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    • 3. 发明授权
    • Polishing pad having groove structure for avoiding stripping of a polishing surface of the polishing pad
    • 抛光垫具有用于避免剥离抛光垫的抛光表面的凹槽结构
    • US07662028B2
    • 2010-02-16
    • US12139525
    • 2008-06-16
    • Chung-Chih FengWei-Te LiuYung-Chang HungChun-Ta WangI-Peng Yao
    • Chung-Chih FengWei-Te LiuYung-Chang HungChun-Ta WangI-Peng Yao
    • B24D11/00
    • B24B37/26
    • A groove structure for avoiding stripping of a polishing surface of a polishing pad, the polishing pad including a base material and a grinding layer. The base material has a surface. The grinding layer is disposed on the surface, and part of the surface around the edge of the base material is exposed. The grinding layer has a plurality of first grooves and second grooves, and the first grooves cross the second grooves to define a plurality of grinding areas. The exposed part of the surface around the edge of the base material is located between the first grooves, the second grooves and the edge of the polishing pad. The polishing pad contains more grinding liquid, to clean the small grinded pieces. The grinding layer does not have an acute structure and is not easily peeled to form the small grinded pieces. Therefore, grinding quality and grinding effect are improved.
    • 一种用于避免剥离抛光垫的抛光表面的凹槽结构,所述抛光垫包括基底材料和研磨层。 基材具有表面。 磨削层设置在表面上,并且暴露基体材料边缘周围的一部分表面。 研磨层具有多个第一凹槽和第二凹槽,并且第一凹槽与第二凹槽交叉以限定多个研磨区域。 围绕基材边缘的表面的暴露部分位于第一凹槽,第二凹槽和抛光垫的边缘之间。 抛光垫包含更多的研磨液,以清洁小磨碎的碎片。 研磨层不具有尖锐的结构,并且不容易剥离以形成小的研磨件。 因此,磨削质量和磨削效果得到提高。
    • 7. 发明授权
    • Polishing pad and polishing device
    • 抛光垫和抛光装置
    • US08277290B2
    • 2012-10-02
    • US12550544
    • 2009-08-31
    • Allen ChiuYu-Lung Jeng
    • Allen ChiuYu-Lung Jeng
    • B24B5/00
    • B24B37/22
    • A polishing pad used in semiconductor polishing process is provided in the present invention and a pressure sensitive adhesive is used to couple the polishing pad. The polishing pad includes a substrate, and the substrate includes a polishing surface and a reverse surface corresponding to the polishing surface. The polishing pad is characterized by: a pressure sensitive adhesive formed on the reverse surface of the substrate and used to couple with a bottom layer, and the horizontal adhesion of the pressure sensitive adhesive is higher than the vertical adhesion of the pressure sensitive adhesive.
    • 在本发明中提供了用于半导体抛光工艺的抛光垫,并且使用压敏粘合剂来连接抛光垫。 抛光垫包括基板,并且基板包括抛光表面和对应于抛光表面的反面。 抛光垫的特征在于:形成在基板的背面并用于与底层连接的压敏粘合剂,并且压敏粘合剂的水平粘合性高于压敏粘合剂的垂直粘合力。
    • 10. 发明授权
    • Polishing pad
    • 抛光垫
    • US08123597B2
    • 2012-02-28
    • US12325376
    • 2008-12-01
    • Allen ChiuShao-Yu ChenYu-Lung Jeng
    • Allen ChiuShao-Yu ChenYu-Lung Jeng
    • B24B7/22
    • B24B37/26Y10S451/921
    • The polishing pad includes a polishing surface, on which is formed with a plurality of first grooves and a plurality of second grooves, wherein the characteristic of the polishing pad is in that: the first grooves are connected to the second grooves, the width of first grooves are larger than that of the second grooves, the depth of first grooves are larger than that of the second grooves, the density of first grooves are larger than that of the second grooves, and the first grooves and the second grooves are uniformly distributed over the polishing surface respectively. Therefore when the polishing step is performed using the polishing pad, smaller scraps produced after polishing or smaller polishing particles in the slurry or more turbid slurry can flow out of the polishing pad via the second groove, and larger scraps or particles can flow out of the polishing pad via the first groove.
    • 抛光垫包括抛光表面,其上形成有多个第一凹槽和多个第二凹槽,其中抛光垫的特征在于:第一凹槽连接到第二凹槽,第一凹槽的宽度 槽比第二槽大,第一槽的深度大于第二槽的深度,第一槽的密度大于第二槽的密度,并且第一槽和第二槽均匀地分布在 抛光面。 因此,当使用抛光垫进行抛光步骤时,在浆料或更混浊的浆料中抛光后产生的较小的废料或较小的抛光颗粒可以经由第二槽流出抛光垫,并且较大的碎屑或颗粒可以从 抛光垫经由第一槽。