
基本信息:
- 专利标题: 一种反应腔室和半导体设备
- 专利标题(英):Reaction chamber and semiconductor device
- 申请号:CN201610022270.1 申请日:2016-01-13
- 公开(公告)号:CN106971932A 公开(公告)日:2017-07-21
- 发明人: 王伟
- 申请人: 北京北方微电子基地设备工艺研究中心有限责任公司
- 申请人地址: 北京市北京经济技术开发区文昌大道8号
- 专利权人: 北京北方微电子基地设备工艺研究中心有限责任公司
- 当前专利权人: 北京北方华创微电子装备有限公司
- 当前专利权人地址: 北京市北京经济技术开发区文昌大道8号
- 代理机构: 北京天昊联合知识产权代理有限公司
- 代理人: 彭瑞欣; 张天舒
- 主分类号: H01J37/32
- IPC分类号: H01J37/32 ; H01L21/67
The invention discloses a reaction chamber and a semiconductor device. A side wall of the chamber is covered with an annular lining, the lower side of the chamber is provided with a lower electrode, the lower electrode includes a chuck and a lifting part connected with the chuck, the chuck is used for bearing a chip, the lifting part is used for driving the chuck to rise and fall, and during a process, the lifting part drives the chuck to rise to a high position, so that the chip is surrounded by the lining; the chamber also includes a shielding part, during the process, the shielding part divides the chamber into an upper chamber and a lower chamber which are isolated, the chuck is located in the upper chamber, and the lifting part is located in the lower chamber; and after the process is finished, the lifting part drives the chuck to fall to a low position, and the upper chamber and the lower chamber are connected. During the process in the reaction chamber, the chip is surrounded by the lining, and chamber environment around the chip is symmetric, thereby improving consistency of chip surface process conditions, such as uniform distribution of plasma, and improving uniformity of an etching result.
公开/授权文献:
- CN106971932B 一种反应腔室和半导体设备 公开/授权日:2019-04-23