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11. 发明授权

US12070329B2 Optical measurement method, optical measurement apparatus, and non-transitory computer readable medium 有权
公开(公告)号：US12070329B2
公开(公告)日：2024-08-27
申请号：US17801852
申请日：2020-03-19
申请人： NEC Corporation
发明人： Takeshi Akagawa
IPC分类号： A61B5/00 , G01B9/02091 , G06T11/60
CPC分类号： A61B5/4887 , A61B5/0066 , A61B5/441 , G01B9/02091 , G06T11/60 , A61B5/742
摘要： An object of the present disclosure is to provide an optical measurement method, an optical measurement apparatus, and a non-transitory computer readable medium capable of specifying the position of a pore. The optical measurement method includes first, second, and third steps. In the first step (ST11), first 3D tomographic image data is acquired from a skin by using optical coherence tomography. In the second step (ST12), a line shown in a second planar image (B2) at a second depth is removed from a first planar image (B1) at a first depth, the second depth being deeper than the first depth. In the third step (ST13), a position of a pore is specified from the first planar image (B1) from which the line has been removed.

12. 发明公开

US20240281955A1 METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE 审中-公开
公开(公告)号：US20240281955A1
公开(公告)日：2024-08-22
申请号：US18651957
申请日：2024-05-01
申请人： UNITY SEMICONDUCTOR
发明人： Wolfgang Alexander IFF , Alain COURTEVILLE
IPC分类号： G06T7/00 , B81C99/00 , G01B11/22 , G06T7/521 , G06T7/60
CPC分类号： G06T7/0004 , B81C99/003 , G01B11/22 , G06T7/521 , G06T7/60 , G06T2207/30148
摘要： A method for characterizing structures etched in a substrate, such as a wafer is disclosed. A bottom of the structure is embedded in the substrate, the substrate having a top side in which the structures are etched and a bottom side opposite to the top side. The method includes the following steps: illuminating the bottom of at least one structure with an illumination beam issued from a light source emitting light with a wavelength adapted to be transmitted through the substrate, acquiring, with an imaging device positioned on the bottom side of said substrate, at least one image of a bottom of the at least one structure through the substrate, and measuring at least one data, called lateral data, relating to a lateral dimension of the bottom of the at least one HAR structure from the at least one acquired image. A system implementing such a method is also disclosed.

13. 发明公开

US20240280611A1 MAGNETIC SENSOR DEVICE 审中-公开
公开(公告)号：US20240280611A1
公开(公告)日：2024-08-22
申请号：US18582196
申请日：2024-02-20
申请人： TDK Corporation
发明人： Kazuma Yamawaki
IPC分类号： G01R15/20 , G01B7/30 , G01R19/00 , G03B13/36 , H04N23/68
CPC分类号： G01R15/207 , G01B7/30 , G01R19/0092 , G03B13/36 , H04N23/6812 , H04N23/687
摘要： A magnetic sensor device with stable output characteristics is provided, which includes: a supporting substrate that has a first face; a magnetic detection element; a protective film, which is a layered film that is disposed on the first face side and that has a first layer of which a primary component is alumina and a second layer of which a primary component is silica; and a wiring layer that is disposed on the first face side and is situated at a position farther from the supporting substrate than the layered film, and moreover extends along the first face. The magnetic detection element is disposed inside the layered film.

14. 发明公开

US20240280407A1 Multi-Application Optical Sensing Apparatus and Method Thereof 审中-公开
公开(公告)号：US20240280407A1
公开(公告)日：2024-08-22
申请号：US18652501
申请日：2024-05-01
申请人： Artilux, Inc.
发明人： Chih-Wei Yeh , Hung-Chih Chang , Yun-Chung Na , Tsung-Ting Wu , Shu-Lu Chen
IPC分类号： G01J3/50 , G01B11/24 , G01J3/02 , G01J3/51
CPC分类号： G01J3/50 , G01B11/24 , G01J3/0208 , G01J3/51
摘要： Systems, apparatuses, and methods for multi-application optical sensing are provided. For example, an optical sensing apparatus can include a photodetector array, a first circuitry, and a second circuitry. The photodetector array includes a plurality of photodetectors, wherein a first subset of the plurality of photodetectors are configured as a first region for detecting a first optical signal, and a second subset of the plurality of photodetectors are configured as a second region for detecting a second optical signal. The first circuitry, coupled to the first region, is configured to perform a first function based on the first optical signal to output a first output result. The second circuitry, coupled to the second region, is configured to perform a second function based on the second optical signal to output a second output result.

15. 发明公开

US20240280359A1 CALIBRATION METHOD AND MEASUREMENT SYSTEM 审中-公开
公开(公告)号：US20240280359A1
公开(公告)日：2024-08-22
申请号：US18435289
申请日：2024-02-07
申请人： MITUTOYO CORPORATION
发明人： Yuji KUDO
IPC分类号： G01B11/26
CPC分类号： G01B11/26
摘要： A calibration method including: an imaging step of capturing a part of the calibration jig with a first imaging part and a second imaging part; a first identifying step of identifying first coordinate positions of a part of the calibration jig on the basis of a capturing result of the first imaging part; a second identifying step of identifying second coordinate positions of a part of the calibration jig on the basis of a capturing result of the second imaging part; a rotating step of rotating the calibration jig; a repeating step of repeating the imaging step, the first identification step, the second identification step, and the rotating step; and identifying a rotation matrix for rotating the first coordinate positions or the second coordinate positions to perform a coordinate transformation and a translation vector for translating the first coordinate positions or the second coordinate positions.

16. 发明公开

US20240280013A1 PIPE DRIFTING IN WELLS 审中-公开
公开(公告)号：US20240280013A1
公开(公告)日：2024-08-22
申请号：US18171947
申请日：2023-02-21
申请人： Saudi Arabian Oil Company
发明人： Abdullrohman Khaled Alarfaj , Ali Al-Shaikh , Mohammad Abdullah Alkhateeb
IPC分类号： E21B47/08 , G01B5/12
CPC分类号： E21B47/08 , G01B5/12
摘要： A drift bar is lowered into a well. The drift bar has a density that is less than a density of a wellbore fluid residing in the well. A tubular is lowered into the well below a surface level of the wellbore fluid residing in the well. The tubular defines an inner bore having an inner diameter that is greater than an outer diameter of the drift bar. The drift bar is positioned to pass through the inner bore of the tubular as the tubular is lowered into the well. After the tubular is positioned below the surface level, an absence or presence of the drift bar floating at the surface level is detected. An absence or presence of a restriction in the inner bore of the tubular is determined in response to detecting the presence or absence, respectively, of the drift bar floating at the surface level.

17. 发明授权

US12069432B2 Optical microphone substrate 有权
公开(公告)号：US12069432B2
公开(公告)日：2024-08-20
申请号：US17775699
申请日：2020-11-11
申请人： SENSIBEL AS
发明人： Håkon Sagberg , Jakob Vennerød
IPC分类号： H04R23/00 , G01B11/14 , G01D5/26
CPC分类号： H04R23/008 , G01B11/14 , G01D5/266
摘要： An optical microphone assembly including a substrate, an interferometric arrangement, a light source, and at least one photo detector. The interferometric arrangement includes a membrane and at least one diffractive optical element spaced from the membrane. The diffractive optical element(s) include a plurality of lines formed in or disposed on a surface of the substrate and arranged in a first pattern. The substrate includes one or more holes extending fully therethrough, the hole(s) arranged in a second pattern that is different from the first pattern. The light source is arranged to provide light to the interferometric arrangement such that first and second portions of the light propagate along respective, different first and second optical paths via the interferometric arrangement. An optical path difference between the first and second optical paths depends on a distance between the membrane and the diffractive optical element(s). The hole(s) are positioned such that at least one of the first and second optical paths at least partly overlaps with the hole(s). The photo detector(s) are arranged to detect at least part of an interference pattern generated by said first and second portions of light dependent on the optical path difference.

18. 发明授权

US12067739B2 Method for 3D scanning of a real object 有权
公开(公告)号：US12067739B2
公开(公告)日：2024-08-20
申请号：US17377014
申请日：2021-07-15
申请人： DASSAULT SYSTEMES
发明人： Fivos Doganis , Ariane Jourdan
IPC分类号： G06T7/55 , G01B11/25 , G06T7/73 , G06T15/06
CPC分类号： G06T7/55 , G01B11/2518 , G06T7/73 , G06T15/06 , G06T2207/10028
摘要： A computer-implemented method for 3D scanning of a real object with a camera having a 3D position including receiving, from the camera, an image of the real object, displaying on a screen, in an augmented reality view, the image of the real object enclosed within a virtual 3D box and, superimposed to the real object, a virtual structure made of a set of planar tiles, and being anchored to the virtual 3D box, each tile corresponding to a predetermined pose of the camera, detecting that a tile is pointed at with the camera; acquiring, from the camera, a frame of the virtual 3D box, thereby validating said tile, said frame being a projection of the virtual 3D box on the image, iterating for different 3D positions of the camera, until a sufficient number of tiles is validated for scanning the real object, and implementing a 3D reconstruction algorithm with all captured frames.

19. 发明授权

US12066808B2 Parametric and modal work-holding method for automated inspection 有权
公开(公告)号：US12066808B2
公开(公告)日：2024-08-20
申请号：US17535104
申请日：2021-11-24
申请人： Hexagon Metrology, Inc.
发明人： Jonathan J. O'Hare , Jonathan Dove
IPC分类号： G05B19/401 , G01B21/04
CPC分类号： G05B19/401 , G01B21/047 , G05B2219/37193 , G05B2219/50391
摘要： A system for inspecting each workpiece of a plurality of non-identical workpieces includes a controller in control communication with the instruments of the system, and a ruleset corresponding to one or more such non-identical workpieces, the system reconfiguring the inspection instruments to customize part tending operations for each such non-identical workpiece. A method for inspecting each workpiece of a plurality of non-identical workpiece includes providing a controller in control communication with the instruments of the system, and a ruleset corresponding to each such non-identical workpiece, the controller causing reconfiguration of the inspection instruments to customize part tending operations for each such non-identical workpiece.

20. 发明授权

US12066519B2 Adaptive doppler radar systems and methods 有权
公开(公告)号：US12066519B2
公开(公告)日：2024-08-20
申请号：US17025864
申请日：2020-09-18
申请人： FLIR Belgium BVBA
发明人： Richard Jales , Stephen D. Tostevin , Jean-Luc Kersulec
IPC分类号： G01S13/58 , G01B21/22 , G01S7/04 , G01S7/40 , G01S13/89 , G01S19/01
CPC分类号： G01S13/581 , G01B21/22 , G01S7/04 , G01S7/40 , G01S13/89 , G01S19/01
摘要： Techniques are disclosed for systems and methods to provide remote sensing imagery for mobile structures. A remote sensing imagery system includes a remote sensing assembly with a housing mounted to a mobile structure and a coupled logic device. The logic device is configured to receive radar returns corresponding to a detected target from the radar assembly, determine a target radial speed corresponding to the detected target, determine an adaptive target speed threshold, and then generate remote sensor image data based on the remote sensor returns, the target radial speed, and the adaptive target speed threshold. Subsequent user input and/or the sensor data may be used to adjust a steering actuator, a propulsion system thrust, and/or other operational systems of the mobile structure.

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