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    • 1. 发明申请
    • Delivery of Low Pressure Dopant Gas to a High Voltage Ion Source
    • 将低压掺杂气体输送到高电压离子源
    • US20080220596A1
    • 2008-09-11
    • US12065471
    • 2006-08-29
    • W. Karl OlanderJose I. ArnoRobert Kaim
    • W. Karl OlanderJose I. ArnoRobert Kaim
    • H01L21/265H01J37/317H01J37/08
    • H01J37/08H01J27/02H01J37/3172H01J2237/0203
    • A system for delivery of low-pressure dopant gas to a high-voltage ion source in the doping of semiconductor substrates, in which undesired ionization of the gas is suppressed prior to entry into the high-voltage ion source, by modulating electron energy upstream of the high-voltage ion source so that electron acceleration effects are reduced to below a level supporting an electronic ionization cascade. The gas delivery system in a specific application includes a gas flow passage, a voltage generator electrically coupled with at least a portion of the gas flow passage to impose an electric field thereon, and an obstructive structure that is deployed to modulate acceleration length of electrons of the low-pressure gas in relation to ionization potential of the gas, to suppress ionization in the gas flow passage.
    • 一种用于在半导体衬底的掺杂中向高电压离子源传送低压掺杂气体的系统,其中在进入高压离子源之前,气体的不期望的电离被抑制,通过调制 高电压离子源,使得电子加速效应降低到低于支持电子离子化级联的水平。 具体应用中的气体输送系统包括气体流动通道,与气体流动通道的至少一部分电耦合以在其上施加电场的电压发生器,以及阻塞结构,其被展开以调制电子的加速度长度 相对于气体的电离电位的低压气体,抑制气体流路中的电离。