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    • 7. 发明授权
    • Peak power detection in digital designs using emulation systems
    • 使用仿真系统的数字设计中的峰值功率检测
    • US08108194B2
    • 2012-01-31
    • US12346004
    • 2008-12-30
    • Bing ZhuTsair-Chin LinTung-sun TungJingbo Gao
    • Bing ZhuTsair-Chin LinTung-sun TungJingbo Gao
    • G06F17/50G06F9/455
    • G06F17/5027G06F2217/78
    • A method of analyzing power consumption for a DUT (device under test) that includes an integrated circuit or an electronic system includes: providing emulation data for states of the DUT in one or more time windows; determining operational mode values from the emulation data and a selection of operational modes that characterize circuit behavior in the one or more time windows; dividing each time window into one or more segments based on at least one power criterion; determining power-activity values for the one or more segments; determining power-consumption values for the one or more segments from the power-activity values; using the power-activity values and the power-consumption values to determine relative power activity across the one or more segments and adjusting the one or more segments to target high power activity over operational modes in the one or more time windows; and saving one or more values for power activity of the DUT in a computer-readable medium.
    • 一种分析包括集成电路或电子系统的DUT(被测设备)的功耗的方法包括:在一个或多个时间窗口中提供DUT的状态的仿真数据; 从所述仿真数据确定操作模式值,以及表征所述一个或多个时间窗口中的电路行为的操作模式的选择; 基于至少一个功率标准将每个时间窗分成一个或多个片段; 确定所述一个或多个段的功率活动值; 从所述功率活动值确定所述一个或多个片段的功耗值; 使用功率活动值和功率消耗值来确定跨越所述一个或多个段的相对功率活动并且调整所述一个或多个段以在所述一个或多个时间窗中的操作模式为目标高功率活动; 并且在计算机可读介质中保存DUT的功率活动的一个或多个值。
    • 8. 发明申请
    • PEAK POWER DETECTION IN DIGITAL DESIGNS USING EMULATION SYSTEMS
    • 使用仿真系统进行数字设计中的峰值功率检测
    • US20090271167A1
    • 2009-10-29
    • US12346004
    • 2008-12-30
    • Bing ZHUTsair-Chin LinTung-sun TungJingbo Gao
    • Bing ZHUTsair-Chin LinTung-sun TungJingbo Gao
    • G06F17/50
    • G06F17/5027G06F2217/78
    • A method of analyzing power consumption for a DUT (device under test) that includes an integrated circuit or an electronic system includes: providing emulation data for states of the DUT in one or more time windows; determining operational mode values from the emulation data and a selection of operational modes that characterize circuit behavior in the one or more time windows; dividing each time window into one or more segments based on at least one power criterion; determining power-activity values for the one or more segments; determining power-consumption values for the one or more segments from the power-activity values; using the power-activity values and the power-consumption values to determine relative power activity across the one or more segments and adjusting the one or more segments to target high power activity over operational modes in the one or more time windows; and saving one or more values for power activity of the DUT in a computer-readable medium.
    • 一种分析包括集成电路或电子系统的DUT(被测设备)的功耗的方法包括:在一个或多个时间窗口中提供DUT的状态的仿真数据; 从所述仿真数据确定操作模式值,以及表征所述一个或多个时间窗口中的电路行为的操作模式的选择; 基于至少一个功率标准将每个时间窗分成一个或多个片段; 确定所述一个或多个段的功率活动值; 从所述功率活动值确定所述一个或多个片段的功耗值; 使用功率活动值和功率消耗值来确定跨越所述一个或多个段的相对功率活动并且调整所述一个或多个段以在所述一个或多个时间窗中的操作模式为目标高功率活动; 并且在计算机可读介质中保存DUT的功率活动的一个或多个值。