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    • 5. 发明授权
    • Engagement features and adjustment structures for electronic devices with integral antennas
    • 具有集成天线的电子设备的接合特征和调整结构
    • US08750949B2
    • 2014-06-10
    • US13018263
    • 2011-01-31
    • Nicholas G. L. MerzDean F. Darnell
    • Nicholas G. L. MerzDean F. Darnell
    • H04Q1/24
    • H01Q1/243H01Q9/0421H01Q13/10H01Q13/103H04B1/38
    • Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include antenna structures that are formed from an internal ground plane and a peripheral conductive housing member. The internal ground plane and peripheral conductive housing member may be separated by a gap. The internal ground plane may be formed from sheet metal structures having engagement features such as tabs bent upwards at an angle. Plastic structures may be insert molded over the engagement features. When the internal ground plane is mounted in the electronic device, the plastic structures may bridge the gap between the internal ground plane and the peripheral conductive housing member. An adjustable structure such as a washer with a selectable thickness may be mounted to the peripheral conductive housing member opposing conductive structures across the gap. The thickness may be adjusted to adjust antenna performance.
    • 可以提供包含无线通信电路的电子设备。 无线通信电路可以包括由内部接地平面和外围导电壳体构件形成的天线结构。 内部接地平面和外围导电外壳构件可以间隔开。 内部接地平面可以由具有接合特征的金属板结构形成,例如以一定角度向上弯曲的凸片。 塑料结构可以在接合特征上嵌入成型。 当内部接地平面安装在电子设备中时,塑料结构可以桥接内部接地平面和外围导电壳体构件之间的间隙。 诸如具有可选择厚度的垫圈的可调结构可以安装到外围导电外壳构件上,跨越间隙与导电结构相对置。 可以调节厚度以调整天线性能。
    • 6. 发明授权
    • System and method for providing shared resources to test platforms
    • 向测试平台提供共享资源的系统和方法
    • US5838766A
    • 1998-11-17
    • US721409
    • 1996-09-26
    • Kevin W. Rand
    • Kevin W. Rand
    • H04Q1/24H04M1/24H04M3/08H04M3/22
    • H04Q1/24
    • A test system for testing a plurality of switches. A test platform requests the resources required for performing a test. A central configuration queue manager (CQM) determines whether the requested resources are available and allocates the resources to the test platform. However, Some resources may be allocated in blocking mode. That is, subsequent commands requesting such an allocated resource are queued until the resource is released/available. An example of a resource which may be allocated in blocking mode is a connection to a switch from a test platform. Other resources may be allocated in a non-blocking mode. An example of a resource which may be allocated in a non-blocking mode is an operator services trunk.
    • 一种用于测试多个开关的测试系统。 测试平台请求执行测试所需的资源。 中央配置队列管理器(CQM)确定所请求的资源是否可用,并将资源分配给测试平台。 但是,某些资源可能会以阻塞模式分配。 也就是说,请求这样分配的资源的后续命令被排队,直到资源被释放/可用。 可以以阻塞模式分配的资源的示例是从测试平台到交换机的连接。 可以以非阻塞模式分配其他资源。 可以以非阻塞模式分配的资源的示例是运营商服务中继。
    • 9. 发明授权
    • Path monitoring system for cross-connect system
    • 交叉连接系统路径监控系统
    • US5351232A
    • 1994-09-27
    • US27194
    • 1993-03-05
    • Hiroshi Yamashita
    • Hiroshi Yamashita
    • H04J3/14H04L7/00H04M3/26H04Q1/24H04Q3/52H04Q11/04H04Q11/06H04L1/24
    • H04J3/14H04Q1/245H04Q11/06
    • In a cross-connect system, test pattern insertion circuits are connected respectively to input line circuits to receive a sequence of frames each containing an idle timeslot and a sequence of data timeslots. Each insertion circuit is enabled at multiple frame intervals to insert a test pattern into the idle timeslot of one of the multiple frames. Time switches are associated respectively with output line circuits, each of the time switches comprising a plurality of memories connected respectively to the insertion circuits for receiving sequences of frames therefrom, and a selector connected to the memories. An incoming frame from each insertion circuit is written into the associated memories of each time switch, producing copies of the frame. Contents of the memories are then read on a per timeslot basis and the selector of each time switch is controlled to select one of the memories of the time switch to deliver a test pattern as well as data signals from the selected memory of each time switch to the associated output line circuit. Test pattern check circuits examines the delivered test patterns to evaluate the quality of paths from the input line circuits to the output line circuits.
    • 在交叉连接系统中,测试图案插入电路分别连接到输入线路电路,以接收每个包含空闲时隙和数据时隙序列的帧序列。 每个插入电路以多个帧间隔启用,以将测试模式插入到多个帧之一的空闲时隙中。 时间开关分别与输出线路电路相关联,每个时间开关包括分别连接到插入电路的多个存储器,用于从其接收帧序列,以及连接到存储器的选择器。 来自每个插入电路的输入帧被写入每个时间开关的相关存储器中,产生帧的副本。 然后每个时隙读取存储器的内容,并且控制每个时间开关的选择器以选择时间开关的一个存储器,以将测试图案以及从每个时间切换器的所选择的存储器的数据信号传送到 相关的输出线电路。 测试模式检查电路检查所提供的测试模式,以评估从输入线电路到输出线电路的路径的质量。
    • 10. 发明授权
    • Method of testing switches and switching circuit
    • 开关和开关电路的测试方法
    • US5347270A
    • 1994-09-13
    • US889379
    • 1992-05-28
    • Yoshio MatsudaHarufusa KondohIsamu HayashiHiromi Notani
    • Yoshio MatsudaHarufusa KondohIsamu HayashiHiromi Notani
    • H01L27/10H04L12/70H04L12/931H04L12/933H04Q1/24H04Q11/04H04L12/26H04M3/26
    • H04Q11/0421H04L49/104H04Q1/245H04Q11/0478H04L2012/5628
    • Incoming lines (I0 to I7) are connected to a space switch (2) through input data latches (1). The space switch (2) is connected to a normal/test changeover switch (12), which is connected to a normal/test changeover switch (13) through serial-to-parallel converting circuits (3), common buffer memories (4) and parallel-to-serial converting circuits (5). Space switches (6) are connected to the normal/test changeover switch (13). Outgoing lines (O0 to O7) are connected to the space switches 6 through output data latches (8). Connection states in the switches (2, 6) are placed in transposed relation to each other by a transposed connection generating circuit (10) in a test operation, so that the switches (2, 6) are directly connected to each other through the switches (12, 13). Predetermined data applied to the incoming lines are intactly used as expected values for judgement of the normal or abnormal operation of the set of switches of matrix structure.
    • 输入线(I0〜I7)通过输入数据锁存器(1)连接到空间开关(2)。 空间开关(2)连接到通过串行/并行转换电路(3),公共缓冲存储器(4)连接到正常/测试转换开关(13)的正常/测试转换开关(12) 和并行到串行转换电路(5)。 空间开关(6)连接到正常/测试切换开关(13)。 输出线(O0至O7)通过输出数据锁存器(8)连接到空间开关6。 开关(2,6)中的连接状态在测试操作中通过转置连接发生电路(10)彼此置换,使得开关(2,6)通过开关彼此直接相连 (12,13)。 对输入线路应用的预定数据完全用作用于判断矩阵结构的开关组的正常或异常操作的预期值。