专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

CN105555007B 一种同源双能加速器及加速器治疗装置有权
公开(公告)号：CN105555007B
公开(公告)日：2019-06-18
申请号：CN201610128068.7
申请日：2016-03-07
申请人：苏州雷泰医疗科技有限公司
发明人：姚毅
IPC分类号： H05H5/03 , H05H5/02 , A61N5/00
CPC分类号： H05H5/03 , A61N5/00 , A61N5/1037 , A61N5/1049 , A61N5/1077 , A61N2005/1054 , A61N2005/1095 , H05H9/044 , H05H9/048 , H05H2007/002 , H05H2277/11
摘要：本发明公开了一种同源双能加速器及包含该同源加速器的治疗装置，包括：电子发射装置和加速装置，所述电子发射装置位于加速装置的输入端，其产生的电子经加速装置加速后从加速装置的输出端射出，所述同源双能加速器还包括至少一个分离偏转装置，设置于加速装置的输出端一侧，用于使经过加速装置加速后的电子中的部分电子运动轨迹发生改变。本发明的优点是，发明人发现电子经加速装置加速后，所有电子的速度及能量并不完全相同，发明人利用这一发现，使用分离偏转装置，设置于加速装置的输出端一侧，将经过加速装置加速后的粒子中的部分能量等级较低的电子运动轨迹强制改变，将同源电子束中不同能级的电子进行分离，从而获得两种能级的电子束，其中高能电子束继续原有路径，用于放射治疗，而另一路低能电子束则用于跟踪病灶，及检测治疗效果。

2. 发明公开

CN108718478A 一种大气环境下使用的加速管审中-实审转让
公开(公告)号：CN108718478A
公开(公告)日：2018-10-30
申请号：CN201810833015.4
申请日：2018-07-26
申请人：中广核达胜加速器技术有限公司
发明人：陆洁平 , 严中保 , 朱焕铮 , 许森飞
IPC分类号： H05H5/03
CPC分类号： H05H5/03
摘要：本发明公开了一种大气环境下使用的加速管，包括一上法兰、一下法兰、设置在所述上法兰和所述下法兰之间依次叠加的若干波纹瓷环和若干电极片，所述波纹瓷环侧部具有波纹结构能够有效增加所述波纹瓷环表面的爬电距离，使得加速管能够在大气环境中耐受更高的电压，相邻所述电极片之间连接一均压电阻串，每个所述波纹瓷环侧部设置一放电保护球隙，能够防止电压冲击，所述波纹瓷环和所述电极片之间采用金属陶瓷焊接工艺连接。

3. 发明公开

CN105609901A 移相器和加速器及其操作方法有权
公开(公告)号：CN105609901A
公开(公告)日：2016-05-25
申请号：CN201510996025.6
申请日：2015-12-25
申请人：清华大学 , 同方威视技术股份有限公司
发明人：康克军 , 施嘉儒 , 王平 , 唐传祥 , 陈怀璧 , 刘耀红 , 阎忻水 , 黄文会
IPC分类号： H01P1/18 , H05H7/00
CPC分类号： H01P1/182 , H01P1/067 , H01P5/02 , H01P5/082 , H05H5/03 , H05H5/06 , H05H7/00
摘要：本发明涉及一种移相器以及加速器及其操作方法，所述移相器包括具有第一中空结构的转动部(1)，所述第一中空结构具有第一空腔(11)，所述第一空腔(11)的横截面与所述转动部(1)的旋转中心之间的距离在周向上呈周期性连续变化，以便当所述转动部(1)转动时,使得在所述移相器的出口处的相邻的微波脉冲之间具有一个相移。该操作方法包括向所述移相器中发射微波脉冲；驱动所述转动部(1)以转速n旋转，其中n＝15vm转/分钟，m为奇数，1，3，5…，v为微波脉冲的重复频率，当每次发射微波脉冲时，转动部的第一空腔的椭圆形横截面的长轴转动至水平或者竖直状态。

4. 发明公开

CN105555007A 一种同源双能加速器及加速器治疗装置有权
公开(公告)号：CN105555007A
公开(公告)日：2016-05-04
申请号：CN201610128068.7
申请日：2016-03-07
申请人：苏州雷泰医疗科技有限公司
发明人：姚毅
IPC分类号： H05H5/03 , H05H5/02 , A61N5/00
CPC分类号： H05H5/03 , A61N5/00 , A61N5/1037 , A61N5/1049 , A61N5/1077 , A61N2005/1054 , A61N2005/1095 , H05H9/044 , H05H9/048 , H05H2007/002 , H05H2277/11 , H05H5/02
摘要：本发明公开了一种同源双能加速器及包含该同源加速器的治疗装置，包括：电子发射装置和加速装置，所述电子发射装置位于加速装置的输入端，其产生的电子经加速装置加速后从加速装置的输出端射出，所述同源双能加速器还包括至少一个分离偏转装置，设置于加速装置的输出端一侧，用于使经过加速装置加速后的电子中的部分电子运动轨迹发生改变。本发明的优点是，发明人发现电子经加速装置加速后，所有电子的速度及能量并不完全相同，发明人利用这一发现，使用分离偏转装置，设置于加速装置的输出端一侧，将经过加速装置加速后的粒子中的部分能量等级较低的电子运动轨迹强制改变，将同源电子束中不同能级的电子进行分离，从而获得两种能级的电子束，其中高能电子束继续原有路径，用于放射治疗，而另一路低能电子束则用于跟踪病灶，及检测治疗效果。

5. 发明授权

US09750122B1 Compact particle accelerator 有权
公开(公告)号：US09750122B1
公开(公告)日：2017-08-29
申请号：US14465698
申请日：2014-08-21
申请人： National Technology & Engineering Solutions of Sandia, LLC
发明人： Juan M. Elizondo-Decanini
IPC分类号： H05H5/03 , H05H5/06 , H05H5/02
CPC分类号： H05H5/03 , H05H5/02 , H05H5/045 , H05H5/06 , H05H9/005 , H05H2277/10
摘要： A compact particle accelerator having an input portion configured to receive power to produce particles for acceleration, where the input portion includes a switch, is provided. In a general embodiment, a vacuum tube receives particles produced from the input portion at a first end, and a plurality of wafer stacks are positioned serially along the vacuum tube. Each of the plurality of wafer stacks include a dielectric and metal-oxide pair, wherein each of the plurality of wafer stacks further accelerate the particles in the vacuum tube. A beam shaper coupled to a second end of the vacuum tube shapes the particles accelerated by the plurality of wafer stacks into a beam and an output portion outputs the beam.

6. 发明申请

US20160302297A1 SHORT PULSE NEUTRON GENERATOR 审中-公开
标题翻译：短脉冲中子发生器
公开(公告)号：US20160302297A1
公开(公告)日：2016-10-13
申请号：US15190035
申请日：2016-06-22
申请人： Sandia Corporation
发明人： Juan M. Elizondo-Decanini
IPC分类号： H05H3/06 , H05H5/04 , H05H5/03
CPC分类号： H05H3/06 , H05H1/12 , H05H5/03 , H05H5/047
摘要： Short pulse neutron generators are described herein. In a general embodiment, the short pulse neutron generator includes a Blumlein structure. The Blumlein structure includes a first conductive plate, a second conductive plate, a third conductive plate, at least one of an inductor or a resistor, a switch, and a dielectric material. The first conductive plate is positioned relative to the second conductive plate such that a gap separates these plates. A vacuum chamber is positioned in the gap, and an ion source is positioned to emit ions in the vacuum chamber. The third conductive plate is electrically grounded, and the switch is operable to electrically connect and disconnect the second conductive plate and the third conductive plate. The at least one of the resistor or the inductor is coupled to the first conductive plate and the second conductive plate.
摘要翻译：本文描述了短脉冲中子发生器。在一般实施例中，短脉冲中子发生器包括Blumlein结构。 Blumlein结构包括第一导电板，第二导电板，第三导电板，电感器或电阻器中的至少一个，开关和电介质材料。第一导电板相对于第二导电板定位，使得间隙分离这些板。真空室位于间隙中，离子源被定位成在真空室中发射离子。第三导电板电接地，并且开关可操作以电连接和断开第二导电板和第三导电板。电阻器或电感器中的至少一个耦合到第一导电板和第二导电板。

7. 发明申请

US20190198282A1 DRAWER-TYPE CARRYING DEVICE FOR ACCELERATOR AND CABIN STRUCTURE FOR ACCELERATOR 审中-公开
公开(公告)号：US20190198282A1
公开(公告)日：2019-06-27
申请号：US16231667
申请日：2018-12-24
申请人： Nuctech Company Limited
发明人： Yaohong LIU , Liang ZHANG , Xiaotong ZHANG
IPC分类号： H01J33/02 , H05H5/03
CPC分类号： H01J33/02 , H01J2229/8626 , H05H5/03
摘要： The present disclosure provides a drawer-type carrying device for an accelerator and an cabin structure for the accelerator, the drawer-type carrying device for the accelerator includes a frame mechanism and a drawing mechanism. The frame mechanism is used for installing the accelerator; the drawing mechanism is connected with the frame mechanism and the frame mechanism is movable relative to the drawing mechanism. The cabin structure for the accelerator includes a cabin, a shielding mechanism and a drawer-type carrying device for the accelerator. The cabin has a working area and a maintenance area. The shielding mechanism is disposed in the working area and has a side opening door facing towards the maintenance area. The frame mechanism is capable of drawn from the shielding mechanism into the maintenance area when the side opening door is opened.

8. 发明申请

US20170167851A1 SYSTEM FOR MEASURING DISPLACEMENT OF ACCELERATING TUBE IN HIGH-VACUUM CHAMBER BY USING MICRO-ALIGNMENT TELESCOPE AND METHOD THEREOF 审中-公开
公开(公告)号：US20170167851A1
公开(公告)日：2017-06-15
申请号：US15160871
申请日：2016-05-20
申请人： INSTITUTE FOR BASIC SCIENCE
发明人： Min-Ki LEE , Young-Kwon KIM , Yong-Woo JO , Jong-Wan CHOI , Woo-Kang KIM , Hee-Tae KIM
IPC分类号： G01B11/02 , G01B11/00 , H05H5/03
CPC分类号： G01B11/028 , G01B11/002 , G01B11/27 , G01B11/272 , H05H5/03 , H05H7/00 , H05H2007/008
摘要： A system for measuring displacement of an accelerating tube by using a micro-alignment telescope, which includes a vacuum chamber; a hollow accelerating tube in the vacuum chamber; a sighting target attached to a surface of the accelerating tube while protruding from the surface of the accelerating tube; the micro-alignment telescope spaced apart from one side surface of the vacuum chamber; a first lens device interposed between the micro-alignment telescope and the vacuum chamber; and a second lens device spaced apart from an opposite side surface of the vacuum chamber by a distance, wherein the vacuum chamber includes first and second viewports placed on the surfaces of the vacuum chamber in correspondence with each other, and the micro-alignment telescope, the first lens device, the first viewport, the sighting target, the second viewport and the second lens device are aligned on a same axis in one direction.

9. 发明申请

US20170032930A1 METHODS, SYSTEMS AND APPARATUS FOR ACCELERATING LARGE PARTICLE BEAM CURRENTS 审中-公开
标题翻译：用于加速大颗粒束流的方法，系统和装置
公开(公告)号：US20170032930A1
公开(公告)日：2017-02-02
申请号：US14967648
申请日：2015-12-14
申请人： ISO Evolutions, LLC
发明人： Matthew Fox Fritz
IPC分类号： H01J37/317 , H05H5/03
CPC分类号： H01J37/3171 , H01J2237/0473 , H01J2237/08 , H01J2237/31701 , H05H5/03 , H05H5/04 , H05H5/06
摘要： Systems and methods for accelerating large particle beam currents in an electrostatic particle accelerator are provided. A system may include a process ion source that is configured to emit ions, a particle accelerator and a target. The particle accelerator may include multiple conductive electrodes that are serially arranged to define a particle path between the process ion source and the target and multiple accelerator tubes arranged to further define the particle path between the process ion source, ones of the conductive electrodes and the target.
摘要翻译：提供了用于在静电颗粒加速器中加速大粒子束电流的系统和方法。系统可以包括被配置为发射离子，粒子加速器和靶的过程离子源。颗粒加速器可以包括多个导电电极，其被串联地布置以限定处理离子源和靶之间的粒子路径，并且多个加速器管被布置成进一步限定处理离子源，导电电极中的一个和目标物之间的粒子路径。

10. 发明公开

EP3176809A4 ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCELERATION DEVICE 审中-公开
公开(公告)号：EP3176809A4
公开(公告)日：2018-07-04
申请号：EP15827523
申请日：2015-07-29
申请人： HOSAKA TAKASHI
发明人： HOSAKA TAKASHI
IPC分类号： H01J49/00 , H01J49/32 , H01J49/38 , H01J49/42 , H05H5/03 , H05H7/04 , H05H7/22 , H05H9/00 , H05H13/04
CPC分类号： H01J49/06 , G01N27/62 , H01J49/0018 , H01J49/20 , H01J49/22 , H01J49/326 , H01J49/38 , H01J49/4205 , H01J49/4215 , H05H5/03 , H05H7/04 , H05H7/22 , H05H9/00 , H05H13/04
摘要： The objective of the present invention is to manufacture an acceleration device and a mass analysis device inexpensively and with a compact size, enabling them to be used by any person. The mass analysis device (300) is configured from a plurality of substrates, including a first main substrate (301), a first upper substrate (302) adhered to the upper surface of the first main substrate (301), and a first lower substrate (303) adhered to the lower surface of the first main substrate (301). A mass analysis chamber (308) is a passage formed in the first main substrate (301) and running from the upper surface of the first main substrate (301) to the lower surface of the first main substrate (301), and enclosed in the direction perpendicular to the substrate surfaces (the Z direction) by the upper substrate (302) and the lower substrate (303), enclosed on both sides in the direction (the direction X) which is orthogonal to the Z direction and is the direction of advance of charged particles (318) by first main substrate side plates (301-4, 301-5), and enclosed on both side surfaces in the direction (the Y direction) orthogonal to the Z direction and the X direction by the first main substrate (301). A center hole (310-4) is opened in the first main substrate side plate (301-4) to which the charged particles (318) are incident, and the charged particles (318) enter the mass analysis chamber (308) from the center hole (310-4) formed in the first main substrate side plate (301-4).

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式