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1. 发明授权

US08671567B2 Method for manufacturing a probe for an electrical test 有权
标题翻译：制造电气试验用探针的方法
公开(公告)号：US08671567B2
公开(公告)日：2014-03-18
申请号：US12939879
申请日：2010-11-04
申请人： Hideki Hirakawa , Satoshi Kaizuka
发明人： Hideki Hirakawa , Satoshi Kaizuka
IPC分类号： H01R43/00
CPC分类号： G01R1/06755 , G01R1/06727 , G01R1/06733 , Y10T29/49002 , Y10T29/49204 , Y10T29/49222 , Y10T29/49224
摘要： A method for manufacturing a probed for an electrical test includes producing by a deposition technique a deposit including a probe main body portion made of a nickel-boron alloy and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from the probe main body portion. The method further includes annealing the deposit. The average grain diameter of the nickel-boron alloy is between 97 Å and 170 Å. The contained amount of boron is from 0.02 wt % to 0.20 wt %.
摘要翻译：用于电测试的探测方法包括通过沉积技术制造包括由镍 - 硼合金制成的探针主体部分和从探针主体部分向下突出并由不同导电材料从探针主体部分。该方法还包括退火沉积物。镍 - 硼合金的平均粒径为97埃至170埃。含硼量为0.02重量％〜0.20重量％。

2. 发明申请

US20100213956A1 PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF 有权
标题翻译：目前的测试探针，探头组装及其生产方法
公开(公告)号：US20100213956A1
公开(公告)日：2010-08-26
申请号：US12096168
申请日：2006-01-25
申请人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
发明人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
IPC分类号： G01R31/02 , G03F7/20
CPC分类号： G01R1/06733 , G01R1/06727 , G01R1/06761 , G01R3/00
摘要： A probe for current test comprising: a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board; a solder layer formed on at least one side face of said connection portion; and a guide portion formed on the connection portion, penetrating the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face, and when the solder layer is melted, capable of guiding a portion thereof to the other side face.
摘要翻译：一种用于当前测试的探针，包括：探针体，其具有端面变成与探针板的连接面的板状连接部; 形成在所述连接部的至少一个侧面上的焊料层; 以及引导部，形成在所述连接部上，从形成于所述另一侧面的所述焊接层的一个侧面沿着厚度方向贯通所述连接部，并且当所述焊料层熔融时，能够将其一部分引导到另一面

3. 发明授权

US07736690B2 Method for manufacturing an electrical test probe 有权
标题翻译：电测试探头的制造方法
公开(公告)号：US07736690B2
公开(公告)日：2010-06-15
申请号：US12017300
申请日：2008-01-21
申请人： Hideki Hirakawa , Yuko Yamada , Yosuke Yoshizawa , Takayuki Hayashizaki , Akira Soma , Shinji Kuniyoshi
发明人： Hideki Hirakawa , Yuko Yamada , Yosuke Yoshizawa , Takayuki Hayashizaki , Akira Soma , Shinji Kuniyoshi
IPC分类号： B05D5/12
CPC分类号： G01R1/06755 , G01R1/06733 , Y10T29/49117 , Y10T29/49204
摘要： A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way. Thus, the cross-sectional area at the maximum cross-sectional area portion reaching the base portion of the probe tip section can be made to be larger than in the conventional case, and along with the increase of the cross-sectional area, the stress acting on the base portion can be lowered.
摘要翻译：电测试探针的探针尖端部分具有由第一沉积部分和覆盖第一沉积部分的第二沉积部分组成的层压结构，并且通过层压结构，包括最大横截面积部分，其截面积在探针末端部的前端部与探针头部的基部之间，设置有探针头部的部分增加到基部。在最大横截面积部分，在垂直于探针尖端部分的突出方向的平坦表面上看到的X方向上的尺寸以一维方式增加，另外，Y方向上的尺寸与X方向垂直的方向从前端朝向基部增加，结果能够以二维方式增大探针末端部的截面积。因此，能够使到达到探头前端部的基部的最大截面积部分的截面积大于常规情况，并且随着横截面积的增加，应力可以降低作用于基部的部分。

4. 发明授权

US07721429B2 Method for manufacturing a probe 有权
标题翻译：探针制造方法
公开(公告)号：US07721429B2
公开(公告)日：2010-05-25
申请号：US12017299
申请日：2008-01-21
申请人： Akira Soma , Takayuki Hayashizaki , Yosuke Yoshizawa , Hideki Hirakawa
发明人： Akira Soma , Takayuki Hayashizaki , Yosuke Yoshizawa , Hideki Hirakawa
IPC分类号： H01R43/16
CPC分类号： H01R13/2407 , H01R43/16 , H01R2201/20 , Y10T29/49126 , Y10T29/49128 , Y10T29/4913 , Y10T29/49153 , Y10T29/49204 , Y10T29/49222
摘要： A probe formed on a base table is detached from the base table without giving damage on the probe. The present invention provides a probe manufacturing method comprising the steps of forming on a sacrificial layer on a base table a recess exposing the sacrificial layer with a resist, depositing a probe material in the recess to form a probe and then removing the resist, leaving part of the sacrificial layer and removing the rest by an etching process, and detaching from the base table the probe held on the base table by the remaining part of the sacrificial layer. In the recess of the resist are formed a main body part corresponding to a flat surface shape of the probe and an auxiliary part continuing into the main body part. The probe is formed by deposition of the material at the main body part, and a holding portion is formed by deposition of the material at the auxiliary part. The auxiliary part is formed in a flat surface shape sufficient for a sacrificial layer part under the holding portion to remain when a sacrificial layer part under the probe is removed by the etching process. The probe is separated from the holding portion after the sacrificial layer part under the probe is removed and while the sacrificial layer part under the holding portion remains.
摘要翻译：形成在基台上的探头与基座分离而不会损坏探头。本发明提供了一种探针制造方法，包括以下步骤：在基台上的牺牲层上形成用抗蚀剂暴露牺牲层的凹部，将探针材料沉积在凹部中以形成探针，然后除去抗蚀剂，留下部分的牺牲层，并通过蚀刻工艺去除其余部分，并且通过牺牲层的剩余部分从基台分离保持在基台上的探针。在抗蚀剂的凹部中形成有对应于探针的平坦表面形状的主体部分和连续进入主体部分的辅助部件。探针通过在主体部分沉积材料形成，并且通过在辅助部分沉积材料形成保持部分。当通过蚀刻工艺去除探针下方的牺牲层部分时，辅助部件形成为足够用于保持部分下方的牺牲层部分的平坦表面形状。在探针下方的牺牲层部分被去除之后，并且在保持部分下面的牺牲层部分保留下来，探针与保持部分分离。

5. 发明授权

US07557593B2 Probe for electrical test and probe assembly 有权
标题翻译：探头用于电气测试和探头组装
公开(公告)号：US07557593B2
公开(公告)日：2009-07-07
申请号：US11627900
申请日：2007-01-26
申请人： Hideki Hirakawa , Akira Souma , Takayuki Hayashizaki , Shinji Kuniyoshi
发明人： Hideki Hirakawa , Akira Souma , Takayuki Hayashizaki , Shinji Kuniyoshi
IPC分类号： G01R1/067 , H01R12/00 , H01R4/02
CPC分类号： G01R3/00 , H01L2924/00013 , H01L2224/29099
摘要： A probe for electrical test comprises a probe body having a base end attached to a support base plate through a solder and a front end continuous with said base end and a surface layer showing a conductivity higher than that of the probe body and a solder wettability higher than that of the probe body and extending on the surface of the probe body from the base end to the front end. In the vicinity of the base end of the surface layer, a shield region having a smaller solder wettability than that of the surface layer is formed across the surface layer.
摘要翻译：用于电测试的探针包括探针主体，其具有通过焊料附接到支撑基板的基端，并且与所述基端连续的前端和表现出高于探针主体的导电性的表面层，并且焊料润湿性更高比探针主体的长度大，并且在探头主体的表面上从基端延伸到前端。在表面层的基端附近，在表面层上形成具有比表层更小的焊料润湿性的屏蔽区域。

6. 发明申请

US20090051382A1 PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT 有权
标题翻译：电气测试和电气连接设备的探索
公开(公告)号：US20090051382A1
公开(公告)日：2009-02-26
申请号：US11817493
申请日：2005-03-07
申请人： Shinji Kuniyoshi , Hideki Hirakawa , Akira Soma , Takayuki Hayashizaki
发明人： Shinji Kuniyoshi , Hideki Hirakawa , Akira Soma , Takayuki Hayashizaki
IPC分类号： G01R1/067
CPC分类号： G01R1/06727 , G01R1/06738
摘要： A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
摘要翻译：探头包括在前后方向上延伸的臂区域和从臂区域的前端部向下延伸的尖端区域。尖端区域具有与臂区域的前端侧的下边缘部分整体连续的基座部分，并且具有沿垂直方向延伸的假想轴线倾斜的下侧; 以及从基座部分的下侧突出并具有与假想轴正交的尖端的接触部分。因此，可以精确地确定尖端的位置。

7. 发明申请

US20090009197A1 PROBE FOR ELECTRICAL TEST 审中-公开
标题翻译：探测电气测试
公开(公告)号：US20090009197A1
公开(公告)日：2009-01-08
申请号：US11772796
申请日：2007-07-02
申请人： Hideki HIRAKAWA , Akira SOUMA , Yoshikazu URUSHIYAMA
发明人： Hideki HIRAKAWA , Akira SOUMA , Yoshikazu URUSHIYAMA
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , G01R1/06727 , G01R1/06738 , G01R3/00
摘要： A probe for electrical test comprises an arm region extending in a first direction, and a tip region leading to one side in a second direction intersecting the first direction of the arm region, and has a plate form making a direction interesting the first and second directions a thickness direction. The tip region includes a pedestal portion leading to the arm region and a contact portion leading to the pedestal portion, and the contact portion includes a base portion forming a part of the pedestal portion and a projecting portion leading to the base portion and projecting from the pedestal portion in the second direction. By this, damage to the contact portion is prevented.
摘要翻译：用于电测试的探针包括沿第一方向延伸的臂区域和沿着与臂区域的第一方向相交的第二方向的一侧的尖端区域，并且具有使第一和第二方向有趣的方向的板形厚度方向。尖端区域包括通向臂区域的基座部分和通向基座部分的接触部分，并且接触部分包括形成基座部分的一部分的基部和通向基部的突出部分，基座部分在第二方向上。由此，能够防止对接触部的损伤。

8. 发明申请

US20080184559A1 METHOD FOR MANUFACTURING A PROBE 有权
标题翻译：制造探针的方法
公开(公告)号：US20080184559A1
公开(公告)日：2008-08-07
申请号：US12017299
申请日：2008-01-21
申请人： Akira SOMA , Takayuki HAYASHIZAKI , Yosuke YOSHIZAWA , Hideki HIRAKAWA
发明人： Akira SOMA , Takayuki HAYASHIZAKI , Yosuke YOSHIZAWA , Hideki HIRAKAWA
IPC分类号： H01R43/16
CPC分类号： H01R13/2407 , H01R43/16 , H01R2201/20 , Y10T29/49126 , Y10T29/49128 , Y10T29/4913 , Y10T29/49153 , Y10T29/49204 , Y10T29/49222
摘要： A probe formed on a base table is detached from the base table without giving damage on the probe. The present invention provides a probe manufacturing method comprising the steps of forming on a sacrificial layer on a base table a recess exposing the sacrificial layer with a resist, depositing a probe material in the recess to form a probe and then removing the resist, leaving part of the sacrificial layer and removing the rest by an etching process, and detaching from the base table the probe held on the base table by the remaining part of the sacrificial layer. In the recess of the resist are formed a main body part corresponding to a flat surface shape of the probe and an auxiliary part continuing into the main body part. The probe is formed by deposition of the material at the main body part, and a holding portion is formed by deposition of the material at the auxiliary part. The auxiliary part is formed in a flat surface shape sufficient for a sacrificial layer part under the holding portion to remain when a sacrificial layer part under the probe is removed by the etching process. The probe is separated from the holding portion after the sacrificial layer part under the probe is removed and while the sacrificial layer part under the holding portion remains.
摘要翻译：形成在基台上的探头与基座分离而不会损坏探头。本发明提供了一种探针制造方法，包括以下步骤：在基台上的牺牲层上形成用抗蚀剂暴露牺牲层的凹部，将探针材料沉积在凹部中以形成探针，然后除去抗蚀剂，留下部分的牺牲层，并通过蚀刻工艺去除其余部分，并且通过牺牲层的剩余部分从基台分离保持在基台上的探针。在抗蚀剂的凹部中形成有对应于探针的平坦表面形状的主体部分和连续进入主体部分的辅助部件。探针通过在主体部分沉积材料形成，并且通过在辅助部分沉积材料形成保持部分。当通过蚀刻工艺去除探针下方的牺牲层部分时，辅助部件形成为足够用于保持部分下方的牺牲层部分的平坦表面形状。在探针下方的牺牲层部分被去除之后，并且在保持部分下面的牺牲层部分保留下来，探针与保持部分分离。

9. 发明申请

US20070018633A1 Probe use in electric test 审中-公开
标题翻译：探头用于电气测试
公开(公告)号：US20070018633A1
公开(公告)日：2007-01-25
申请号：US11436674
申请日：2006-05-19
申请人： Hideki Hirakawa , Akira Souma , Takayuki Hayashizaki , Shinji Kuniyoshi
发明人： Hideki Hirakawa , Akira Souma , Takayuki Hayashizaki , Shinji Kuniyoshi
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , G01R1/06727
摘要： A probe comprises a body member having a front end area and supported on a support member in a cantilever state, and a tip member combined with the front end area of the body member. The tip member includes a base portion with at least a part of the tip member embedded in the front end area; a contact portion to be pressed against a device under test and projecting from the base portion in a second direction; and a reference portion formed at a position spaced apart from the contact portion in a first direction and projecting from the base portion in the second direction intersecting the first direction, and is made of a harder material than the body member.
摘要翻译：探针包括具有前端区域并以悬臂状态支撑在支撑构件上的主体构件，以及与主体构件的前端区域结合的末端构件。尖端构件包括：基部，其顶端构件的至少一部分嵌入前端区域; 接触部分，被压靠在被测设备上并从第二方向从基部突出; 以及基准部，其形成在与所述接触部在第一方向间隔开的位置，并且在与所述第一方向交叉的所述第二方向上从所述基部突出，并且由比所述主体部件更硬的材料制成。

10. 发明授权

US6035338A Document browse support system and document processing system 失效
标题翻译：文件浏览支持系统和文件处理系统
公开(公告)号：US6035338A
公开(公告)日：2000-03-07
申请号：US933137
申请日：1997-09-18
申请人： Hideki Hirakawa , Kazuhiro Kimura
发明人： Hideki Hirakawa , Kazuhiro Kimura
IPC分类号： G06F3/14 , G06F3/048 , G06F12/00 , G06F13/00 , G06F17/30 , G06T1/00 , H04L25/06 , H04L29/06 , G06F15/16
CPC分类号： G06F17/30882 , G06F17/30014 , H04L29/06 , Y10S707/99933 , Y10S707/99934 , Y10S707/99935 , Y10S707/99936
摘要： An expression pattern in a document and the data describing related information associated with the output information to obtain the output information corresponding to the expression pattern are inputted. An expression pattern in a document on a computer network is sensed by reference to the expression pattern in the data. The output information corresponding to the sensed expression pattern is created from a document on the computer network on the basis of the related information in the inputted data.
摘要翻译：输入文档中的表达模式和描述与输出信息相关联的相关信息以获得对应于表达模式的输出信息的数据。通过参考数据中的表达模式来感测计算机网络上的文档中的表达模式。根据输入的数据中的相关信息，从计算机网络上的文档创建与感测到的表达模式对应的输出信息。

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