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1. 发明授权

US08352188B2 Apparatus for generating high resolution surface topology map using surface profiling and surveying instrumentation 有权
标题翻译：用于使用表面分析和测量仪器产生高分辨率表面拓扑图的装置
公开(公告)号：US08352188B2
公开(公告)日：2013-01-08
申请号：US12409317
申请日：2009-03-23
申请人： Dennis P. Scott , Dwight D. Day
发明人： Dennis P. Scott , Dwight D. Day
IPC分类号： G01V3/38 , G01C22/00
CPC分类号： G01C15/00 , G01C21/165
摘要： A profiling apparatus configured to generate a high-resolution surface topology map of a surface using surface profiling data combined with surveying data. The apparatus is configured to collect both a plurality of survey sample points and a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.
摘要翻译：配置设备，被配置为使用与测量数据组合的表面分析数据来生成表面的高分辨率表面拓扑图。该装置被配置为收集表面的多个测量样本点和多个轮廓采样点。然后将轮廓采样点与Z方向上的测量样点相关。一旦执行了相关性，相关的轮廓采样点在调查样本点之间合并或填充。高分辨率表面拓扑图是从调查和轮廓采样点的合并生成的。在各种实施例中，调查数据可以使用惯性轮廓仪，基于倾斜仪的行走装置或滚动参照型轮廓装置来产生。

2. 发明授权

US08352189B2 Method for generating high resolution surface topology map using surface profiling and surveying instrumentation 有权
标题翻译：使用表面分析和测量仪器生成高分辨率表面拓扑图的方法
公开(公告)号：US08352189B2
公开(公告)日：2013-01-08
申请号：US12409329
申请日：2009-03-23
申请人： Dennis P. Scott , Dwight D. Day
发明人： Dennis P. Scott , Dwight D. Day
IPC分类号： G01V3/38 , G01C22/00
CPC分类号： G01C15/00 , G01C21/165
摘要： A method for generating a high-resolution surface topology map of a surface using surface profiling data combined with data collected from a surveying instrument. The system and method involve collecting a plurality of survey sample points and collecting a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.
摘要翻译：使用与测量仪器收集的数据结合的表面分析数据来生成表面的高分辨率表面拓扑图的方法。该系统和方法涉及收集多个测量采样点并收集表面的多个轮廓采样点。然后将轮廓采样点与Z方向上的测量样点相关。一旦执行了相关性，相关的轮廓采样点在调查样本点之间合并或填充。高分辨率表面拓扑图是从调查和轮廓采样点的合并生成的。在各种实施例中，调查数据可以使用惯性轮廓仪，基于倾斜仪的行走装置或滚动参照型轮廓装置来产生。

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