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1. 发明专利

JP2004291947A Automobile start-up inspection apparatus 审中-公开
公开(公告)号：JP2004291947A
公开(公告)日：2004-10-21
申请号：JP2003126053
申请日：2003-03-25
申请人： Masaaki Ito , 昌明伊藤
发明人： ITO MASAAKI
IPC分类号： B60R16/02 , B60K37/02 , B60Q11/00
摘要： PROBLEM TO BE SOLVED: To provide an automobile start-up inspection apparatus which can eliminate a difficulty involved in start-up inspection that, in each case of start-up inspection, a main switch has to be switched over and getting out of the automobile is necessary for inspection.
SOLUTION: In this automobile start-up inspection apparatus, a display panel 1 of the present invention (for projecting a lamp of each light on a development diagram of the type of each automobile) is installed in a dash panel. This construction can contribute to traffic safety.
COPYRIGHT: (C)2005,JPO&NCIPI

2. 发明专利

JP2008285909A Upper surface finishing block and base encasing block 审中-公开
标题翻译：上表面修整块和基座块
公开(公告)号：JP2008285909A
公开(公告)日：2008-11-27
申请号：JP2007132291
申请日：2007-05-18
申请人： Masaaki Ito , 公明伊藤
发明人： ITO MASAAKI
IPC分类号： E02D5/30 , E02D5/60 , E02D27/00
摘要： PROBLEM TO BE SOLVED: To provide an upper surface finishing block which contributes to the inexpensive setting of a pile in a short time, and facilitates the setting of the pile in a place exposed to water or in a cold climate area.
SOLUTION: The upper surface finishing block 1 is a concrete structure which functions to level the upper surface of the pile 3 to the ground surface, and is secured to side surfaces of the pile 3 when pile embedding work for embedding the pile 3 in the ground is carried out in order to prevent the pile 3 from settling or inclining due to an external force after the completion of the embedding work. In the embedding work, the pile 3 is fitted into a columnar hole 1a, and while the upper surface is leveled to the ground surface, the base encasing block is secured to the pile 3 with mortar 6 filled in a gap t between the columnar hole 1a and the side surfaces of the pile 3. The mortar 6 is filled in the narrow gap t, and therefore even if a horizontal force is applied to the pile 3, sand friction in the mortar 6 is large, and therefore the mortar 6 in the gap t is hardly compressed. Therefore, before the hardening of the mortar 6 by hydration, the upper surface finishing block 1 and a base encasing block 2 are considerably rigidly secured to the pile 3 when the embedding work is completed.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种有助于在短时间内廉价设置桩的上表面精加工块，并且有助于在暴露于水或寒冷气候区域的地方设置桩。解决方案：上表面精加工块1是用于将桩3的上表面平铺到地面的混凝土结构，并且当用于嵌入桩3的桩嵌入工作时固定到桩3的侧表面在地面上进行，以防止在嵌入作业完成之后由于外力而使桩3沉降或倾斜。在嵌入工作中，将桩3装配到柱状孔1a中，并且当上表面平整到地面时，基座封装块被固定到桩3，砂浆6填充在柱孔之间的间隙t中砂浆6被填充在窄间隙t中，因此即使向桩3施加水平力，砂浆6中的砂摩擦力大，因此，砂浆6在间隙t几乎不被压缩。因此，在通过水合固化砂浆6之前，当嵌入工作完成时，上表面精加工块1和基座封装块2相当刚性地固定到桩3上。版权所有（C）2009，JPO＆INPIT

3. 发明专利

JPS5950484B2 JPS5950484B2 - 失效
公开(公告)号：JPS5950484B2
公开(公告)日：1984-12-08
申请号：JP11229481
申请日：1981-07-20
申请人： Hotsukaido Togyo Kk , Masaaki Ito
发明人： ITO MASAAKI , TANAKA ZENJI , SUZUKI HIROSHI
IPC分类号： B27L3/00

4. 发明专利

JPS5938181B2 JPS5938181B2 - 失效
公开(公告)号：JPS5938181B2
公开(公告)日：1984-09-14
申请号：JP16284879
申请日：1979-12-17
申请人： Hotsukaido Togyo Kk , Masaaki Ito , Kunnetsupu Setsukai Kogyo Kk
发明人： ITO MASAAKI , IKENAGA TOSHIO , KOIDE HIROSHI , TANAKA ZENJI , JODO TAKESHI , KAWAMURA KAZUO , FUSHIKI HIDEYUKI , YOSHIMURA YOSHIMASA , ONODERA YUKIAKI
IPC分类号： C01F11/02 , C05D3/00 , C05F5/00 , C05G3/00
CPC分类号： Y02A40/209

5. 发明申请

US20170032864A1 COLLIMATOR APPARATUS, RADIATION SYSTEM, AND METHOD FOR CONTROLLING COLLIMATORS 有权
标题翻译：收缩器装置，辐射系统和用于控制收缩器的方法
公开(公告)号：US20170032864A1
公开(公告)日：2017-02-02
申请号：US15220554
申请日：2016-07-27
申请人： Eiki YOSHIMIZU , Hiroshi KOIDE , Masashi YAMAMOTO , Masaaki ITO
发明人： Eiki YOSHIMIZU , Hiroshi KOIDE , Masashi YAMAMOTO , Masaaki ITO
IPC分类号： G21K1/02
CPC分类号： G21K1/02
摘要： There is provided a collimator apparatus including a first collimator configured to prevent a leakage of radiation, wherein a target for converting electron beam emitted from an electron beam source into the radiation is disposed in the first collimator, and a second collimator, wherein the radiation passes through the second collimator along a central axis of the second collimator, the second collimator being disposed in an inner space formed in the first collimator, a gap between a surface of the inner space and the second collimator being provided, wherein the second collimator swings within the inner space of the first collimator.
摘要翻译：提供了一种准直器装置，包括：第一准直器，被配置为防止辐射泄漏，其中用于将从电子束源发射的电子束转换成辐射的靶设置在第一准直器中;以及第二准直器，其中，辐射通过沿着第二准直仪的中心轴线通过第二准直仪，第二准直仪设置在形成在第一准直仪中的内部空间中，提供内部空间的表面与第二准直仪之间的间隙，其中第二准直仪在内部摆动第一准直仪的内部空间。

6. 发明申请

US20140198321A1 SURFACE SHAPE MEASURING APPARATUS 有权
标题翻译：表面形状测量装置
公开(公告)号：US20140198321A1
公开(公告)日：2014-07-17
申请号：US14240669
申请日：2012-07-27
申请人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
发明人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
IPC分类号： G01B11/24 , G01N21/55
CPC分类号： G01B11/303 , G01B11/24 , G01B2210/56 , G01N21/4738 , G01N21/55 , G01N21/9501 , G01N2201/12
摘要： In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.
摘要翻译：在现有技术中，不考虑散射光的空间分布根据微粗糙度的差异而在各种方向如前后/侧面变化。特别地，虽然出现在外延生长晶片上的台阶平台结构在散射光分布中产生各向异性，但是在现有技术中没有考虑到这一点。本发明包括将光照射到样品表面的方法，在光轴方向上彼此不同的多个检测光学系统检测散射光的空间分布，并且计算样品表面的空间频谱。

7. 发明申请

US20130286191A1 INSPECTION APPARATUS 有权
标题翻译：检查装置
公开(公告)号：US20130286191A1
公开(公告)日：2013-10-31
申请号：US13997496
申请日：2011-11-02
申请人： Masaaki Ito , Hidetoshi Nishimura , Takahiro Jingu
发明人： Masaaki Ito , Hidetoshi Nishimura , Takahiro Jingu
IPC分类号： H04N7/18
CPC分类号： H04N7/18 , G01N21/47 , G01N21/9501 , G01N21/956 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： In a defect inspecting apparatus, the strength of a fatal defect signal decreases due to miniaturization. Thus, in order to assure a high SN ratio, it is necessary to reduce noises caused by scattered light from a wafer. Roughness of a pattern edge and surface roughness which serve as a scattered-light source are spread over the entire wafer. The present invention has discovered the fact that reduction of an illuminated area is a technique effective for decreasing noises. That is to say, the present invention has discovered the fact that creation of an illuminated area having a spot shape and reduction of the dimension of a spot beam are effective. A plurality of temporally and spatially divided spot beams are radiated to the wafer serving as a sample.
摘要翻译：在缺陷检查装置中，致命缺陷信号的强度由于小型化而降低。因此，为了确保高的SN比，需要减少由晶片散射的光产生的噪声。用作散射光源的图案边缘和表面粗糙度的粗糙度分布在整个晶片上。本发明已经发现，减少照明区域是有效降低噪声的技术。也就是说，本发明已经发现了具有斑点形状的照明区域的创建和点光束的尺寸的减小的事实是有效的。将多个时间上和空间上分开的光束照射到作为样品的晶片。

8. 发明申请

US20130250297A1 INSPECTION APPARATUS AND INSPECTION SYSTEM 审中-公开
标题翻译：检查装置和检查系统
公开(公告)号：US20130250297A1
公开(公告)日：2013-09-26
申请号：US13990103
申请日：2011-10-11
申请人： Masaaki Ito , Minori Noguchi
发明人： Masaaki Ito , Minori Noguchi
IPC分类号： G01N21/95
CPC分类号： G01N21/9501 , G01N21/95607
摘要： Disclosed here is a macro inspection apparatus for a sample such as a semiconductor wafer having a pattern formed thereon, the apparatus being capable of detecting abnormalities in dimension and size with high sensitivity.The inspection apparatus for a sample having pattern formed thereon includes: an illumination optical system which illuminates the sample having the pattern formed thereon; a detection optical system which receives scattered light from the pattern; an imaging device which is disposed over a pupil plane of the detection optical system, the imaging device acquiring Fourier images of the pattern; and a processing unit which compares the Fourier images with the Fourier image of the normal pattern to detect an irregularity of the pattern.
摘要翻译：这里公开了一种用于诸如其上形成有图案的半导体晶片的样品的宏观检查装置，该装置能够以高灵敏度检测尺寸和尺寸的异常。用于其上形成有图案的样品的检查装置包括：照射具有形成在其上的图案的样品的照明光学系统; 检测光学系统，其接收来自图案的散射光; 成像装置，其设置在所述检测光学系统的光瞳平面上，所述成像装置获取所述图案的付里叶图像; 以及处理单元，其将傅立叶图像与正常图案的傅里叶图像进行比较，以检测图案的不规则性。

9. 发明授权

US07819159B2 Substrate assembly apparatus and substrate assembly method 有权
标题翻译：基板装配装置和基板装配方法
公开(公告)号：US07819159B2
公开(公告)日：2010-10-26
申请号：US11439953
申请日：2006-05-25
申请人： Masaaki Ito , Yukinori Nakayama , Tatsuharu Yamamoto , Hiroaki Imai
发明人： Masaaki Ito , Yukinori Nakayama , Tatsuharu Yamamoto , Hiroaki Imai
IPC分类号： B29C65/00 , B32B37/00
CPC分类号： G02F1/1341 , G02F1/1303 , G02F2001/133354 , G02F2001/13415 , G02F2202/28
摘要： A bonding apparatus, suitable for accurately bonding large substrates for a liquid crystal display, includes Z-axis drive mechanisms, and upper and lower chambers. The Z-axis drive mechanisms for moving an upper frame vertically are disposed at four corners of a mount. The upper chamber is supported by the upper frame and has an upper table inside. The lower chamber has a lower table inside and is supported on the mount. The upper and lower chambers are united through a seal ring to define a vacuum chamber. Moving the upper frame moves the upper chamber vertically to open or close the vacuum chamber. The lower table is supported via a free joint stage between the plurality of support legs and the table, and is moved horizontally by a side thrust mechanism disposed outside of the vacuum chamber.
摘要翻译：适合于将液晶显示器的大基板精确地接合的接合装置包括Z轴驱动机构和上下室。用于垂直移动上框架的Z轴驱动机构设置在底座的四个角处。上部腔室由上部框架支撑，内部具有上部工作台。下腔室内有一个较低的台面，并支撑在支架上。上部和下部腔室通过密封环联合以限定真空室。移动上框架使上室垂直移动以打开或关闭真空室。下表通过多个支撑腿和台之间的自由关节台支撑，并且通过设置在真空室外部的侧推力机构水平移动。

10. 发明授权

US07746659B2 Electro-optical device and electronic apparatus 有权
标题翻译：电光装置和电子设备
公开(公告)号：US07746659B2
公开(公告)日：2010-06-29
申请号：US12072165
申请日：2008-02-25
申请人： Masaaki Ito
发明人： Masaaki Ito
IPC分类号： H05K1/18
CPC分类号： G02F1/13452 , G02F1/133385
摘要： The invention provides a heat dissipater such as a heat dissipation member that dissipates heat of an integrated circuit that is formed on a flexible substrate such as a flexible printed circuit board. The heat dissipater according to an aspect of the invention includes; a main body section that is formed in the shape of a hollow sleeve in such a manner that the flexible substrate can be inserted through and inserted inside the main body section; and an adhering section that is formed on an inner surface of the main body section in such a manner that the main body section and the integrated circuit are adhered to each other via the adhering section.
摘要翻译：本发明提供一种散热器，例如散热构件，其散热形成在诸如柔性印刷电路板的柔性基板上的集成电路的热量。根据本发明的一个方面的散热器包括：主体部，其形成为中空套筒的形状，使得柔性基板能够插入并插入到主体部内; 以及粘附部，其以主体部和集成电路经由粘接部彼此粘合形成在主体部的内表面上。

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