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    • 23. 发明申请
    • CENTRALIZED VARIABLE RATE SERIALIZER AND DESERIALIZER FOR BAD COLUMN MANAGEMENT
    • 集中式可变速率串行程序和用于管道管理的DESERIALIZER
    • US20160307634A1
    • 2016-10-20
    • US15194867
    • 2016-06-28
    • SanDisk Technologies, Inc.
    • Wanfang TSAIYenLung LIChen CHEN
    • G11C16/26G11C16/34G11C16/04G11C16/10G11C16/16
    • G11C29/82G11C16/0483G11C16/10G11C16/16G11C16/26G11C16/3404G11C29/808G11C2207/107
    • A memory circuit includes an array subdivided into multiple divisions, each connectable to a corresponding set of access circuitry. A serializer/deserializer circuit is connected to a data bus and the access circuitry to convert data between a (word-wise) serial format on the bus and (multi-word) parallel format for the access circuitry. Column redundancy circuitry is connect to the serializer/deserializer circuit to provide defective column information about the array. In converting data from a serial to a parallel format, the serializer/deserializer circuit skips words of the data in the parallel format based on the defective column information indicating that the location corresponds to a defective column. In converting data from a parallel to a serial format the serializer/deserializer circuit skips words of the data in the parallel format based on the defective column information indicating that the location corresponds to a defective column.
    • 存储器电路包括细分成多个分区的阵列,每个分区可连接到对应的一组接入电路。 串行器/解串器电路连接到数据总线和访问电路,用于在总线上的(逐字)串行格式和用于访问电路的(多字)并行格式之间转换数据。 列冗余电路连接到串行器/解串器电路,以提供关于阵列的有缺陷的列信息。 在将数据从串行格式转换为并行格式时,串行器/解串器电路基于指示位置对应于缺陷列的缺陷列信息,以并行格式跳过数据字。 在将数据从并行转换为串行格式时,串行器/解串器电路基于指示该位置对应于缺陷列的缺陷列信息,以并行格式跳过数据字。
    • 28. 发明申请
    • SENSE AMPLIFIER LOCAL FEEDBACK TO CONTROL BIT LINE VOLTAGE
    • SENSE放大器本地反馈控制位线电压
    • US20160254048A1
    • 2016-09-01
    • US15151359
    • 2016-05-10
    • SANDISK TECHNOLOGIES INC.
    • Chang SiauXiaowei JiangYingchang Chen
    • G11C13/00
    • G11C13/004G11C7/04G11C7/062G11C7/067G11C7/12G11C7/14G11C11/5642G11C13/0069G11C16/24G11C16/26G11C2013/0042G11C2013/0045G11C2207/063
    • Methods for precharging bit lines using closed-loop feedback are described. In one embodiment, a sense amplifier may include a bit line precharge circuit for setting a bit line to a read voltage prior to sensing a memory cell connected to the bit line. The bit line precharge circuit may include a first transistor in a source-follower configuration with a first gate and a first source node electrically coupled to the bit line. By applying local feedback from the first source node to the first gate, the bit line settling time may be reduced. In some cases, a first voltage applied to the first gate may be determined based on a first current drawn from the first bit line. Thus, the first voltage applied to the first gate may vary over time depending on the conductivity of a selected memory cell connected to the bit line.
    • 描述了使用闭环反馈对位线进行预充电的方法。 在一个实施例中,读出放大器可以包括位线预充电电路,用于在感测连接到位线的存储器单元之前将位线设置为读取电压。 位线预充电电路可以包括具有第一栅极的源极跟随器配置的第一晶体管和电耦合到位线的第一源节点。 通过将来自第一源节点的本地反馈应用于第一门,可以减少位线建立时间。 在一些情况下,施加到第一栅极的第一电压可以基于从第一位线汲取的第一电流来确定。 因此,施加到第一栅极的第一电压可以随时间而变化,这取决于连接到位线的所选择的存储器单元的电导率。