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    • 4. 发明申请
    • Probe Microscope
    • 探头显微镜
    • US20100306886A1
    • 2010-12-02
    • US12789796
    • 2010-05-28
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • G01Q30/00
    • G01Q60/44G01Q60/02
    • An object of the present invention is to provide a probe microscope that permits qualitative and quantitative evaluation on ions existing near the surface of a sample and permits to detect further simply and easily such as impurities, flaws and corrosion origins existing on the sample in high sensitivity. A probe microscope according to the present invention is provided with a test cell that holds a sample and permits to receive liquid, a probe, a counter electrode, a reference electrode, a drive mechanism that causes the probe to follow the surface of the sample as well as to scan the same, a potential control portion that controls a potential between the probe and the reference electrode and a current measuring portion that measures a current flowing between the probe and the counter electrode, and is characterized in that the material of the probe is constituted by a conductive body containing any of gold or gold alloy, carbon or carbon compound, boron, zinc, lead, tin and mercury.
    • 本发明的目的是提供一种探针显微镜,其允许对存在于样品表面附近的离子进行定性和定量评估,并且允许以高灵敏度进一步简单且容易地检测样品中存在的杂质,缺陷和腐蚀起源。 。 根据本发明的探针显微镜设置有容纳样品并允许接收液体,探针,对电极,参比电极,使探针跟随样品表面的驱动机构的测试电池, 以及扫描相同的电位控制部分,其控制探针和参考电极之间的电势;以及电流测量部分,其测量在探针和对电极之间流动的电流,其特征在于探针的材料 由含有金或金合金,碳或碳化合物,硼,锌,铅,锡和汞的导电体构成。