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1. 发明公开

CN105445227A 一种观测一维纳米材料的方法及装置有权
公开(公告)号：CN105445227A
公开(公告)日：2016-03-30
申请号：CN201410434514.8
申请日：2014-08-29
申请人：清华大学 , 鸿富锦精密工业(深圳)有限公司
发明人：武文贇 , 岳菁颖 , 林晓阳 , 赵清宇 , 姜开利 , 范守善
IPC分类号： G01N21/47 , G01N21/63
CPC分类号： G01N21/65 , B82B3/009 , G01N21/6458 , G01N2021/4792 , G02B21/33 , H01J2201/30469
摘要：本发明涉及一种原位观测一维纳米材料的方法，包括以下步骤：S1提供一待测一维纳米材料；S2将所述一维纳米材料浸没于耦合液中；S3提供一束具有连续光谱的白色入射光，所述一维纳米材料在该入射光的照射下发生共振瑞利散射；S4利用物镜为水镜的光学显微镜观测该一维纳米材料，观测时该水镜浸没于所述耦合液中。本发明还涉及一种利用该方法观测一维纳米材料的装置。

2. 发明公开

CN108020572A 碳纳米管的表征方法有权
公开(公告)号：CN108020572A
公开(公告)日：2018-05-11
申请号：CN201610933463.2
申请日：2016-10-31
申请人：清华大学 , 鸿富锦精密工业(深圳)有限公司
发明人：李东琦 , 魏洋 , 姜开利 , 范守善
IPC分类号： G01N23/22
CPC分类号： H01L21/02606 , B82B3/0071 , B82B3/009 , C01B2202/08 , G01N23/2251 , H01L51/0048 , Y10S977/742 , Y10S977/852 , Y10S977/881
摘要：一种碳纳米管表征方法，其包括以下步骤：提供一导电基底，该导电基底上设置一层绝缘层；在所述绝缘层上设置一碳纳米管结构；将碳纳米管结构放置在扫描电镜下，调整扫描电镜的加速电压为5～20千伏，驻留时间为6～20微秒，放大倍数为1万～10万倍，采用扫描电镜对所述碳纳米管结构拍摄照片；获得碳纳米管结构的照片，碳纳米管结构中的碳纳米管分布在照片衬底上。

3. 发明公开

CN105565264A 量子点封装体及其应用无效
公开(公告)号：CN105565264A
公开(公告)日：2016-05-11
申请号：CN201510867531.5
申请日：2015-12-01
申请人：苏州星烁纳米科技有限公司
发明人：王允军 , 席玉坤
IPC分类号： B82B1/00 , B82B3/00 , B82Y30/00 , B82Y40/00 , G02F1/13357 , H01L33/56
CPC分类号： B82B1/00 , B82B3/009 , B82Y30/00 , B82Y40/00 , G02F1/1336 , G02F1/133602 , H01L33/56
摘要：一种量子点封装体，所述量子点封装体包括光学透明的第一封装介质和分散在所述第一封装介质中的至少两个量子点玻璃体，所述量子点玻璃体包括位于外层的玻璃、位于内层的光学透明的第二封装介质以及分散在所述第二封装介质中的至少一种量子点，所述第一封装介质由高分子材料组成。通过将封装体量子点封装在一定体积的玻璃体内，避免了玻璃管易碎的缺点，同时保持了较高的发光效率。本发明还揭示了一种发光装置、背光模组和显示装置。本发明还揭示了一种量子点封装体的制备方法。

4. 发明申请

US20180118564A1 METHOD FOR DISTINGUISHING CARBON NANOTUBES 有权
公开(公告)号：US20180118564A1
公开(公告)日：2018-05-03
申请号：US15662221
申请日：2017-07-27
申请人： Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
发明人： DONG-QI LI , YANG WEI , KAI-LI JIANG , SHOU-SHAN FAN
IPC分类号： B82B3/00 , H01L51/00 , G01N23/04
CPC分类号： B82B3/009 , G01N23/04 , H01L51/0031 , H01L51/0048
摘要： A method for distinguishing carbon nanotubes comprising: providing a conductive substrate and applying an insulating layer on the conductive substrate; forming a carbon nanotube structure on a surface of the insulating layer, the carbon nanotube structure includes at least one carbon nanotube; placing the carbon nanotube structure under a scanning electron microscope, adjusting the scanning electron microscope with an accelerating voltage ranging from 5˜20 KV, a dwelling time ranging 6˜20 microseconds and a magnification ranging from 10000˜100000 times; taking photos of the carbon nanotube structure with the scanning electron microscope; and, obtaining a photo of the carbon nanotube structure, the photo shows the at least one carbon nanotube and a background.

5. 发明申请

US20160061718A1 METHOD AND DEVICE FOR CHIRALITY ASSIGNMENT OF CARBON NANOTUBE 审中-公开
标题翻译：碳纳米管的精细分配方法和装置
公开(公告)号：US20160061718A1
公开(公告)日：2016-03-03
申请号：US14838385
申请日：2015-08-28
申请人： TSINGHUA UNIVERSITY , HON HAI PRECISION INDUSTRY CO., LTD.
发明人： WEN-YUN WU , JING-YING YUE , XIAO-YANG LIN , QING-YU ZHAO , KAI-LI JIANG , SHOU-SHAN FAN
IPC分类号： G01N21/27 , G01N21/65 , G01N21/49
CPC分类号： G01N21/65 , B82B3/009 , G01J3/44 , G01N21/21 , G01N21/6458 , G01N2021/4792 , G02B21/33 , H01J2201/30469
摘要： A method for assigning chirality of carbon nanotube is provided. Firstly, carbon nanotube sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the carbon nanotube sample is immersed in the liquid. Thirdly, the carbon nanotube sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the carbon nanotube sample. Fifthly, spectra of the carbon nanotube sample are measured to obtain chirality of the carbon nanotube sample.
摘要翻译：提供了一种用于分配碳纳米管的手性的方法。首先，提供碳纳米管样品，具有液浸物镜和液体的光学显微镜。其次，将碳纳米管样品浸入液体中。第三，碳纳米管样品被入射光束照射以产生共振瑞利散射。最后，将液浸物浸入液体中，得到碳纳米管样品的共振瑞利散射（RRS）图像。第五，测量碳纳米管样品的光谱以获得碳纳米管样品的手性。

6. 发明授权

US07235421B2 System and method for developing production nano-material 失效
标题翻译：开发生产纳米材料的系统和方法
公开(公告)号：US07235421B2
公开(公告)日：2007-06-26
申请号：US10944481
申请日：2004-09-16
申请人： Nasreen G. Chopra
发明人： Nasreen G. Chopra
IPC分类号： H01I51/40
CPC分类号： B82B3/009 , B82Y40/00 , H01L23/373 , H01L2924/0002 , H01L2924/00
摘要： A method for developing a manufacturing process includes measuring, in a first testing environment, a primary property of a nano-engineered material at one or more positions to provide one or more measurements. The method also includes determining whether the one or more measurements satisfy a first tolerance criterion and taking a further action based on whether the one or more measurements satisfy the first tolerance criterion. Additionally, a method of measuring thermal properties of a nano-engineered material includes irradiating a nano-engineered material with laser radiation, wherein the laser radiation impinges on a first surface of the nano-engineered material at one ore more locations, capturing at least one image of the nano-engineered material, and analyzing the at least one image to characterize the thermal properties of the nano-engineered material.
摘要翻译：用于开发制造工艺的方法包括在第一测试环境中测量纳米工程材料在一个或多个位置的主要性质以提供一个或多个测量。所述方法还包括确定所述一个或多个测量是否满足第一公差标准，并且基于所述一个或多个测量是否满足所述第一公差标准来采取进一步的动作。另外，测量纳米工程材料的热性质的方法包括用激光辐射照射纳米工程材料，其中激光辐射在一个或多个位置处撞击纳米工程材料的第一表面，捕获至少一个纳米工程材料的图像，以及分析至少一个图像以表征纳米工程材料的热性质。

7. 发明授权

US10020191B2 Method for characterizing carbon nanotubes by using scanning electron microscope 有权
公开(公告)号：US10020191B2
公开(公告)日：2018-07-10
申请号：US15661061
申请日：2017-07-27
申请人： Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
发明人： Dong-Qi Li , Yang Wei , Kai-Li Jiang , Shou-Shan Fan
IPC分类号： H01L21/02 , B82B3/00 , G01N23/2251 , H01L51/00
CPC分类号： H01L21/02606 , B82B3/0071 , B82B3/009 , C01B2202/08 , G01N23/2251 , H01L51/0048 , Y10S977/742 , Y10S977/852 , Y10S977/881
摘要： A method for characterizing carbon nanotubes comprising: providing a conductive substrate and applying an insulating layer on the conductive substrate; forming a carbon nanotube structure on a surface of the insulating layer, the carbon nanotube structure includes at least one carbon nanotube; placing the carbon nanotube structure under a scanning electron microscope, adjusting the scanning electron microscope with an accelerating voltage ranging from 5˜20 KV, a dwelling time ranging 6˜20 microseconds and a magnification ranging from 10000˜100000 times; taking photos of the carbon nanotube structure with the scanning electron microscope; and, obtaining a photo of the carbon nanotube structure, the photo shows the at least one carbon nanotube and a background.

8. 发明申请

US20160061734A1 METHOD AND DEVICE FOR IMAGING 1-D NANOMATERIALS 审中-公开
标题翻译：用于成像1-D纳米材料的方法和装置
公开(公告)号：US20160061734A1
公开(公告)日：2016-03-03
申请号：US14838386
申请日：2015-08-28
申请人： Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
发明人： WEN-YUN WU , JING-YING YUE , XIAO-YANG LIN , QING-YU ZHAO , KAI-LI JIANG , SHOU-SHAN FAN
IPC分类号： G01N21/65 , G01N21/64
CPC分类号： G01N21/65 , B82B3/009 , G01N21/6458 , G01N2021/4792 , G02B21/33 , H01J2201/30469
摘要： A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.
摘要翻译：提供了一维纳米材料成像方法。首先，提供一维纳米材料样品，具有液浸物镜和液体的光学显微镜。其次，将一维纳米材料样品浸入液体中。第三，一维纳米材料样品被入射光束照射以产生共振瑞利散射。将液浸物浸入液体中，得到一维纳米材料样品的共振瑞利散射（RRS）图像。第五，测量一维纳米材料样品的光谱，以获得一维纳米材料样品的手性。

9. 发明申请

US20160090296A1 ENCAPSULATION STRUCTURE PROVIDED WITH A CAP AND A SUBSTRATE TO CONNECT AT LEAST ONE NANO-OBJECT ONTO A FACE OF THE SUBSTRATE AND TO RESUME CONTACT THROUGH THE CAP AND METHOD OF MANUFACTURING THE STRUCTURE 有权
标题翻译：提供一个盖子的基本结构和一个基底将至少一个纳米对象连接到基板的表面上，并通过盖子恢复接触和制造结构的方法
公开(公告)号：US20160090296A1
公开(公告)日：2016-03-31
申请号：US14857047
申请日：2015-09-17
申请人： Commissariat a L'Energie Atomique et aux Energies Alternatives
发明人： Xavier BAILLIN
IPC分类号： B81B7/00 , B81C1/00
CPC分类号： B81B7/007 , B81B2207/095 , B81C1/00269 , B82B3/009 , H01L23/481 , H01L2924/0002 , H01L2924/161 , H01L2924/00
摘要： This structure, that is applicable particularly to manufacturing of > type systems comprises a substrate (74) with opposite first and second faces, a cap (80) with opposite first and second faces, the first face of the cap being fixed to the first face of the substrate, at least one cavity (86) defined between the cap and the substrate, at least one nano-object (72) in the cavity, and first doped zones (88, 90) that are formed in the substrate, on the first face of the substrate, the nano-object being electrically connected to the first doped zones. According to the invention, the structure also comprises second doped zones (92, 96) that are formed in the cap, on the first face of the cap and that are at least partially in direct contact with the first doped zones, and means of making contact (96, 98) between the first and the second face of the cap and that open up on the second doped zones.
摘要翻译：适用于“超越CMOS”系统的这种结构包括：具有相对的第一和第二面的衬底（74），具有相对的第一和第二面的帽（80），帽的第一面是固定到基板的第一面上，限定在盖和基板之间的至少一个空腔（86），空腔中的至少一个纳米物体（72）和形成在第一掺杂区（88,90）中的至少一个纳米物体衬底，在衬底的第一面上，纳米对象电连接到第一掺杂区。根据本发明，该结构还包括第二掺杂区（92,96），其形成在盖中，在盖的第一面上，并且至少部分地与第一掺杂区直接接触，以及制造方法在盖的第一和第二面之间的接触（96,98），并且在第二掺杂区上打开。

10. 发明申请

US20050090024A1 System and method for developing production nano-material 失效
标题翻译：开发生产纳米材料的系统和方法
公开(公告)号：US20050090024A1
公开(公告)日：2005-04-28
申请号：US10944481
申请日：2004-09-16
申请人： Nasreen Chopra
发明人： Nasreen Chopra
IPC分类号： H01L21/66
CPC分类号： B82B3/009 , B82Y40/00 , H01L23/373 , H01L2924/0002 , H01L2924/00
摘要： A method for developing a manufacturing process includes measuring, in a first testing environment, a primary property of a nano-engineered material at one or more positions to provide one or more measurements. The method also includes determining whether the one or more measurements satisfy a first tolerance criterion and taking a further action based on whether the one or more measurements satisfy the first tolerance criterion. Additionally, a method of measuring thermal properties of a nano-engineered material includes irradiating a nano-engineered material with laser radiation, wherein the laser radiation impinges on a first surface of the nano-engineered material at one ore more locations, capturing at least one image of the nano-engineered material, and analyzing the at least one image to characterize the thermal properties of the nano-engineered material.
摘要翻译：用于开发制造工艺的方法包括在第一测试环境中测量纳米工程材料在一个或多个位置的主要性质以提供一个或多个测量。所述方法还包括确定所述一个或多个测量是否满足第一公差标准，并且基于所述一个或多个测量是否满足所述第一公差标准来采取进一步的动作。另外，测量纳米工程材料的热性质的方法包括用激光辐射照射纳米工程材料，其中激光辐射在一个或多个位置处撞击纳米工程材料的第一表面，捕获至少一个纳米工程材料的图像，以及分析至少一个图像以表征纳米工程材料的热性质。

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