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    • 10. 发明授权
    • Distortion quantifier for analyzing surfaces
    • 用于分析曲面的失真量词
    • US09429421B2
    • 2016-08-30
    • US14446259
    • 2014-07-29
    • Apple Inc.
    • Patrick KesslerJason BakhshiKatherine J. SpriggsAkhil Suri
    • G06T7/00G01B11/25H04N5/225
    • G01B11/25G01B11/2513G06T7/0006G06T7/521G06T2207/10004H04N5/2256
    • This application relates to determining uniformity of a housing for a computing device based on characteristics of a reflected pattern of light incident upon the housing. The reflected pattern of light can include an array of shapes such as dots whose orientation and location can provide indications of uniformity for the housing. The array of shapes are analyzed to determine certain geometric properties such as area for each shape in the array of shapes. The geometric properties can thereafter be compared to a predetermined geometric, threshold, or tolerance value, and each shape can be assigned a rank of uniformity. Once a rank of uniformity is defined for each shape, a compilation of uniformity values can be generated and used to find portions on the housing where the housing is not uniform or flat.
    • 本申请涉及基于入射到壳体上的反射图案的特性来确定用于计算设备的外壳的均匀性。 光的反射图案可以包括诸如点阵的阵列,其方向和位置可以提供用于壳体的均匀性的指示。 分析形状阵列以确定某些几何属性,例如形状阵列中每个形状的面积。 此后可以将几何特性与预定的几何,阈值或公差值进行比较,并且每个形状可被赋予均匀的等级。 一旦为每个形状定义了均匀性等级,就可以生成均匀度值的汇编,并用于找到壳体不均匀或平坦的外壳上的部分。