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1. 发明申请

US20220350352A1 POWER SOURCE WITH ERROR DETECTION 有权
公开(公告)号：US20220350352A1
公开(公告)日：2022-11-03
申请号：US17245874
申请日：2021-04-30
申请人： Keithley Instruments, LLC
发明人： William C. Weeman
IPC分类号： G05F1/46 , G01R19/10 , G01R15/16
摘要： A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

2. 发明授权

US10802520B2 High performance current source power supply 有权
公开(公告)号：US10802520B2
公开(公告)日：2020-10-13
申请号：US13862135
申请日：2013-04-12
申请人： Keithley Instruments, Inc.
发明人： Kevin Cawley , Wayne Goeke , Gregory Sobolewski
IPC分类号： G05F1/575 , G01R31/317 , H04M1/24
摘要： A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.

3. 发明授权

US10763808B2 Source measure unit with guard drive circuit 有权
公开(公告)号：US10763808B2
公开(公告)日：2020-09-01
申请号：US16148463
申请日：2018-10-01
申请人： Keithley Instruments, LLC
发明人： James A. Niemann , Wayne C. Goeke
IPC分类号： H03F3/45 , G01R15/00 , G01R19/00
摘要： A test and measurement device including a source configured to output a source signal, a source output configured to output the source signal to a connected cable, a guard drive circuit electrically coupled to the source and configured to receive the source signal and generated a guard drive signal, the guard drive circuit having a gain less than one, and a guard drive circuit output configured to output the guard drive signal to a connected guard.

4. 发明授权

US10725105B2 Current leakage and charge injection mitigating solid state switch 有权
公开(公告)号：US10725105B2
公开(公告)日：2020-07-28
申请号：US15721633
申请日：2017-09-29
申请人： Keithley Instruments, LLC
发明人： Matthew Holtz , James Niemann , Martin Rice
IPC分类号： G01R31/20 , G01R31/319 , G01R1/073 , G01R31/28 , G01R1/04
摘要： Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

5. 外观设计

USD861710S1 Display screen with a graphical user interface for a measurement device 有权
公开(公告)号：USD861710S1
公开(公告)日：2019-10-01
申请号：US29598408
申请日：2017-03-24
申请人： Keithley Instruments, LLC
设计人： Brian P. Frackelton , Lawrence J. Kizlik , George J. Polly

6. 发明授权

US10338185B2 Method for self calibration of measurement nonlinearity 有权
公开(公告)号：US10338185B2
公开(公告)日：2019-07-02
申请号：US14576702
申请日：2014-12-19
申请人： Keithley Instruments, Inc.
发明人： Martin J. Rice
IPC分类号： G01R35/00 , G01D18/00 , H03M1/10 , G01R13/00 , G01R19/00
摘要： A method for calibrating a test instrument having an initial output voltage level and an open output relay can include programming the test instrument for a certain current level, starting a timer, and stopping the timer (responsive to the test instrument entering compliance) to determine a time interval. The method can also include determining whether the time interval is within a desired range.

7. 发明申请

US20190101591A1 Current Leakage And Charge Injection Mitigating Solid State Switch 审中-公开
公开(公告)号：US20190101591A1
公开(公告)日：2019-04-04
申请号：US15721633
申请日：2017-09-29
申请人： Keithley Instruments, LLC
发明人： Matthew Holtz , James Niemann , Martin Rice
IPC分类号： G01R31/319 , G01R31/28 , G01R1/073
摘要： Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

8. 发明申请

US20180259401A1 Temperature and Heat Map System 审中-公开
公开(公告)号：US20180259401A1
公开(公告)日：2018-09-13
申请号：US15849772
申请日：2017-12-21
申请人： Keithley Instruments, LLC
发明人： George J. Polly
IPC分类号： G01K3/14
CPC分类号： G01K3/14
摘要： Embodiments described herein include a data acquisition unit having a plurality of ports that are each configured to receive a signal from a respective temperature sensor of a device under test. Each of the temperature sensors is associated with a location with respect to the device under test. The data acquisition unit also includes a processor configured to determine a temperature corresponding to each temperature sensor, based on the signal received from the respective temperature sensor. The processor can then generate a thermal gradient for the device under test based on the temperature and the location of each of the temperature sensors. This thermal gradient can then be output for further analysis. Additional embodiments may be described and/or claimed herein.

9. 发明授权

US09778666B2 Dynamic current limit apparatus and method 有权
公开(公告)号：US09778666B2
公开(公告)日：2017-10-03
申请号：US13591534
申请日：2012-08-22
申请人： Gregory Sobolewski
发明人： Gregory Sobolewski
IPC分类号： H02H9/02 , G05F1/56 , G01R1/36 , G01R19/12
CPC分类号： G05F1/56 , G01R1/36 , G01R19/12 , H02H9/025
摘要： A dynamic current limiter circuit is disclosed. The dynamic current limiter includes an input node an output node. The dynamic current limiter also includes a current control valve coupled between the input and output nodes, the current control valve being configured to limit current flow between the input and output nodes based on a control input. The dynamic current limiter also includes a current change detector coupled between the input and output nodes, the current change detector being configured to detect a change in current through the input and output nodes and generate a control signal configured to drive the control input. The current control valve is configured to limit current flow between the input and output nodes in response to the current control signal.

10. 发明申请

US20220291278A1 UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION OF A DEVICE UNDER TEST 有权
公开(公告)号：US20220291278A1
公开(公告)日：2022-09-15
申请号：US17688733
申请日：2022-03-07
申请人： Keithley Instruments, LLC
发明人： Gregory Sobolewski , Jeffrey J. Trgovich , Brian D. Smith , James D. Bucci
IPC分类号： G01R31/28 , G01R31/26
摘要： A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device. A method of operating a combined static and dynamic device characterization platform includes receiving, through a user interface on a measurement device, a user input selecting between static and dynamic characterization of one or more devices under test (DUTs), sending the user input through a connection between the measurement device and a power device, receiving the user input at a power device, controlling signals to the one or more DUTs in the power device to perform one of static or dynamic characterization of the one or more DUTs, and sending output data resulting from the characterization to the measurement device.

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