专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07076415B1 System for mixed signal synthesis 失效
标题翻译：混合信号合成系统
公开(公告)号：US07076415B1
公开(公告)日：2006-07-11
申请号：US09560844
申请日：2000-04-28
申请人： Michael J. Demler , Stephen Lim , Geoffrey Ellis , Leslie D. Spruiell , Robert W. McGuffin , Bent H. Sorensen
发明人： Michael J. Demler , Stephen Lim , Geoffrey Ellis , Leslie D. Spruiell , Robert W. McGuffin , Bent H. Sorensen
IPC分类号： G06F17/50
CPC分类号： G06F17/505 , G06F17/5054 , G06F2217/86
摘要： Circuit synthesis is performed utilizing an optimizer that selects design parameters for a synthesis model of a circuit based on desired performance characteristics and performance characteristics/design parameters of previously synthesized circuits. Performance characteristics and design parameters of each synthesized circuit are maintain in conjunction with the synthesis model of the circuit being synthesized. A synthesis plan identifies the synthesis model and specific instructions on how to perform optimized selection of design parameters, how to set up test benches, and how to perform the simulation.
摘要翻译：利用优化器进行电路合成，所述优化器基于期望的性能特征和先前合成的电路的性能特征/设计参数来选择电路的合成模型的设计参数。每个合成电路的性能特征和设计参数与正在合成的电路的合成模型相结合。综合计划确定了如何执行设计参数优化选择，如何设置测试台以及如何执行仿真的综合模型和具体说明。

2. 发明授权

US07191112B2 Multiple test bench optimizer 失效
标题翻译：多个测试台优化器
公开(公告)号：US07191112B2
公开(公告)日：2007-03-13
申请号：US09843573
申请日：2001-04-26
申请人： Michael J. Demler , Stephen Lim , Geoffrey Ellis
发明人： Michael J. Demler , Stephen Lim , Geoffrey Ellis
IPC分类号： G06F17/50 , G06F9/45
CPC分类号： G06F17/5063 , G06F17/5036
摘要： Test benches, simulations, and scripts are invoked in parallel for testing multiple points in a circuit being synthesized in an Analog Mixed Signal environment. A simulation system for simultaneously optimizing performance characteristics in circuit synthesis uses a set of design parameters. At least one circuit model is used to incorporate the set of design parameters, each circuit model adapted to model a portion of the circuit pertaining to a performance characteristic. At least one analysis test bench is then connected to each circuit model. Each analysis test bench is adapted to model circuitry external to the circuit and control the type of analysis to be performed for each performance characteristic of the circuit.
摘要翻译：测试台，仿真和脚本被并行调用，用于测试在模拟混合信号环境中合成的电路中的多个点。用于同时优化电路合成中的性能特征的仿真系统使用一组设计参数。使用至少一个电路模型来结合该组设计参数，每个电路模型适于对与性能特征相关的电路的一部分进行建模。至少有一个分析测试台连接到每个电路模型。每个分析测试台适用于对电路外部的电路进行建模，并控制要为电路的每个性能特性执行的分析类型。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式