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1. 发明授权

US09109982B2 Sliced specimen preparing apparatus 有权
标题翻译：切片标本制备装置
公开(公告)号：US09109982B2
公开(公告)日：2015-08-18
申请号：US14113951
申请日：2012-04-24
申请人： Daisuke Nakajima , Yuko Nanjo
发明人： Daisuke Nakajima , Yuko Nanjo
IPC分类号： G01N1/28 , G01N1/06
CPC分类号： G01N1/286 , G01N1/06
摘要： A sliced specimen preparing apparatus prepares a sliced specimen by slicing a surface of a specimen block in which a specimen is embedded in an embedding-substance. The apparatus includes: a cutter configured to slice the surface of the specimen block; a surface exposure determination unit configured to determine whether or not the area of a specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen; and a specimen block transporting unit configured to transport the specimen block between the surface exposure determination unit and the cutter. The surface exposure determination unit includes a humidifying unit configured to humidify the surface of the specimen block; an irradiating unit configured to irradiate the surface of the specimen block with light; an imaging unit configured to receive reflected light from the humidified surface of the specimen block which is irradiated from the irradiating unit to acquire image data; an image data processing unit configured to discriminate the specimen portion on the surface of the specimen block from the embedding-substance portion based on the image data acquired by the imaging unit; and a controller configured to control the imaging unit, the irradiating unit, and the image data processing unit, and to determine whether or not the area of the specimen portion on the surface of the specimen block, the specimen portion being acquired by the image data processing unit, is sufficient for the preparation of the sliced specimen.
摘要翻译：切片试样制备装置通过将样品嵌入嵌入物质中的样品块的表面切片来制备切片试样。该装置包括：切割器，被配置为切片样品块的表面; 表面曝光判定单元，其被配置为确定样本块的表面上的样本部分的面积是否足以制备切片样本; 以及被配置为在所述表面曝光判定单元和所述切割器之间输送所述检体块的检体块传送单元。表面曝光判定单元包括：加湿单元，其构造成对样本块的表面进行加湿; 照射单元，被配置为用光照射所述样本块的表面; 成像单元，被配置为从所述照射单元接收从所述样本块的所述加湿表面接收的反射光，以获取图像数据; 图像数据处理单元，被配置为基于由所述成像单元获取的图像数据，将所述样本块的表面上的样本部分与所述嵌入物部分区分开; 以及控制器，被配置为控制成像单元，照射单元和图像数据处理单元，并且确定样本块的表面上的样本部分的面积，样本部分是否由图像数据获取处理单元，足以制备切片样品。

2. 发明申请

US20140051158A1 SLICED SPECIMEN PREPARING APPARATUS 有权
标题翻译： SLIED样品制备设备
公开(公告)号：US20140051158A1
公开(公告)日：2014-02-20
申请号：US14113951
申请日：2012-04-24
申请人： Daisuke Nakajima , Yuko Nanjo
发明人： Daisuke Nakajima , Yuko Nanjo
IPC分类号： G01N1/28
CPC分类号： G01N1/286 , G01N1/06
摘要： A sliced specimen preparing apparatus prepares a sliced specimen by slicing a surface of a specimen block in which a specimen is embedded in an embedding-substance. The apparatus includes: a cutter configured to slice the surface of the specimen block; a surface exposure determination unit configured to determine whether or not the area of a specimen portion on the surface of the specimen block is sufficient for the preparation of the sliced specimen; a specimen block transporting unit configured to transport the specimen block between the surface exposure determination unit and the cutter. The surface exposure determination unit includes a humidifying unit configured to humidify the surface of the specimen block; an irradiating unit configured to irradiate the surface of the specimen block with light; an imaging unit configured to receive reflected light from the humidified surface of the specimen block which is irradiated from the irradiating unit to acquire image data; an image data processing unit configured to discriminate the specimen portion on the surface of the specimen block from the embedding-substance portion based on the image data acquired by the imaging unit; and a controller configured to control the imaging unit, the irradiating unit, and the image data processing unit, and to determine whether or not the area of the specimen portion on the surface of the specimen block, the specimen portion being acquired by the image data processing unit, is sufficient for the preparation of the sliced specimen.
摘要翻译：切片试样制备装置通过将样品嵌入嵌入物质中的样品块的表面切片来制备切片试样。该装置包括：切割器，被配置为切片样品块的表面; 表面曝光判定单元，其被配置为确定样本块的表面上的样本部分的面积是否足以制备切片样本; 样本块传送单元，被配置为在所述表面曝光判定单元和所述切割器之间传送所述检体块。表面曝光判定单元包括：加湿单元，被构造成对样本块的表面进行加湿; 照射单元，被配置为用光照射所述样本块的表面; 成像单元，被配置为从所述照射单元接收从所述样本块的所述加湿表面接收的反射光，以获取图像数据; 图像数据处理单元，被配置为基于由所述成像单元获取的图像数据，将所述样本块的表面上的样本部分与所述嵌入物部分区分开; 以及控制器，被配置为控制成像单元，照射单元和图像数据处理单元，并且确定样本块的表面上的样本部分的面积，样本部分是否由图像数据获取处理单元，足以制备切片样品。

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