing three-dimensional shape data, includes calculating estimation values for portions to be deformed by converging two or more vertices of a polygon model, and reducing the number of data for the polygon model by converging two or more vertices of the polygon model when the estimation values are equal to or below the predetermined permissible value. Estimation values for surfaces to be deformed by shrinking edges or surfaces are calculated based on distances between the respective surfaces and all the original vertices involved in the surface deformation. Before each data reduction, the portion having been involved in all the previous data reductions is defined as a reduction prohibition area, and a succeeding data reduction is applied to a portion other than the reduction prohibition area.
    • 一种用于减少三维形状数据的方法和装置,包括:通过收敛多边形模型的两个或多个顶点来计算要变形的部分的估计值,并且通过收敛多边形模型的两个或多个顶点来减少多边形模型的数据数 当估计值等于或低于预定允许值时的多边形模型。 基于各个表面之间的距离和表面变形中涉及的所有原始顶点来计算要通过缩小边缘或表面而变形的表面的估计值。 在每次减少数据之前,已经将所有先前的数据缩减所涉及的部分定义为减少禁止区域,并且将以后的数据减少应用于减少禁止区域以外的部分。
    • 33. 发明授权
    • Compound semiconductor substrate comprising a multilayer buffer layer
    • 化合物半导体衬底包括多层缓冲层
    • US08212288B2
    • 2012-07-03
    • US12879035
    • 2010-09-10
    • Jun KomiyamaKenichi EriguchiHiroshi OishiYoshihisa AbeAkira YoshidaShunichi Suzuki
    • Jun KomiyamaKenichi EriguchiHiroshi OishiYoshihisa AbeAkira YoshidaShunichi Suzuki
    • H01L21/02
    • H01L21/0254H01L21/02458H01L21/02507
    • A compound semiconductor substrate which inhibits the generation of a crack or a warp and is preferable for a normally-off type high breakdown voltage device, arranged that a multilayer buffer layer 2 in which AlxGa1-xN single crystal layers (0.6≦X≦1.0) 21 containing carbon from 1×1018 atoms/cm3 to 1×1021 atoms/cm3 and AlyGa1-yN single crystal layers (0.1≦y≦0.5) 22 containing carbon from 1×1017 atoms/cm3 to 1×1021 atoms/cm3 are alternately and repeatedly stacked in order, and a nitride active layer 3 provided with an electron transport layer 31 having a carbon concentration of 5×1017 atoms/cm3 or less and an electron supply layer 32 are deposited on a Si single crystal substrate 1 in order. The carbon concentrations of the AlxGa1-xN single crystal layers 21 and that of the AlGa1-yN single crystal layers 22 respectively decrease from the substrate 1 side towards the above-mentioned active layer 3 side. In this way, the compound semiconductor substrate is produced.
    • 一种禁止产生裂纹或翘曲的化合物半导体衬底,优选用于常闭型高击穿电压器件,其中AlxGa1-xN单晶层(0.6& NlE; X& NlE; 1.0 )含有1×1018原子/ cm 3至1×1021原子/ cm3的碳和含有1×10 17原子/ cm 3至1×1021原子/ cm 3的碳的Al y Ga 1-y N单晶层(0.1< 1lE; y≦̸ 0.5) 交替重复堆叠,并且在Si单晶衬底1上沉积具有碳浓度为5×10 17原子/ cm 3以下的电子传输层31和电子供给层32的氮化物活性层3 订购。 Al x Ga 1-x N单晶层21和AlGa1-yN单晶层22的碳浓度分别从衬底1侧朝向上述有源层3侧减小。 以这种方式制造化合物半导体衬底。
    • 35. 发明申请
    • Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor
    • 用于三维处理器中三维数据显示的三维处理器和方法
    • US20090201292A1
    • 2009-08-13
    • US12322963
    • 2009-02-10
    • Yoshihisa AbeToshio Kawano
    • Yoshihisa AbeToshio Kawano
    • G06T15/50
    • G01B11/25
    • A method is provided for controlling display of three-dimensional data in a three-dimensional processor that processes three-dimensional data indicating three-dimensional position coordinates of each point on a surface of an object to be measured, the three-dimensional data being obtained by projecting measurement light onto the object and receiving measurement light reflected from the object. The method includes obtaining reliability data that are an index of reliability of three-dimensional data of said each point, enabling a user to adjust a threshold for defining a range of the reliability, and displaying, on a screen of a display, three-dimensional data corresponding to reliability falling within a range defined by the threshold adjusted by the user with the three-dimensional data displayed distinguishably from different three-dimensional data.
    • 提供了一种用于控制三维处理器中的三维数据的显示的方法,该三维处理器处理指示待测物体的表面上的每个点的三维位置坐标的三维数据,获得的三维数据 通过将测量光投射到物体上并接收从物体反射的测量光。 该方法包括获得作为所述每个点的三维数据的可靠性的索引的可靠性数据,使得用户能够调整用于定义可靠性的范围的阈值,并且在显示器的屏幕上显示三维 与由用户调整的阈值所限定的范围内的可靠度相对应的数据与由不同的三维数据可区分地显示的三维数据相对应的数据。