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    • 3. 发明专利
    • Dynamic voltage and frequency management
    • 动态电压和频率管理
    • JP2013031207A
    • 2013-02-07
    • JP2012200727
    • 2012-09-12
    • Apple Incアップル インコーポレイテッド
    • VON KAENEL VINCENT R
    • H03K19/00
    • H03K19/0008G06F1/3203G06F1/324G06F1/3296Y02D10/126Y02D10/172
    • PROBLEM TO BE SOLVED: To determine supply voltage magnitudes that ensure correct operation at the given frequency across all acceptable variations in the manufacturing process and all permissible operating temperatures.SOLUTION: An integrated circuit includes a self calibration unit configured to iterate a test on a logic circuit in the integrated circuit at respectively lower requested supply voltage magnitudes until the test fails. A lowest requested supply voltage magnitude at which the test passes is used to generate a requested supply voltage magnitude for the integrated circuit. The integrated circuit includes a series connection of logic gates physically distributed over an area of the integrated circuit, and a measurement unit configured to launch a logical transition into the series and detect a corresponding transition at the output of the series. The amount of time between the launch and the detection is used to request a supply voltage magnitude for the integrated circuit.
    • 要解决的问题:确定在制造过程中所有可接受的变化和所有允许的工作温度下确保在给定频率下正确工作的电源电压幅值。 解决方案:集成电路包括自校准单元,其被配置为在分别较低的请求电源电压幅度下对集成电路中的逻辑电路进行测试,直到测试失败为止。 测试通过的最低要求电源电压幅度用于为集成电路产生所请求的电源电压幅度。 集成电路包括物理分布在集成电路的区域上的逻辑门的串联连接,以及测量单元,被配置为将逻辑转换发射到串联中并检测在该系列的输出处的相应转变。 发射和检测之间的时间量用于请求集成电路的电源电压幅值。 版权所有(C)2013,JPO&INPIT