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    • 1. 发明授权
    • Anisotropic parameter determination
    • 各向异性参数测定
    • US08750074B2
    • 2014-06-10
    • US12621972
    • 2009-11-19
    • Emanouil Blias
    • Emanouil Blias
    • G01V1/30G01V1/28G01V1/42
    • G01V1/303G01V1/42G01V2210/626G01V2210/66
    • A walkaway VSP survey is carried out using a receiver array. First arrivals to a plurality of receivers are picked and used to estimate a normal-moveout (NMO) velocity. Using the NMO velocity and vertical velocities estimated from the VSP data, two anisotropy parameters are estimated for each of the layers. The anisotropy parameters may then be used to process surface seismic data to give a stacked image in true depth and for the interpretation purposes. For multi-azimuthal walkaway or 3D VSP data, we determine two VTI parameters ε and δ for multi-azimuth vertical planes. Then we determine five anisotropic interval parameters that describe P-wave kinematics for orthorhombic layers. These orthorhombic parameters may then be used to process surface seismic data to give a stacked image in true depth and for the interpretation purposes.
    • 使用接收器阵列进行离散VSP调查。 首先到达多个接收器被采摘并用于估计正常移动(NMO)速度。 使用从VSP数据估计的NMO速度和垂直速度,估计每个层的两个各向异性参数。 然后可以将各向异性参数用于处理地面地震数据,以便给出真实深度的堆叠图像和解释目的。 对于多方位走行或3D VSP数据,我们确定两个VTI参数&egr; 和多方位垂直平面的δ。 然后我们确定描述正交层的P波运动学的五个各向异性间隔参数。 然后可以使用这些斜方晶参数来处理地面地震数据,以给出真实深度的堆叠图像和解释目的。
    • 2. 发明授权
    • Method and apparatus for detethering mesoscale, microscale, and nanoscale components and devices
    • 用于去除中尺度,微尺度和纳米尺度部件和装置的方法和装置
    • US08739398B2
    • 2014-06-03
    • US12744049
    • 2008-11-20
    • Mohammad A. MayyasPanayoitis S. Shiakolas
    • Mohammad A. MayyasPanayoitis S. Shiakolas
    • H05K3/30H05K3/34
    • B81C1/00873
    • A method for forming an electronic device includes designing a tether having first and second ends; selecting an attachment point on the electronic device; attaching the first end of the tether to the attachment point, the electronic device being encapsulated in a cell; selecting an anchor point; attaching the second end of the tether to the anchor point; determining fracture condition at which the first end of the tether detaches from the attachment point; agitating the cell at the fracture conditions so as to detach the first end of the tether from the attachment point; and separating the electronic device from the cell. Also provided is a method for designing a plurality of electronic devices, wherein each of the electronic devices is encapsulated in a cell of a wafer, die or other holder and wherein the fracture conditions are the same for a group of the electronic devices.
    • 一种形成电子装置的方法包括设计具有第一和第二端的系绳; 选择电子设备上的附着点; 将系绳的第一端附接到附接点,电子装置被封装在电池中; 选择一个锚点; 将系绳的第二端附接到锚点; 确定系绳的第一端从连接点分离的断裂状态; 在断裂条件下搅动细胞,以将系绳的第一端从附着点分离; 以及将电子设备与电池分离。 还提供了一种用于设计多个电子设备的方法,其中每个电子设备被封装在晶片,管芯或其他保持器的单元中,并且其中断裂条件对于一组电子设备是相同的。
    • 3. 发明授权
    • Systems and methods for dynamic anomaly detection
    • 动态异常检测的系统和方法
    • US08738652B2
    • 2014-05-27
    • US12046394
    • 2008-03-11
    • Stephen Patrick Kramer
    • Stephen Patrick Kramer
    • G06F17/10
    • G06F17/30539
    • Methods and systems for detecting anomalies in sets of data are disclosed, including: computing components of one or more types of feature vectors at a plurality of values of one or more independent variables, each type of the feature vectors characterizing a set of input data being dependent on the one or more independent variables; computing one or more types of output values corresponding to each type of feature vectors as a function of the one or more independent variables using a nonlinear sequence analysis method; and detecting anomalies in how the one or more types of output values change as functions of the one or more independent variables.
    • 公开了一种用于检测数据集中的异常的方法和系统,包括:以一个或多个独立变量的多个值计算一种或多种类型的特征向量的分量,每种类型的特征向量表征一组输入数据, 依赖于一个或多个独立变量; 使用非线性序列分析方法来计算与每种类型的特征向量相对应的一种或多种类型的输出值作为所述一个或多个独立变量的函数; 以及检测所述一个或多个类型的输出值如何随着所述一个或多个独立变量的函数而变化的异常。