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1. 发明公开

EP4156041A1 INFORMATION PROCESSING DEVICE, WORK PLAN SPECIFYING METHOD, AND WORK PLAN SPECIFYING PROGRAM 审中-公开
公开(公告)号：EP4156041A1
公开(公告)日：2023-03-29
申请号：EP20936897.6
申请日：2020-05-21
申请人： FUJITSU LIMITED
发明人： TANIGUCHI, Jun , MARUYAMA, Kazunori , SOEDA, Takeshi
IPC分类号： G06N99/00
摘要： An information processing device includes an execution unit that, by executing single-objective optimization with an evolutionary algorithm on a first objective function among a plurality of objective functions defined according to feeding orders of a plurality of objects into a work line, specifies first feeding orders in which values of the first objective function are better than an initial feeding order; by executing the single-objective optimization on a second objective function, specifies second feeding orders in which the values of the second objective function are better than the initial feeding order; and executes multi-objective optimization on the plurality of objective functions by using the first feeding orders and the second feeding orders.

2. 发明公开

EP4293580A1 ARITHMETIC PROGRAM, ARITHMETIC METHOD, AND INFORMATION PROCESSING DEVICE 审中-公开
公开(公告)号：EP4293580A1
公开(公告)日：2023-12-20
申请号：EP23158752.8
申请日：2023-02-27
申请人： FUJITSU LIMITED
发明人： MARUO, Akito , JIPPO, Hideyuki , SOEDA, Takeshi
IPC分类号： G06N3/126
摘要： An arithmetic program of searching for a combination of a plurality of explanatory variables such that an objective variable satisfies a predetermined condition by evolving a plurality of individuals each identified by the plurality of explanatory variables, the arithmetic program causing a computer to execute processing including: setting a constraint on the combination of the plurality of explanatory variables and controlling an intermediate variable that varies the explanatory variables of each of the plurality of individuals independently of the constraint; and evaluating an objective function obtained using the explanatory variables varied by the intermediate variable.

3. 发明公开

EP3637286A1 THERMAL ANALYSIS DEVICE, THERMAL ANALYSIS METHOD, AND THERMAL ANALYSIS PROGRAM 审中-公开
公开(公告)号：EP3637286A1
公开(公告)日：2020-04-15
申请号：EP17912529.9
申请日：2017-06-09
申请人： Fujitsu Limited
发明人： TANIGUCHI, Jun , SOEDA, Takeshi
IPC分类号： G06F17/50
摘要： To shorten time required for thermal analysis, an estimation model generation and output unit refers to a contact determination model DB that stores a contact determination model obtained from a design asset in the past, estimates whether or not a component pair included in a target product has contact with each other, and generates an estimation model table (S20). Furthermore, a division number determination unit refers to a division method DB that stores a relationship between parameters (Sr and Tr) regarding thermal transfer of two components and the division number of a thermal network model and determines the division number of a thermal network model of the component pair included in the target product (S28). Then, a thermal network model analysis unit constructs the thermal network model of the target product by using the contact determination table that is the corrected estimation model table and the division number determined by the division number determination unit and performs thermal analysis (S30).

4. 发明公开

EP3699708A1 PRODUCTION FACILITY MONITORING DEVICE, PRODUCTION FACILITY MONITORING METHOD, AND PRODUCTION FACILITY MONITORING PROGRAM 审中-公开
公开(公告)号：EP3699708A1
公开(公告)日：2020-08-26
申请号：EP17929217.2
申请日：2017-10-16
申请人： Fujitsu Limited
发明人： MARUYAMA, Kazunori , SOEDA, Takeshi
IPC分类号： G05B23/02
摘要： In order to determine an abnormal degree of a production facility on the basis of log data, a learning unit 44 learns the classification rule that classifies whether the production facility is normal or abnormal from a text feature amount on the basis of the text feature amount (for example, first main component and second main component) obtained from a number of texts included in a plurality of pieces of log data obtained in a predetermined process of the production facility and production history information of the production facility, an extraction unit 46 extracts a text feature amount of the log data to be monitored obtained in the predetermined process of the production facility, and a determination unit 48 determines whether the production facility is normal or abnormal when the log data to be monitored is obtained on the basis of the extracted text feature amount and a classification rule.

5. 发明公开

EP4345695A1 FLOW GENERATION PROGRAM, FLOW GENERATION METHOD, AND INFORMATION PROCESSING DEVICE 审中-公开
公开(公告)号：EP4345695A1
公开(公告)日：2024-04-03
申请号：EP23174766.8
申请日：2023-05-23
申请人： FUJITSU LIMITED
发明人： MARUO, Akito , JIPPO, Hideyuki , SOEDA, Takeshi
IPC分类号： G06N3/126
摘要： A flow generation program that causes at least one computer to execute a process, the process includes based on first metadata that corresponds to a first problem of processing flow generation, selecting a processing flow that corresponds to a second problem with second metadata with a certain similarity level with respect to the first metadata by referring to a memory that stores a plurality pieces of metadata and a plurality of processing flows that correspond to each of a plurality of problems, the plurality of problems including the first problem and the second problem; and specifying a tree structure of the process flow that corresponds to the first problem based on genetic programming that uses the selected processing flow as an initial individual.

6. 发明公开

EP3637118A1 SOFT ERROR INSPECTION METHOD, SOFT ERROR INSPECTION DEVICE, AND SOFT ERROR INSPECTION SYSTEM 审中-公开
公开(公告)号：EP3637118A1
公开(公告)日：2020-04-15
申请号：EP17912622.2
申请日：2017-06-05
申请人： Fujitsu Limited
发明人： SOEDA, Takeshi
IPC分类号： G01R31/30 , G01R31/26
摘要： The above problem is solved by a soft error inspection method for a semiconductor device, the soft error inspection method including: irradiating and scanning a semiconductor device with a laser beam or an electron beam; and measuring and storing a time of bit inversion for each of areas irradiated with the laser beam or the electron beam of the semiconductor device.

7. 发明公开

EP4174472A1 MATERIAL EVALUATION DEVICE, MATERIAL EVALUATION METHOD, AND MATERIAL EVALUATION PROGRAM 审中-公开
公开(公告)号：EP4174472A1
公开(公告)日：2023-05-03
申请号：EP20942188.2
申请日：2020-06-25
申请人： FUJITSU LIMITED
发明人： SOEDA, Takeshi
IPC分类号： G01N3/32
摘要： To efficiently acquire physical property values of materials.
In a storage unit (10) of a material evaluation device 1, N (N is an integer equal to or greater than 2) hysteresis curves (40) each indicating a change in a physical quantity (Q) of each time with respect to a change in a physical quantity (P) of N times at a certain coordinate (a) of a material (30) is stored. For example, the physical quantity (P) is temperature, and the physical quantity (Q) is a deformation amount. A processing unit (20) refers to the storage unit (10), scans each of the N hysteresis curves at the coordinate (a) with a value of the predetermined physical quantity (Q) to extract a point, one-dimensionally arrays the extracted points to generate one-dimensional information (41) regarding the physical quantity (Q), and calculates the physical property values of the material (30) using the one-dimensional information (41). For example, a time when a mutation point occurs is obtained from the pieces of one-dimensional information (41) corresponding to N times, and linear and nonlinear physical property values of the material (30) are calculated based on transition of the physical quantity (Q) between the time at or before the mutation point and the time at or after the mutation point.

8. 发明公开

EP4123459A1 INFORMATION PROCESSING DEVICE, SEARCH METHOD, AND SEARCH PROGRAM 审中-公开
公开(公告)号：EP4123459A1
公开(公告)日：2023-01-25
申请号：EP20925764.1
申请日：2020-03-18
申请人： FUJITSU LIMITED
发明人： MARUYAMA, Kazunori , YAMAZAKI, Takashi , SOEDA, Takeshi
IPC分类号： G06F11/22
摘要： An information processing apparatus generates, in a case where a plurality of products is manufactured by using a plurality of parts classified into a plurality of part types, an initial order in which the plurality of parts is arranged in order on the basis of part quality, for each of the plurality of part types. The information processing apparatus sets a predetermined range in which a part whose order is undetermined within the initial order is at a head, generates a plurality of states in which the order of the plurality of parts within the predetermined range is different from each other, allocates, for each state, the plurality of parts included in the predetermined range to the plurality of products for each of the plurality of part types in order from the head of the predetermined range, calculates, for each state, product quality of each of the plurality of products to which the plurality of parts is allocated, and repeats order search that determines the order of at least a part of the parts in the predetermined range on the basis of the product quality calculated for each state, while changing a position of the predetermined range in the initial order each time the order within the predetermined range is determined.

9. 发明公开

EP4027271A1 INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM 审中-公开
公开(公告)号：EP4027271A1
公开(公告)日：2022-07-13
申请号：EP21199102.1
申请日：2021-09-27
申请人： FUJITSU LIMITED
发明人： MARUO, Akito , SOEDA, Takeshi
IPC分类号： G06N3/12
摘要： An information processing method for causing a computer to perform multi-objective optimization, the information processing method includes: obtaining, by a multi-objective optimization method, a Pareto solution set from a model generated based on data for each of a plurality of objective functions regarding the multi-objective optimization; and updating the model by using a Pareto solution from among the obtained Pareto solution set, the Pareto solution being a solution that has a relatively large variance of values of the objective function in the model.

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