专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

61. 发明申请

US20050062462A1 Serial communication testing 失效
标题翻译：串行通信测试
公开(公告)号：US20050062462A1
公开(公告)日：2005-03-24
申请号：US10679599
申请日：2003-10-06
申请人： Henrik Liebau , Thomas Dippon
发明人： Henrik Liebau , Thomas Dippon
IPC分类号： G01R31/319 , G01R1/00
CPC分类号： G01R31/31926
摘要： A coupling unit provides a signal path between at least two of: a first device under test (DUT), and first and second couplers. The first coupler is coupled to a signal analyzer. The second coupler is coupled to another DUT. Both couplers provide and receive signals to and from the coupling unit which includes first and second multiplexers. An output of the first DUT is coupled to a first input of the first multiplexer and to a first input of the first coupler. A first output of the first coupler is coupled to a second input of the first multiplexer. The output of the first multiplexer is coupled to the input of the second coupler. The output of the second coupler is coupled to a first input of the second multiplexer and to a second input of the first coupler. A second output of the first coupler is coupled to a second input of the second multiplexer. The output of the second multiplexer is coupled to an input of the first DUT.
摘要翻译：耦合单元在以下中的至少两个之间提供信号路径：第一被测器件（DUT）以及第一和第二耦合器。第一耦合器耦合到信号分析器。第二耦合器耦合到另一个DUT。两个耦合器提供和接收来自耦合单元的信号，耦合单元包括第一和第二多路复用器。第一DUT的输出耦合到第一多路复用器的第一输入端和第一耦合器的第一输入端。第一耦合器的第一输出耦合到第一多路复用器的第二输入端。第一多路复用器的输出耦合到第二耦合器的输入端。第二耦合器的输出耦合到第二多路复用器的第一输入端和第一耦合器的第二输入端。第一耦合器的第二输出耦合到第二多路复用器的第二输入端。第二多路复用器的输出耦合到第一DUT的输入端。

62. 发明申请

US20050052176A1 Test head manipulator 有权
标题翻译：测试头操纵器
公开(公告)号：US20050052176A1
公开(公告)日：2005-03-10
申请号：US10955441
申请日：2004-09-30
申请人： Alyn Holt , Christopher West , Brian Moore , Richard Powell , I. Weilerstein
发明人： Alyn Holt , Christopher West , Brian Moore , Richard Powell , I. Weilerstein
IPC分类号： B25J9/04 , G01R31/28 , G01R1/00
CPC分类号： G01R31/2887 , B25J9/041
摘要： A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.
摘要翻译：系统可用于定位负载，如测试头。该系统包括支撑负载并沿着第一垂直轴移动的臂。该系统还包括旋转单元，用于围绕与第一垂直轴线间隔开的第二垂直轴旋转第一垂直轴线。

63. 发明申请

US20050030008A1 Rotating gripper wafer flipper 失效
公开(公告)号：US20050030008A1
公开(公告)日：2005-02-10
申请号：US10930488
申请日：2004-08-31
申请人： Willard Hofer , Shawn Davis , Joe Phillips
发明人： Willard Hofer , Shawn Davis , Joe Phillips
IPC分类号： B25J15/00 , H01L21/66 , H01L21/687 , G01R1/00
CPC分类号： H01L21/68707 , B25J15/0004 , H01L22/20
摘要： A method for inspecting semiconductor wafers. Specifically, an arm which is constructed to hold a wafer, is mounted on a rotational device to provide a user with the means of inspecting a wafer in any position without having to physically touch the wafer or move the wafer to another inspection station. The arm provides rotation about an axis parallel to the surface of the wafer, as well as rotation about an axis run which is perpendicular to the surface of the wafer and extends through the axial center of the wafer.

64. 发明申请

US20050022376A1 Electronic component test apparatus 失效
标题翻译：电子元件测试仪器
公开(公告)号：US20050022376A1
公开(公告)日：2005-02-03
申请号：US10630722
申请日：2003-07-31
申请人： David Alcoe
发明人： David Alcoe
IPC分类号： G01R31/26 , G01R1/04 , G01R1/06 , H05K3/30 , B23P19/00 , G01R1/00
CPC分类号： G01R1/0483 , Y10T29/49004 , Y10T29/4913 , Y10T29/49139 , Y10T29/53174
摘要： A test apparatus and method in which a compressible housing is used to retain an electronic component having conductors thereon. The compressible housing is lowered onto a suitable base member having upstanding probes which are also compressible and which physically engage respective ones of the conductors at one end thereof and an appropriate conductor (e.g., conductive pads on a printed circuit board) on the other when the test apparatus is fully assembled and testing occurs.
摘要翻译：一种测试装置和方法，其中使用可压缩壳体来保持其上具有导体的电子部件。可压缩壳体下降到具有直立探头的合适的基座构件上，该探头也是可压缩的，并且在其一端处物理地接合相应的一个导体，另一端物理地接合另一个导体（例如，印刷电路板上的导电焊盘）测试装置完全组装并进行测试。

65. 发明授权

US06847203B1 Applying parametric test patterns for high pin count ASICs on low pin count testers 失效
标题翻译：在低引脚数测试仪上应用高引脚数ASIC的参数测试模式
公开(公告)号：US06847203B1
公开(公告)日：2005-01-25
申请号：US10604230
申请日：2003-07-02
申请人： Dennis R. Conti , John Lafferty
发明人： Dennis R. Conti , John Lafferty
IPC分类号： G01R1/00 , G01R31/26 , G01R31/319
CPC分类号： G01R31/31926
摘要： Disclosed is an integrated circuit chip test apparatus that has a module test fixture having contact pads that are adapted to make contact with signal input/output pins on an integrated circuit chip being tested. An intermediate banking box is connected to the module text fixture and a tester is connected to the intermediate banking box. The tester includes at least one bank of channels there are more pins on the integrated circuit chip than there are channels in the tester. The intermediate banking box includes switches that are connected between the contact pads and the channels. The switches are adapted to selectively connect a subset of the contact pads to the channels to connect the tester to a subset of pins, thereby allowing the tester to test a portion of the integrated circuit that corresponds to the subset of pins.
摘要翻译：公开了一种集成电路芯片测试装置，其具有具有接触焊盘的模块测试夹具，其适于与被测试的集成电路芯片上的信号输入/输出引脚接触。中间银行盒连接到模块文本夹具，测试器连接到中间银行盒。测试仪包括至少一组通道，集成电路芯片上有比测试仪中的通道更多的引脚。中间银行箱包括连接在接触垫和通道之间的开关。开关适于选择性地将接触焊盘的子集连接到通道以将测试器连接到引脚的子集，从而允许测试仪测试与引脚子集相对应的集成电路的一部分。

66. 发明授权

US06844825B2 Electric energy service apparatus with tamper detection 失效
标题翻译：具有篡改检测功能的电能服务设备
公开(公告)号：US06844825B2
公开(公告)日：2005-01-18
申请号：US09962562
申请日：2001-09-25
申请人： John T. Shincovich
发明人： John T. Shincovich
IPC分类号： G01R1/00 , G01R21/00 , G01R21/06 , G01R31/00 , G06F15/16 , G06F19/00 , G08B23/00 , G08C13/00 , G08C15/06 , H04B3/54
CPC分类号： H04B3/54 , H04B3/546 , H04B2203/5433 , H04B2203/5458
摘要： A method and apparatus for detecting a tamper event in an electrical power metering apparatus having power distribution and power service conductors connected to jaw contacts in a socket housing, the jaw contacts receiving blade terminals of an electrical service meter apparatus. A tamper event signature is detected based on a time relationship between separation of the ground circuit between the electrical power metering apparatus and the socket and the separation of at least one of the power distribution and power service blade terminals from the socket jaw contacts due to removal of the electrical service apparatus from the socket.
摘要翻译：一种在电力计量装置中检测篡改事件的方法和装置，其具有与插座壳体中的钳口触点连接的配电和电力服务导体，所述钳口接触电气仪表装置的接收刀片端子。基于电力计量装置和插座之间的接地电路的分离与至少一个配电和电力服务用刀片端子与插座卡爪接触件之间的分离由于移除而被检测到的篡改事件签名的电气服务设备。

67. 发明授权

US06844746B2 Electrical system like a testing system for testing the channels of a communication system 有权
标题翻译：电气系统，如测试系统，用于测试通信系统的通道
公开(公告)号：US06844746B2
公开(公告)日：2005-01-18
申请号：US10305233
申请日：2002-11-26
申请人： Heinz Nuessle
发明人： Heinz Nuessle
IPC分类号： G01R31/00 , G01R31/28 , G01R27/08 , G01R1/00
CPC分类号： G01R31/2839
摘要： An electrical system includes at least one function board and at least one voltage converter. The function board and the voltage converter are connected such that a voltage generated by the voltage converter is supplied to the function board. The electrical system includes an electrical circuit for evaluating the voltage required by the function board and for controlling the voltage converter depending on the evaluated voltage.
摘要翻译：电气系统包括至少一个功能板和至少一个电压转换器。连接功能板和电压转换器，使得由电压转换器产生的电压被提供给功能板。电气系统包括用于评估功能板所需的电压并根据评估的电压来控制电压转换器的电路。

68. 发明授权

US6037788A Docking station for automated test fixture 失效
标题翻译：自动测试夹具对接站
公开(公告)号：US6037788A
公开(公告)日：2000-03-14
申请号：US25982
申请日：1998-02-19
申请人： Russell S. Krajec , Peter J. Vanderheiden
发明人： Russell S. Krajec , Peter J. Vanderheiden
IPC分类号： G01R31/28 , G01R1/00
CPC分类号： G01R31/2887
摘要： The inventive mass interface or docking station comprises several resource connections that are located in a predetermined arrangement. These connections couple with connections arranged in complementary manner on the test fixture. The resource connections provide the various electrical, power, RF, and pneumatic resources required to test the production devices. The predetermined arrangement of connections allows fixtures to be quickly changed, as all connections can be simultaneously coupled and de-coupled. Thus, the docking station interface on the test fixture is standardized, and the test machine interface on the inventive docking station is customized to the test machine.
摘要翻译：本发明的大容量接口或坞站包括位于预定布置中的多个资源连接。这些连接与在测试夹具上以互补的方式布置的连接耦合。资源连接提供测试生产设备所需的各种电气，电力，射频和气动资源。连接的预定布置允许夹具快速改变，因为所有连接可以同时耦合和去耦合。因此，测试夹具上的对接站接口被标准化，并且本发明的对接站上的测试机接口被定制到测试机器。

69. 发明授权

US5926015A Machine readable display unit 失效
标题翻译：机读显示单元
公开(公告)号：US5926015A
公开(公告)日：1999-07-20
申请号：US279565
申请日：1994-07-25
申请人： Robert S. Pharr
发明人： Robert S. Pharr
IPC分类号： G01R11/16 , G01R22/00 , G01R1/00
CPC分类号： G01R11/16 , G01R22/00
摘要： A machine readable unit for meter devices of the type presenting a changeable, readable indicia proportional to a changeable input thereto, to include electric rate meters, gas meters, water meters, and other data registers, includes an assembly for displaying alphanumeric indicia in a machine readable format and an assembly for changing the displayed indicia responsive to input to the meter device.
摘要翻译：一种用于计量装置的机器可读单元，其具有与其可变输入成比例的可更改的可读标记，包括电速率计，气表，水表和其他数据寄存器，包括用于在机器中显示字母数字标记的组件可读格式和用于响应于对仪表装置的输入而改变显示的标记的组件。

70. 发明授权

US5869975A System for evaluating probing networks that have multiple probing ends 失效
标题翻译：用于评估具有多个探测结束的探测网络的系统
公开(公告)号：US5869975A
公开(公告)日：1999-02-09
申请号：US866165
申请日：1997-05-30
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R31/26 , G01R1/00 , G01R1/067 , G01R1/073 , G01R31/02 , G01R31/28 , G01R35/00 , H01L21/66
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005 , G01R1/06772
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement network can be simultaneously placed on these respective areas, a reference junction, and a high frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite variable positioning of the device-probing ends on the probing areas. Because the transmission structure uniformly transfers signals despite variable positioning of the device-probing ends, the measurement network can be accurately calibrated with reference, in particular, to the device-probing ends of the network by a reference unit connected to the reference junction.
摘要翻译：用于评估探针测量网络的互连组件包括基本相应的第一，第二和第三设备探测区域，所述第一，第二和第三设备探测区域以间隔开的关系布置在所述基座的上表面上，使得第一，第二和第三设备探测端属于测量网络可以同时放置在这些各个区域，参考结点和连接探测区域和参考结点的高频传输结构，使得高频信号可以在其间均匀地传输，尽管设备探测结束的可变定位在探测区域。由于尽管设备探测结束的可变定位，传输结构均匀地传送信号，所以可以通过参考连接到参考连接点的参考单元参考网络的设备探测端来精确地校准测量网络。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式