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    • 3. 发明授权
    • Small diameter diffuse reflectance probe
    • 小直径漫反射探头
    • US06563992B1
    • 2003-05-13
    • US09347479
    • 1999-07-02
    • Walter M. Doyle
    • Walter M. Doyle
    • G02B604
    • G01J3/02G01J3/0218G01N21/4738G01N21/474G01N2021/475G02B6/262G02B6/2848G02B6/3818
    • The invention relates to a fiber-optic coupled diffuse reflectance probe that is adapted to detachably connect to a bifurcated fiber bundle. The probe includes a solid light guide for separating the bundle from the target within a small-diameter probe body. A probe of this construction is especially useful for analyzing high temperature and high pressure targets, through relatively small fittings, as is required in polymer extrusion applications. The solid light guide may extend along all or along a lesser portion of the probe body's length. Its fiber-end may be coupled directly to the illumination and detector fibers or indirectly, and at some distance from the fibers, by way of a lens or a hollow light guide. Its target-end may be exposed to terminate in a direct face-to-face relationship with the target, or it may be located behind an intermediate window. The solid light guide is characterized by a target-end refracting surface that minimizes stray light. In particular, such surface is designed to ensure that light internally reflected from that surface with bounce back to the detector fiber at angles that are outside of the detector fiber's field of view. The preferred surface is a beveled plane, but other flat and nonflat surfaces are possible. The target-end refracting surface also tends to ensure that reflections from the window surfaces, if present, are returned to the detector fiber at angles outside of its field of view. The window itself may be canted too to help ensure that rays which are unusually divergent due to imperfections are still returned to the the detector fiber at angles outside of its field of view.
    • 本发明涉及一种适于可分离地连接到分叉纤维束的光纤耦合漫反射探头。 探针包括用于在小直径探针体内将束与靶分离的固体光导。 这种结构的探针通过相对较小的配件,如聚合物挤出应用中所需要的,用于分析高温和高压目标特别有用。 固体光导可以沿着探头主体的长度的全部或沿着较小部分延伸。 其光纤端可以直接耦合到照明和检测器光纤,或者通过透镜或中空光引导件间接地,并且与纤维在一定距离处。 其目标端可能暴露于与目标的直接面对面关系终止,或者它可能位于中间窗后。 固体光导的特征在于使杂散光最小化的目标端折射表面。 特别地,这种表面设计成确保从该表面内部反射的光以检测器光纤的视场外的角度反射回检测器光纤。 优选的表面是斜面,但是其他平坦和非平坦表面也是可能的。 目标端折射表面也倾向于确保来自窗表面的反射(如果存在)在其视场外的角度返回到检测器光纤。 窗口本身也可以是倾斜的,以帮助确保由于缺陷而异常发散的射线仍然以其视野外的角度返回到检测器光纤。
    • 4. 发明公开
    • SCATTERED LIGHT MEASUREMENT DEVICE
    • LENS测量装置
    • EP2896347A1
    • 2015-07-22
    • EP13836526.7
    • 2013-09-09
    • Olympus Corporation
    • ITO, Ryosuke
    • A61B1/00G01N21/17G01N21/27
    • G01N21/474A61B1/00167A61B1/042A61B1/07A61B5/0059G01N2021/4745G01N2021/475
    • Included are: an optical measurement apparatus (1) including a light source (10) that emits light including at least light of measurement target wavelength, an optical detector (12) that detects, via a branching unit, light received by a scattered light measurement probe (101), a branching unit (11) that guides the light from the light source (10) to the scattered light measurement probe (101) and guides the light from the scattered light measurement probe (101) to the optical detector (12), and a control unit (13) that evaluates scattering characteristics of a surface layer of an object to be examined based on the light detected by the optical detector (12), and the scattered light measurement probe (101) including a fiber (102) that connects to the optical measurement apparatus (1) at one end thereof, propagates the light from the light source to irradiate the object to be examined, comes in contact with the object to be examined at another end thereof, receives light that has irradiated the object to be examined, propagated inside the object to be examined, and returned thereto, and guides the light to the optical detector (12) as an optical signal, the fiber (102) including a core (1020) that propagates light and has an approximately-rod-shaped core having a diameter determined according to the scattering characteristics of the object to be examined.
    • 6. 发明申请
    • Modification of the normalized difference method for real-time optical tomography
    • 用于实时光学层析成像的归一化差分法的修改
    • US20040010397A1
    • 2004-01-15
    • US10408511
    • 2003-04-07
    • Randall L. BarbourYaling Pei
    • G06F015/00
    • G06T11/006A61B5/0073A61B5/0091A61B5/4312G01N21/359G01N21/4795G01N21/49G01N2021/1787G01N2021/475G01N2201/0826G01N2201/0833
    • Computation-saving techniques and stability-adding techniques provide for fast, accurate reconstructions of a time series of images involving large-scale 3D problems, such as real-time image recovery in an optical tomography imaging system. A system equation for a target medium (116) such as tissue is solved using a Normalized Difference Method (NDM) (250). Because of the inherent stability of the NDM solutions, a weight matrix (W) of the system equation can be provided for a given point in a time series (220), then reused without recalculation at subsequent points. Further savings are achieved by decomposing W using singular value decomposition or direct matrix decomposition, transforming it to reduce its dimensions, and/or scaling it to achieve a more stable numerical solution. Values of measured energy (112) emerging from the target medium are back-substituted into the system equation for the different points to obtain the target medium properties.
    • 计算节省技术和稳定性增加技术提供了涉及大规模3D问题的时间序列图像的快速,精确重建,例如光学层析成像系统中的实时图像恢复。 使用归一化差分法(NDM)(250)解决诸如组织的目标介质(116)的系统方程式。 由于NDM解决方案的固有稳定性,可以为时间序列(220)中的给定点提供系统方程的权重矩阵(W),然后在后续点重新计算。 通过使用奇异值分解或直接矩阵分解来分解W来实现进一步的节省,将其变换以减小其尺寸,和/或缩放以实现更稳定的数值解。 从目标介质出现的测量能量(112)的值被替代为不同点的系统方程,以获得目标介质特性。
    • 8. 发明授权
    • System for performing spectral analyses under computer control
    • US3751643A
    • 1973-08-07
    • US3751643D
    • 1972-05-23
    • IBM
    • DILL FKONNERTH K
    • G01B11/06G06F17/00G01B9/02G01B19/08
    • G01B11/0633G01N21/55G01N21/8422G01N2021/475G01N2021/551G01N2201/0826G01N2201/0833
    • Measurements of physical attributes such as dielectric film thickness that are susceptible to spectral analysis are accomplished rapidly and accurately by a spectrophotometric system in which a programmed digital computer operating concurrently with the optical scanning means automatically performs the calibrating, normalizing and data reducing functions that otherwise must be carried out as time-consuming human, mechanical or analog electronic operations. The control over the optical data handling operations exercised by the computer eliminates the need for mechanically or electronically adjusting the optical apparatus to meet changing system conditions, whether periodic or aperiodic. Source light is transmitted through a rotating variable-wavelength interference filter which acts during one-half of its cycle to transmit light of varying wavelength through a fiber-optic reference path directly to the optical data acquisition apparatus, while acting in the next half-cycle to transmit light of such varying wavelength indirectly to said data acquisition apparatus through a measurement path. In the present example, where film thickness is the attribute being measured, the measurement path comprises a bifurcated fiber-optic bundle, one branch of which is used to carry the light of variable wavelength to the sample, and the other branch of which carries light reflected from the sample to the aforesaid data acquisition apparatus. A computer program enables light passed through the reference path in one half-cyle to calibrate the system for measuring optical transmission or reflectance in the next half-cycle. Reduction of relative reflectance data to absolute reflectance data (needed for the accurate determination of film thickness) is accomplished by additional computer programs whose algorithms are based upon the discovery that all graphs of absolute reflectance versus wavelength for film samples of a given material having different thicknesses are bounded by a common pair of wave envelopes.
    • 9. 发明授权
    • Scattered light measurement apparatus
    • 分散光测量装置
    • US09329124B2
    • 2016-05-03
    • US14638167
    • 2015-03-04
    • OLYMPUS CORPORATION
    • Ryosuke Ito
    • G01N21/55G01N21/47A61B1/00A61B1/04A61B1/07
    • G01N21/474A61B1/00167A61B1/042A61B1/07A61B5/0059G01N2021/4745G01N2021/475
    • A scattered light measurement apparatus includes an optical measurement apparatus, and a scattered light measurement probe configured to irradiate an object with light from the optical measurement apparatus, configured to receive light from the object, and configured to output the received light to the optical measurement apparatus. The optical measurement apparatus includes: a light source configured to emit light including at least light of a measurement target wavelength; first and second optical detectors configured to detect the light received by the scattered light measurement probe; a branching unit configured to guide the light from the light source to the scattered light measurement probe and guide the light from the scattered light measurement probe to the first and second optical detectors; and a control unit configured to evaluate scattering characteristics of a surface layer of the object based on the light detected by the first and second optical detectors.
    • 散射光测量装置包括光学测量装置和被配置为从物体照射来自光学测量装置的光的散射光测量探头,被配置为将所接收的光输出到光学测量装置 。 光学测量装置包括:光源,被配置为发射至少包括测量目标波长的光的光; 第一和第二光学检测器,被配置为检测由散射光测量探针接收的光; 分支单元,被配置为将来自光源的光引导到散射光测量探针,并将来自散射光测量探针的光引导到第一和第二光学检测器; 以及控制单元,其被配置为基于由所述第一和第二光学检测器检测到的光来评估所述物体的表面层的散射特性。