专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

81. 发明授权

US11609085B2 Displacement measurement system 有权
公开(公告)号：US11609085B2
公开(公告)日：2023-03-21
申请号：US17234938
申请日：2021-04-20
申请人： Panasonic Intellectual Property Management Co., Ltd.
发明人： Yoshie Takahashi , Yoshiki Shimata , Kazuto Fukuda
IPC分类号： G01L1/24 , G01B11/16
摘要： Provided is a displacement measurement system including: a sensor that is contactable with a measurement target object and includes a first spacer that has at least a one-dimensional spread, and two or more types of light emitting particles that are distributed over the spread of the first spacer and emit light at different wavelengths by an excitation energy; an excitation energy source that causes the two or more types of light emitting particles included in the sensor to emit light; and a light receiver that receives light emitted from the sensor.

82. 发明授权

US11609083B2 Apparatus and method for contactless checking of the dimensions and/or shape of a complex-shaped body 有权
公开(公告)号：US11609083B2
公开(公告)日：2023-03-21
申请号：US17258907
申请日：2019-07-08
申请人： Marposs Societa' Per Azioni
发明人： Maurizio Dalla Casa , Pier Paolo Conti
IPC分类号： G01B11/03 , G01B11/02 , B25J19/02 , G01B21/04
摘要： Apparatus (1) for checking the dimensions and/or shape of a complex-shaped body (3), comprising a checking support (5) on which the body to be checked is positioned, a robotic system (8) with an optical assembly (17) and a memory unit (19) for storing reference data relating to a reference shape of the body. A processing and control unit (18) controls movements of the optical assembly so as to obtain dimensional values relating to the body at predetermined measuring points, these dimensional values then being compared with the reference data stored in the memory unit. The apparatus further comprises reference elements (35) defined in the checking support in predetermined positions and a distance sensor (17) for acquiring actual positions of said reference elements. Local compensation parameters for correcting positioning errors of the robotic system are calculated for each of the reference elements on the basis of the predetermined positions and the actual positions acquired. A method for checking the dimensions and/or shape of a complex-shaped body by using the above described apparatus includes a calibration phase of the robotic system to calculate the local compensation parameters, a phase for collecting the reference data related to the predetermined measuring points and a dimensional checking phase of the body. The reference data collecting phase and the dimensional checking phase take into consideration the local compensation parameters.

83. 发明授权

US11608109B2 Systems and methods for detecting magnetic turn counter errors with redundancy 有权
公开(公告)号：US11608109B2
公开(公告)日：2023-03-21
申请号：US16991788
申请日：2020-08-12
申请人： Analog Devices International Unlimited Company
发明人： Jeremy Richard Gorbold , Gavin Patrick Cosgrave
IPC分类号： B62D5/04 , B62D15/02 , G01B7/30 , G01D5/16 , G01D18/00 , G07C5/08
摘要： Systems and methods for detecting magnetic turn counter errors with redundancy are provided. In one aspect, a magnetic field turn sensor system includes a magnetic field angle sensor having a sine bridge and a cosine bridge and first to third comparators configured to compare the outputs from the sine and cosine bridges. The system further includes a processor configured to receive outputs from each of the first to third comparators, determine that a combination of the outputs from the first to third comparators corresponds to an invalid state, and indicate a fault in response to determining that the combination of the outputs from the first to third comparators corresponds to the invalid state.

84. 发明申请

US20230085325A1 SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM 有权
公开(公告)号：US20230085325A1
公开(公告)日：2023-03-16
申请号：US17903444
申请日：2022-09-06
申请人： Tokyo Electron Limited
发明人： Hirokazu KYOKANE , Hidefumi MATSUI , Toshiyuki FUKUMOTO , Satoshi ITOH , Masashi IMANAKA , Toyohisa TSURUDA , Masashi ENOMOTO , Masahiro YANAGISAWA
IPC分类号： G01B11/06 , G06T7/60
摘要： A substrate processing apparatus includes: an imaging portion configured to acquire a surface image of a film formed on a surface of a substrate; an optical property estimation portion configured to estimate an optical property of the film based on process information acquired during formation of the film; and a film thickness estimation portion configured to estimate a film thickness of the film based on the surface image and an estimation result of the optical property.

85. 发明申请

US20230085063A1 VCSEL CHIP FOR GENERATION OF LINEAR STRUCTURED LIGHT PATTERNS AND FLOOD ILLUMINATION 有权
公开(公告)号：US20230085063A1
公开(公告)日：2023-03-16
申请号：US17572395
申请日：2022-01-10
申请人： Facebook Technologies, LLC
发明人： Jonatan Ginzburg , Benjamin Nicholas Jones , Arun Kumar Nallani Chakravartula , Jun Li , Lawrence Chang-Yung Wang
IPC分类号： H01S5/42 , G01B11/22
摘要： A vertical cavity surface emitting laser (VCSEL) chip includes a structured light (SL) VCSEL array, and a fill VCSEL array. The SL VCSEL array includes a plurality of first VCSELs on a substrate. The fill VCSEL array includes a plurality of second VCSELs on the substrate. The fill VCSEL array is positioned orthogonal to the SL VCSEL array on the substrate. Light emitted from the SL VCSEL array may be used to form a bar pattern, and light from the SL VCSEL array and the fill VCSEL array together may be used to form flood illumination.

86. 发明申请

US20230084807A1 SYSTEMS AND METHODS FOR 3-D RECONSTRUCTION AND SCENE SEGMENTATION USING EVENT CAMERAS 有权
公开(公告)号：US20230084807A1
公开(公告)日：2023-03-16
申请号：US17477427
申请日：2021-09-16
申请人： INTRINSIC INNOVATION LLC
发明人： Vage TAAMAZYAN , Agastya KALRA , Achuta KADAMBI , Kartik VENKATARAMAN
IPC分类号： G01B11/25 , G06T7/11 , G06T7/80 , G06K9/62
摘要： Aspects of embodiments of the present disclosure relate to systems and methods for performing three-dimensional reconstruction (or depth reconstruction) and for generating segmentation masks using data captured by one or more event cameras.

87. 发明申请

US20230084496A1 LEAD FRAME, SEMICONDUCTOR DEVICE AND EXAMINATION METHOD 有权
公开(公告)号：US20230084496A1
公开(公告)日：2023-03-16
申请号：US17942471
申请日：2022-09-12
申请人： SHINKO ELECTRIC INDUSTRIES CO., LTD.
发明人： Shintaro Hayashi , Hajime Koike
IPC分类号： H01L21/66 , H01L23/31 , H01L23/495 , H01L21/48 , H01L21/56 , G01B11/27
摘要： A lead frame includes a die pad that includes a mounting surface for a semiconductor chip, and a film-like member that is arranged on the mounting surface of the die pad. The die pad includes a through hole that is formed in an area that includes an outer periphery of the film-like member.

88. 发明申请

US20230083531A1 THREE-DIMENSIONAL MEASURING DEVICE, AND THREE-DIMENSIONAL MEASURING METHOD 有权
公开(公告)号：US20230083531A1
公开(公告)日：2023-03-16
申请号：US17801343
申请日：2021-03-01
申请人： FANUC CORPORATION
发明人： Yuusuke OOTA
IPC分类号： G01B11/24 , G06T7/593
摘要： The objective of the present invention is to appropriately set a distance range for calculating a gradation degree, in accordance with the height of a workpiece. This three-dimensional measuring device is provided with: a three-dimensional sensor which images a workpiece to acquire three-dimensional information; a setting unit which, on the basis of the acquired three-dimensional information, sets a reference position serving as a height direction reference in the workpiece, and a height direction margin, relative to the reference position, for a gradation degree of a gradation image, and sets a distance range corresponding to the gradation degree of the gradation image; an image converting unit which converts the acquired three-dimensional information into the gradation image on the basis of the distance range; and a detecting unit which employs the gradation image to obtain, three-dimensionally, the shape and/or the position and attitude of the workpiece.

89. 发明申请

US20230081254A1 CABLE BONDING PROTECTION FOR HEAD DIMENSIONAL STABILITY 有权
公开(公告)号：US20230081254A1
公开(公告)日：2023-03-16
申请号：US17476720
申请日：2021-09-16
申请人： International Business Machines Corporation
发明人： Jason Liang , Hoodin Hamidi , Daniel Brown
IPC分类号： G01B3/1094 , G11B5/584
摘要： An apparatus includes a beam, a chip coupled to the beam, a cable coupled to the beam by a first material located at opposite edges of the cable, and wire bonds extending from pads of the cable to pads of the chip. An apparatus includes a beam and a chip coupled to the beam. The chip includes an array of magnetic transducers for transducing data on a magnetic recording tape. The apparatus includes a cable coupled to the beam by a first material located at opposite edges of the cable, wire bonds extending from pads of the cable to pads of the chip, and a second material encapsulating ends of the wire bonds that are located adjacent the cable. The second material does not contact the chip.

90. 发明申请

US20230080382A1 OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-TRANSITORYCOMPUTER READABLE MEDIUM 有权
公开(公告)号：US20230080382A1
公开(公告)日：2023-03-16
申请号：US17801852
申请日：2020-03-19
申请人： NEC Corporation
发明人： Takeshi Akagawa
IPC分类号： A61B5/00 , G01B9/02091 , G06T11/60
摘要： An object of the present disclosure is to provide an optical measurement method, an optical measurement apparatus, and a non-transitory computer readable medium capable of specifying the position of a pore. The optical measurement method includes first, second, and third steps. In the first step (ST11), first 3D tomographic image data is acquired from a skin by using optical coherence tomography. In the second step (ST12), a line shown in a second planar image (B2) at a second depth is removed from a first planar image (B1) at a first depth, the second depth being deeper than the first depth. In the third step (ST13), a position of a pore is specified from the first planar image (B1) from which the line has been removed.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式