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1. 发明授权

US06828769B2 Cartridge system for a probing head for an electrical test probe 失效
标题翻译：用于电气测试探头探头的墨盒系统
公开(公告)号：US06828769B2
公开(公告)日：2004-12-07
申请号：US10607791
申请日：2003-06-27
申请人： Julie A. Campbell , Stephen Mark Sekel , Stanley Joseph Sula
发明人： Julie A. Campbell , Stephen Mark Sekel , Stanley Joseph Sula
IPC分类号： G01R3102
CPC分类号： G01R1/06788 , G01R1/06711 , H01R11/18 , H01R13/26
摘要： A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip. In one preferred embodiment the probing tip cartridge further includes at least one foot.
摘要翻译：盒式系统包括具有放置在其中的电子设备的主探测头体。此外，盒系统包括具有探测尖端的探测尖端盒。当探测尖端盒与主探测头主体处于配对关系时，最小感应电接触机构将电子装置电耦合到探测尖端。这些类型可以是例如尖端，插座尖端或抓取器尖端。在一个优选实施例中，探测尖端盒还包括至少一个脚。

2. 发明授权

US06828767B2 Hand-held voltage detection probe 有权
标题翻译：手持电压检测探头
公开(公告)号：US06828767B2
公开(公告)日：2004-12-07
申请号：US10101578
申请日：2002-03-20
申请人： Phillip Norris Douglas
发明人： Phillip Norris Douglas
IPC分类号： G01R3102
CPC分类号： G01R1/06788 , G01R19/155
摘要： A switchless, hand-held probe and method for detecting and alerting a user to the presence of an AC voltage on a conductor that minimizes the intermittent activation of the probe's indicator due to static charge build-up. The probe comprises an antenna, an indicator, detector circuitry and activation circuitry. The probe alerts a user through the use of an indicator to the presence of electrical energy on a conductor. The antenna senses the electrical energy radiated from the conductor. When the electrical energy sensed by the antenna satisfies a particular measurement threshold, a signal is generated by the detector circuitry and received by the activation circuitry. The activation circuitry activates the indicator after a sufficient number of signals are received from the detector circuitry during a given period of time.
摘要翻译：用于检测和警告用户在导体上存在AC电压的无开关手持探针和方法，其最小化由于静电电荷积聚导致的探针指示器的间歇激活。探头包括天线，指示器，检测器电路和激活电路。探头通过使用指示器告知用户导体上存在电能。天线感测从导体辐射的电能。当天线感测到的电能满足特定的测量阈值时，信号由检测器电路产生并由激活电路接收。在给定的时间段内从检测器电路接收足够数量的信号之后，激活电路激活指示符。

3. 发明授权

US06825680B1 Automated semiconductor probing device 失效
标题翻译：自动半导体探测装置
公开(公告)号：US06825680B1
公开(公告)日：2004-11-30
申请号：US09885362
申请日：2001-06-20
申请人： Yakov Kogan , Parviz Tayebati , Daryoosh Vakhshoori
发明人： Yakov Kogan , Parviz Tayebati , Daryoosh Vakhshoori
IPC分类号： G01R3102
CPC分类号： G01R31/2887
摘要： Apparatus and methods are provided for automated semiconductor device probing. The apparatus includes a probe assembly; a machine vision system; and a semiconductor support fixture. A method includes providing apparatus for automated semiconductor device probing; locating the semiconductor device positioned on the semiconductor support fixture with the machine vision system; guiding the movement of at least one of the probe assembly and the semiconductor support fixture so as to position a contact portion of the semiconductor device and the electrical probe in alignment with one another; and moving at least one of the probe assembly and the semiconductor support fixture toward the other of the at least one of the probe assembly and the semiconductor support fixture so as to position the electrical probe and the contact portion of the semiconductor device in electrical connection with one another.
摘要翻译：提供了用于自动半导体器件探测的装置和方法。该装置包括探针组件; 机器视觉系统; 和半导体支架。一种方法包括提供用于自动半导体器件探测的装置; 利用机器视觉系统定位位于半导体支架上的半导体器件; 引导所述探针组件和所述半导体支撑固定装置中的至少一个的移动，以使所述半导体器件和所述电探针的接触部分彼此对齐; 以及将所述探针组件和所述半导体支撑固定件中的至少一个移动到所述探针组件和所述半导体支撑固定装置中的所述至少一个探针组件和所述半导体支撑固定装置中的另一个，以便将所述电探针和所述半导体器件的接触部分另一个。

4. 发明授权

US06825558B2 Carrier module for &mgr;-BGA type device 失效
标题翻译：载体模块用于mu-BGA型设备
公开(公告)号：US06825558B2
公开(公告)日：2004-11-30
申请号：US10372852
申请日：2003-02-26
申请人： Sang Jae Yun
发明人： Sang Jae Yun
IPC分类号： G01R3102
CPC分类号： G01R1/0483 , Y10S206/815
摘要： The present invention relates to a carrier module for micro-BGA (&mgr;-BGA) type device which is capable of testing a produced device without damaging to a solder ball thereunder after being rapidly connected to a test socket. A carrier module for a &mgr;-BGA type device according to the present invention comprises: an upper and lower carrier module body formed with protrusions at the upper and lower portions thereof; a device receiving unit inserted to the upper carrier module body for receiving a &mgr;-BGA type device; and a spring secured elastically to the upper and lower protrusions by being inserted thereto.
摘要翻译：本发明涉及一种用于微型BGA（mu-BGA）型装置的载体模块，其能够在快速连接到测试插座之后测试所产生的装置而不损坏其下的焊球。根据本发明的用于mu-BGA型装置的载体模块包括：上和下载体模块体，其在其上部和下部形成有突起; 一个装置接收单元，被插入到上部载体模块主体中，用于接收一个mu-BGA型装置; 以及通过插入其中而弹性地固定到上突起和下突起的弹簧。

5. 发明授权

US06822467B2 Low-current pogo probe card 失效
公开(公告)号：US06822467B2
公开(公告)日：2004-11-23
申请号：US10313746
申请日：2002-12-06
申请人： Paul A. Tervo , Clarence E. Cowan
发明人： Paul A. Tervo , Clarence E. Cowan
IPC分类号： G01R3102
CPC分类号： G01R1/07342 , G01R1/067 , G01R1/06711 , G01R1/06733 , G01R1/06772
摘要： A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between two dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing needles or needles included therein terminate below the opening in a pattern suitable for probing a test subject workpiece. A plurality of pogo pin receiving pad sets, each including a guard pad, occupy the periphery of the board. Each guard pad is electrically connected to a trace from the layer of conductive traces. The pad sets may be connected to the probing devices by low noise cables or traces. Air trenches separate the pad sets for reducing cross talk and signal settling times.

6. 发明授权

US06822438B2 Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer 失效
标题翻译：使用网络分析仪测量电气元件上的I / O引脚的寄生电容和电感的装置
公开(公告)号：US06822438B2
公开(公告)日：2004-11-23
申请号：US10366918
申请日：2003-02-13
申请人： Mark T. Van Horn , Richard N. Hedden , David R. Cuthbert , Aaron M. Schoenfeld
发明人： Mark T. Van Horn , Richard N. Hedden , David R. Cuthbert , Aaron M. Schoenfeld
IPC分类号： G01R3102
CPC分类号： G01R31/04 , G01R1/0408 , G01R1/06772 , G01R27/2617 , G01R31/2896 , H01L24/73 , H01L2224/32013 , H01L2224/32225 , H01L2224/32245 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48253 , H01L2224/4847 , H01L2224/73265 , H01L2924/01087 , H01L2924/14 , H01L2924/15311 , H01L2924/181 , H01L2924/30107 , H01L2924/3011 , H01L2924/00012 , H01L2924/00 , H01L2924/00014
摘要： Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.
摘要翻译：提供了装置和方法，用于使用网络分析仪结合同轴测试探针来测量任何类型或配置的集成电路封装中的互耦合的可能性。简单，低成本的测试夹具和测试方法可用于测量集成电路封装的一个或多个I / O引线的寄生电容和电感，所测量的寄生电容和电感提供了集成电路的易感性指示电路封装以在封装的电引线之间或电引线和集成电路封装的其它部件之间相互耦合。

7. 发明授权

US06819128B2 Latch locking mechanism of a KGD carrier 失效
标题翻译： KGD载体的锁定锁定机构
公开(公告)号：US06819128B2
公开(公告)日：2004-11-16
申请号：US10290204
申请日：2002-11-08
申请人： Minoru Hisaishi , Noriyuki Matsuoka
发明人： Minoru Hisaishi , Noriyuki Matsuoka
IPC分类号： G01R3102
CPC分类号： G01R1/0466
摘要： A latch locking mechanism of a KGD carrier includes a carrier retaining member having a cover and a chip retaining member, a carrier base assembly having a carrier main body, a substrate, and a carrier base, at least two opposite latches rotationally movably provided on the cover of the carrier retaining member and each including an operation portion and a locking portion which generally form an L shape, and engaging portions provided on the carrier main body of the carrier base assembly to engage with the corresponding locking portions of the latches. When the locking portions of the two opposite latches are closed, the locking portions engage with the corresponding engaging portions provided on the carrier main body to lock the carrier retaining member and the carrier base assembly.
摘要翻译： KGD载体的闩锁锁定机构包括具有盖和片保持构件的载体保持构件，具有载体主体，基底和载体基底的载体基座组件，至少两个相对的闩锁，其可旋转地移动地设置在并且每个都包括一个操作部分和一般形成L形的锁定部分，以及设置在托架基座组件的托架主体上的接合部分，用于与闩锁的对应锁定部分啮合。当两个相对的闩锁的锁定部分闭合时，锁定部分与设置在托架主体上的相应的接合部分接合以锁定托架保持部件和托架基座组件。

8. 发明授权

US06815966B1 System for burn-in testing of electronic devices 有权
标题翻译：电子设备老化测试系统
公开(公告)号：US06815966B1
公开(公告)日：2004-11-09
申请号：US10184525
申请日：2002-06-27
申请人： Bradley R. Gunn , Alberto J. Calderon , Jovan Jovanovic , David S. Hendrickson
发明人： Bradley R. Gunn , Alberto J. Calderon , Jovan Jovanovic , David S. Hendrickson
IPC分类号： G01R3102
CPC分类号： G06F11/24 , G01R31/2863 , G01R31/31905
摘要： A system is provided which allows for burn-in testing of electronic devices wherein power current is provided individually to each one of the electronic devices. The system also includes various connectors, cables, and other configurations that allow for power currents having large magnitudes to be provided to the electronic devices.
摘要翻译：提供一种系统，其允许电子设备的老化测试，其中电力电流分别提供给每个电子设备。该系统还包括允许向电子设备提供具有大幅度的功率电流的各种连接器，电缆和其他配置。

9. 发明授权

US06812721B1 PC mainboard test fixture background of the invention 失效
标题翻译： PC主板测试夹具本发明背景
公开(公告)号：US06812721B1
公开(公告)日：2004-11-02
申请号：US10661595
申请日：2003-09-15
申请人： Chao-Wang Cha
发明人： Chao-Wang Cha
IPC分类号： G01R3102
CPC分类号： G01R31/2808
摘要： The present invention is to provide a PC mainboard test fixture for an operator by moving a hanging pedestal installed in the test fixture down toward a connecting port of the mainboard until a positioning board thereof presses on the connecting port and stops on the connecting port, and then the pressure from the hanging pedestal makes the connecting pins of an extension connector installed thereof pass through the positioning holes of the positioning board and reach the connecting port accurately, enabling an accompanied circuit board thereof to be properly connected with the mainboard for testing.
摘要翻译：本发明是通过将安装在测试夹具中的悬挂基座向主板的连接端移动，直到其定位板压在连接端口上并停止在连接端口上为操作者提供PC主板测试夹具，以及那么来自悬挂基座的压力使安装的延伸连接器的连接销通过定位板的定位孔并准确地到达连接端口，使其伴随的电路板与主板正确连接以进行测试。

10. 发明授权

US06809535B2 Notched electrical test probe tip 失效
标题翻译：缺口电测试头
公开(公告)号：US06809535B2
公开(公告)日：2004-10-26
申请号：US10364017
申请日：2003-02-10
申请人： Julie A. Campbell
发明人： Julie A. Campbell
IPC分类号： G01R3102
CPC分类号： G01R1/06738 , G01R1/06788 , Y10T29/49204 , Y10T29/49222
摘要： An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects preferably is a probing tip with a longitudinal planar axis and two planar contact surfaces. The contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating.
摘要翻译：优选地，能够建立电气连接以测试电路板上的物体，特别是圆形或不规则形状的测试物体的电测试探针尖端是具有纵向平面轴和两个平面接触表面的探测尖端。当从探测尖端的任一侧观察时，接触表面从纵向平面轴线基本上形成倒置的“V”。当从前部和后部观察时，探测尖端具有限定在其中的凹口。可选地，优选实施例可以具有外部绝缘涂层。

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