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1. 发明申请

US20130139950A1 ROTATIONAL MISALIGNMENT MEASURING DEVICE OF BONDED SUBSTRATE, ROTATIONAL MISALIGNMENT MEASURING METHOD OF BONDED SUBSTRATE, AND METHOD OF MANUFACTURING BONDED SUBSTRATE 有权
标题翻译：粘结基板的旋转误差测量装置，结合基板的旋转缺陷测量方法和制造粘结基板的方法
公开(公告)号：US20130139950A1
公开(公告)日：2013-06-06
申请号：US13691491
申请日：2012-11-30
申请人： Masato KANNAKA , Masakazu Kajita , Eiji Takahashi , Yuji Yamamoto , Masaru Akamatsu , Kunio Iba , Kenji Imanishi
发明人： Masato KANNAKA , Masakazu Kajita , Eiji Takahashi , Yuji Yamamoto , Masaru Akamatsu , Kunio Iba , Kenji Imanishi
IPC分类号： G01B11/27
CPC分类号： G01B11/272
摘要： A rotational misalignment between semiconductor wafers constituting a bonded wafer is calculated. A light source is arranged at a position which is on a front side of an opening of a notch and which is separated from an outer edge portion of a bonded wafer by a predetermined interval, and outputs light to irradiate the outer edge portion of the bonded wafer including the notch. A camera receives and photoelectrically converts reflected light that is specularly-reflected by the outer edge portion of the bonded wafer including the notch among the light outputted by the light source in order to output a brightness distribution of the reflected light as an image. A computer analyzes positions of notches from the image outputted by the camera to obtain a notch position misalignment, and further calculates a rotational misalignment between semiconductor wafers using a center position misalignment between the semiconductor wafers.
摘要翻译：计算构成接合晶片的半导体晶片之间的旋转未对准。光源布置在位于凹口的开口的前侧上并且与键合晶片的外边缘部分隔开预定间隔的位置处，并输出光以照射粘合的晶片的外边缘部分晶圆包括凹口。照相机接收并光电转换由光源输出的光中包括凹口的键合晶片的外边缘部分被镜面反射的反射光，以输出作为图像的反射光的亮度分布。计算机分析由相机输出的图像的凹口的位置以获得切口位置未对准，并且还使用半导体晶片之间的中心位置未对准来计算半导体晶片之间的旋转未对准。

2. 发明授权

US5095368A Defect-collecting image input apparatus with image sensor 失效
标题翻译：图像传感器缺陷收集图像输入装置
公开(公告)号：US5095368A
公开(公告)日：1992-03-10
申请号：US702431
申请日：1991-05-16
申请人： Tadashi Miyakawa , Kunio Iba
发明人： Tadashi Miyakawa , Kunio Iba
IPC分类号： H04N1/19 , G06T1/00 , G06T5/00 , H04N1/40 , H04N1/409
CPC分类号： H04N5/3692 , H04N5/367
摘要： According to the present invention, the image input apparatus is adapted to sample the image signal read by the linear image sensor by means of the sampling means in order to output image data. The object of the present invention is accomplished by a provision of image input apparatus comprising a memory provided with positional data previously stored therein of defective elements of the image sensor corresponding to respective picture elements of a linear image sensor and a sampling control means for preventing, when the difference value between the adjacent pictures of an image signal is less than the predetermined one, a sampling means from carrying out sampling at the present picture element corresponding to said defective element of the image sensor in accordance with said memory and outputting image data of the sampling signal of the adjacent previous picture element, and for allowing sampling, when said difference value is more than the predetermined value, at the present picture element according to said defective element of the image sensor in compliance with said memory and outputting the image data of the sampling signal of the adjacent present picture elements as they are.

3. 发明授权

US4690553A Road surface condition detection system 失效
标题翻译：路面状况检测系统
公开(公告)号：US4690553A
公开(公告)日：1987-09-01
申请号：US158901
申请日：1980-06-12
申请人： Hiroshi Fukamizu , Masaji Nakano , Kunio Iba , Taro Yamasaki , Kenji Sano
发明人： Hiroshi Fukamizu , Masaji Nakano , Kunio Iba , Taro Yamasaki , Kenji Sano
IPC分类号： G01N21/27 , G01N21/17 , G01N21/35 , G01W1/14 , G08B19/02 , G08G1/09 , G09F7/00 , G01N21/47 , G01N21/55
CPC分类号： G01W1/14 , G06K9/00785 , G09F27/005 , G09F2007/005
摘要： Road surface condition detection system comprising light projector means for projecting light including the infrared region of the spectrum to a road surface to sense the condition thereof, the infrared having wavelengths at which the reflectance of snow is smaller than that of the road surface in a dry condition, light receiving means for receiving light reflected from the road surface, comparisons means for comparing the output signals generated from the light receiving means with reference signal levels corresponding to dry, wet, snowy and frozen conditions, and judging means for judging the road surface to be one of the conditions in accordance with results of comparison.
摘要翻译：路面状况检测系统，其包括用于将包括所述光谱的红外区域的光投射到路面以感测其状况的光投射装置，所述红外线具有在干燥时的雪的反射率小于路面的反射率的波长条件，用于接收从路面反射的光的光接收装置，用于将从光接收装置产生的输出信号与对应于干，湿，雪和冷冻条件的参考信号电平进行比较的比较装置，以及用于判断路面的判断装置根据比较结果作为条件之一。

4. 发明授权

US5081414A Method for measuring lifetime of semiconductor material and apparatus therefor 失效
标题翻译：半导体材料寿命测定方法及其设备
公开(公告)号：US5081414A
公开(公告)日：1992-01-14
申请号：US475768
申请日：1990-02-05
申请人： Tateo Kusama , Kunio Iba
发明人： Tateo Kusama , Kunio Iba
IPC分类号： G01R31/265
CPC分类号： G01R31/2656
摘要： A method and apparatus measure the lifetime of a semiconductor material by directing microwave energy into the semiconductor material and by producing carriers within the semiconductor material by impinging light thereon. A non-metal material is interposed between the semiconductor material and a metallic surface, such that a portion of the microwave energy travels through the semiconductor material and the non-metal material and reflects off of the metallic surface and back through the non-metal material and the semiconductor material. Additionally, a heating member is provided for heating the semiconductor material, whereby the lifetime of the semiconductor material is determined according to characteristics of the reflected microwave energy and the temperature of the semiconductor material.
摘要翻译：一种方法和装置通过将微波能量引入半导体材料中并通过在半导体材料内照射其上的光来制造载流子来测量半导体材料的寿命。非金属材料插入在半导体材料和金属表面之间，使得微波能量的一部分穿过半导体材料和非金属材料并从金属表面反射并穿过非金属材料和半导体材料。此外，为了加热半导体材料而设置加热构件，由此根据反射的微波能量的特性和半导体材料的温度来确定半导体材料的寿命。

5. 发明授权

US4974098A Original table for reading images 失效
标题翻译：用于阅读图像的原始表格
公开(公告)号：US4974098A
公开(公告)日：1990-11-27
申请号：US236961
申请日：1988-08-26
申请人： Tadashi Miyakawa , Masahiro Inoda , Kunio Iba
发明人： Tadashi Miyakawa , Masahiro Inoda , Kunio Iba
IPC分类号： H04N1/407
CPC分类号： H04N1/4076
摘要： According to this invention, since black regions are provided along the advancing direction on an original plate, the dark-time output levels of the linear sensor would not be affected by dust adhered on the original plate or the presence of trimming lines. Since a calibration region is provided, the circuit system can be calibrated with the maximum and minimum values of the signals from the linear sensor to thereby achieve more precise reading of images.
摘要翻译：根据本发明，由于在原版上沿着前进方向设置黑色区域，因此线性传感器的黑暗时间输出水平将不受附着在原版上的灰尘或修剪线的存在的影响。由于提供了校准区域，所以可以利用来自线性传感器的信号的最大值和最小值校准电路系统，从而实现图像的更精确的读取。

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