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31. 发明授权

US3961178A Image sharpness detecting system and apparatus utilizing the same 失效
标题翻译：图像清晰度检测系统及利用其的装置
公开(公告)号：US3961178A
公开(公告)日：1976-06-01
申请号：US515849
申请日：1974-10-18
申请人： Kazuya Hosoe , Hiroshi Aizawa , Seiichi Matsumoto , Hideo Yokota
发明人： Kazuya Hosoe , Hiroshi Aizawa , Seiichi Matsumoto , Hideo Yokota
IPC分类号： G02B7/36 , G01J1/20 , H01J39/12
CPC分类号： G02B7/36
摘要： An image sharpness detecting system employing two photoconductive cells of different geometry which permits detection of an optimum degree of sharpness of an image formed thereon regardless of variation in the direction of light distribution of the image relative to the electrodes of the cells. Differences between light response characteristics of these two cells due to the different geometry thereof are compensated for by providing optical means such as filter arranged between the cells, whereby the system is made accurately and reliably responsive to variation of light distribution even at low total light levels.
摘要翻译：使用不同几何形状的两个光电导单元的图像锐度检测系统，其允许检测在其上形成的图像的最佳锐度锐度，而不管图像相对于单元电极的光分布方向的变化。通过提供诸如布置在单元之间的滤波器等光学装置来补偿这两个单元由于其不同几何形状的光响应特性之间的差异，由此即使在较低的总光线水平下，该系统也准确可靠地响应于光分布的变化。

32. 发明授权

US3950764A System for automatically focusing an object in a camera or the like 失效
标题翻译：用于自动聚焦摄像机中的对象的系统或类似的系统
公开(公告)号：US3950764A
公开(公告)日：1976-04-13
申请号：US471708
申请日：1974-05-20
申请人： Kazuya Hosoe , Seiichi Matsumoto , Noritaka Mochizuki
发明人： Kazuya Hosoe , Seiichi Matsumoto , Noritaka Mochizuki
IPC分类号： G02B7/36 , G03B3/10 , G03B3/02
CPC分类号： G02B7/36
摘要： An automatic focusing system which includes a cylindrical image forming lens disposed in opposed relationship with a photocell. The cell and the cylindrical lens are ring-shaped so that the representation characteristic of the cylindrical lens for an object and the light reception characteristic of the photocell cooperate together to detect any pattern of object in accordance with an extreme output value of the photocell.

33. 发明授权

US3937950A Focus defecting system 失效
标题翻译：焦点缺陷系统
公开(公告)号：US3937950A
公开(公告)日：1976-02-10
申请号：US459219
申请日：1974-04-08
申请人： Kazuya Hosoe , Seiichi Matsumoto , Hideo Yokota , Hiroshi Aizawa
发明人： Kazuya Hosoe , Seiichi Matsumoto , Hideo Yokota , Hiroshi Aizawa
IPC分类号： G03B13/36 , G02B7/36 , G01J1/20
CPC分类号： G02B7/36
摘要： A system for detecting the distinction of the object image characterized in that respectively on a photoelectric transducing element presenting electrodes on both extremities along the longer sides of a photoelectric semiconductor presenting considerably short sides as compared with the long sides and on a photoelectric transducing element presenting electrodes on both extremities along the shorter sides of a photoelectric semiconductor presenting considerably short sides as compared with the long sides an object image is formed by means of an optics and that the distinction of the above mentioned object image is detected by detecting the electric characteristics variable corresponding to the distinction of the above mentioned object image, of each of the above mentioned photoelectric transducing elements.
摘要翻译：一种用于检测对象图像的区别的系统，其特征在于，分别在光电转换元件上呈现与长边相比呈现相当短边的光电半导体的两侧的两端的电极和呈现电极的光电换能元件在与长边相比，通过光学元件形成物体图像的情况下，沿着具有相当短边的光电半导体的短边的两个末端上的物体图像，并且通过检测上述目标图像的电特性变量来检测上述目标图像的区别对上述光电转换元件的上述目标图像的区别。

34. 发明申请

US20150158119A1 WELDING METHOD, WELDING DEVICE, AND METHOD FOR MANUFACTURING BATTERY 有权
标题翻译：焊接方法，焊接装置以及制造电池的方法
公开(公告)号：US20150158119A1
公开(公告)日：2015-06-11
申请号：US14401189
申请日：2012-05-15
申请人： Hideo Nakamura , Tooru Sugiyama , Seiichi Matsumoto , Noriaki Yamamoto , Yoshinori Shibata
发明人： Hideo Nakamura , Tooru Sugiyama , Seiichi Matsumoto , Noriaki Yamamoto , Yoshinori Shibata
IPC分类号： B23K26/03 , H01M2/02 , B23K26/20
CPC分类号： B23K26/034 , B23K26/032 , B23K26/0622 , B23K26/21 , B23K26/32 , B23K31/125 , B23K2101/36 , B23K2103/08 , B23K2103/10 , H01M2/02 , H01M2/0439
摘要： Disclosed is a technique for quickly detecting a defect of a portion welded by laser beam welding. Specifically disclosed is a welding step in which a welding device is used, the welding device welding an object to be welded with a pulsed laser. In the welding step, a first photodetector receives only infrared rays having a wavelength allowing detection of a keyhole formed in a molten pool from among infrared rays radiating from a welded portion during the welding of the object, and an analyzer determines quality of the welded portion on the basis of intensity of the infrared rays received by the first photodetector.
摘要翻译：公开了一种用于快速检测通过激光束焊接焊接的部分的缺陷的技术。具体公开了一种焊接步骤，其中使用焊接装置，焊接装置用脉冲激光焊接待焊接的物体。在焊接工序中，第一光电检测器仅在物体焊接期间从仅从焊接部分发射的红外线中仅接收具有波长的红外线，该波长允许检测在熔池中形成的锁孔，并且分析器确定焊接部分的质量基于由第一光电检测器接收的红外线的强度。

35. 发明授权

US08547683B2 Laminated ceramic electronic component with directly plated external terminal electrodes and manufacturing method therefor 有权
标题翻译：具有直接电镀外部端子电极的层压陶瓷电子部件及其制造方法
公开(公告)号：US08547683B2
公开(公告)日：2013-10-01
申请号：US12821305
申请日：2010-06-23
申请人： Masahito Saruban , Makoto Ogawa , Toshiyuki Iwanaga , Seiichi Matsumoto , Akihiro Motoki , Shunsuke Takeuchi , Seiichi Nishihara , Kenichi Kawasaki
发明人： Masahito Saruban , Makoto Ogawa , Toshiyuki Iwanaga , Seiichi Matsumoto , Akihiro Motoki , Shunsuke Takeuchi , Seiichi Nishihara , Kenichi Kawasaki
IPC分类号： H01G4/228 , H01G4/06 , H01G7/00
CPC分类号： H01G4/2325 , H01G4/30 , H01L41/083 , H01L41/293
摘要： In a method for manufacturing a laminated ceramic electronic component, after a plating layer for an external terminal electrode is formed by applying copper plating to an end surface of a component main body at which respective ends of a plurality of internal electrodes primarily including nickel are exposed, when a heat treatment at a temperature of about 800° C. or more is applied in order to improve adhesion strength and resistance to moisture of the external terminal electrode, voids may occur in the plating layer. The step of applying a heat treatment at a temperature of about 800° C. or more to a component main body with plating layers formed thereon includes not only a step of maintaining a top temperature of about 1000° C. or more but also a step of maintaining a temperature of about 600° C. to 900° C. at least once before the step of maintaining the top temperature.
摘要翻译：在层叠陶瓷电子部件的制造方法中，在将外部端子电极的镀覆层通过在主体的主体的多个内部电极的各端露出的部件主体的端面上进行镀铜而形成后，为了提高外部端子电极的附着强度和耐潮湿性而在800℃以上的温度下进行热处理时，可能会在镀层中产生空隙。在其上形成有镀层的组件主体上，在约800℃以上的温度下进行热处理的步骤不仅包括保持顶部温度为约1000℃以上的步骤，还包括步骤在保持顶部温度的步骤之前至少保持约600℃至900℃的温度。

36. 发明授权

US08400754B2 Method and apparatus for producing a ceramic electronic component 有权
标题翻译：陶瓷电子部件的制造方法和装置
公开(公告)号：US08400754B2
公开(公告)日：2013-03-19
申请号：US12631924
申请日：2009-12-07
申请人： Makoto Ogawa , Seiichi Matsumoto , Akihiro Motoki , Toshiyuki Iwanaga , Tatsuo Kunishi
发明人： Makoto Ogawa , Seiichi Matsumoto , Akihiro Motoki , Toshiyuki Iwanaga , Tatsuo Kunishi
IPC分类号： H01G4/06 , H01G4/228
CPC分类号： H01G4/00 , C23C18/1632 , C23C18/1657 , C23C18/31 , C25D1/00 , C25D1/10 , H01G4/232 , H01G4/30 , H01G13/006 , Y10T29/43
摘要： A method for producing a laminated ceramic capacitor allows a surface of at least a portion of a ceramic element body chip to be brought into contact with a plated layer formed in advance in a mold member, and performs heat processing on the ceramic element body chip in that contact state, thereby to form an external conductor layer made of the plated layer on the surface of at least the portion of the ceramic element body chip. Thus, a method and an apparatus for producing a ceramic electronic component accurately and precisely controls the thickness of the external conductor layer to be small, and easily controls the length of the external conductor layer.
摘要翻译：陶瓷电容器的制造方法使陶瓷元件体芯片的至少一部分的表面与预先形成在模具部件中的镀层接触，并对陶瓷元件体芯片进行热处理从而在陶瓷元件主体芯片的至少一部分的表面上形成由镀层形成的外部导体层。因此，陶瓷电子部件的制造方法和装置精确而精确地控制外部导体层的厚度小，并且容易控制外部导体层的长度。

37. 发明申请

US20120111103A1 DETECTING APPARATUS 有权
标题翻译：检测装置
公开(公告)号：US20120111103A1
公开(公告)日：2012-05-10
申请号：US13254492
申请日：2009-08-03
申请人： Seiichi Matsumoto , Hiroyuki Kawaki , Shinya Kamada , Yasunori Toyoshima , Masayuki Kitamura , Takahiro Makihara
发明人： Seiichi Matsumoto , Hiroyuki Kawaki , Shinya Kamada , Yasunori Toyoshima , Masayuki Kitamura , Takahiro Makihara
IPC分类号： G01B21/08
CPC分类号： H01M10/48 , G01B11/306 , G01B21/30 , H01M10/425
摘要： The objective of the present invention is to provide an unexpected detecting apparatus enabled to evaluate an evenness of a compound coated on an electrode of a battery. The detecting apparatus (1) detects an evenness of a compound (12) coated on an electrode (10) of a battery, and includes a first sensor (20) for measuring a mass per unit area of the compound (12) in any points thereof, a second sensor (30, 50) for measuring a thickness of the compound (12) in the any points, and a holder (40, 60) for holding the first and second sensors (20, 30, 50), in which the first and second sensors (20, 30, 50) measure the mass and thickness at the same time, and the evenness is evaluated on the basis of the measured mass and thickness.
摘要翻译：本发明的目的是提供一种能够评估涂覆在电池的电极上的化合物的均匀性的意外检测装置。检测装置（1）检测涂覆在电池的电极（10）上的化合物（12）的均匀性，并且包括用于以任何点测量化合物（12）的每单位面积质量的第一传感器（20），用于测量任何点上的化合物（12）的厚度的第二传感器（30,50）和用于保持第一和第二传感器（20,30,50）的保持器（40,60），其中第一和第二传感器（20,30,50）同时测量质量和厚度，并且基于测量的质量和厚度来评估均匀度。

38. 发明申请

US20100264315A1 HYDROCARBON CONCENTRATION MEASURING APPARATUS AND HYDROCARBON CONCENTRATION MEASURING METHOD 审中-公开
标题翻译：石油浓度测量仪器和油气浓度测量方法
公开(公告)号：US20100264315A1
公开(公告)日：2010-10-21
申请号：US12741974
申请日：2008-10-28
申请人： Takahiro Okada , Seiichi Matsumoto , Masahiro Yamakage , Tomoyasu Iwase , Shigenobu Tachibana , Kenji Muta , Masazumi Tanoura , Satoshi Fukada , Ichiro Awaya , Kazuhiro Akihama , Taketoshi Fujikawa , Masami Yamamoto , Ayako Ohshima
发明人： Takahiro Okada , Seiichi Matsumoto , Masahiro Yamakage , Tomoyasu Iwase , Shigenobu Tachibana , Kenji Muta , Masazumi Tanoura , Satoshi Fukada , Ichiro Awaya , Kazuhiro Akihama , Taketoshi Fujikawa , Masami Yamamoto , Ayako Ohshima
IPC分类号： G01J5/02 , G01J5/58
CPC分类号： G01N21/3504
摘要： This invention provides a hydrocarbon concentration measuring apparatus, which, even when the concentration and composition of hydrocarbons contained in an object gas to be measured vary, can measure the concentration of the hydrocarbons with good response and good accuracy, and a hydrocarbon measuring method. Light with a waveband including a common absorption region, which is absorbed by a single or a plurality of chemical species, is applied to the object gas by an infrared irradiation equipment. The light applied to the object gas is detected with a line sensor. The absorbance in the common absorption region of the object gas is computed with an analyzer based on the detected light. The sum of concentrations of chemical species, which absorb light in the waveband in the common absorption region, in the single or plurality of chemical species contained in the object gas, is computed with the analyzer based on the absorbance.
摘要翻译：本发明提供一种烃浓度测定装置，即使在被测定对象气体中所含有的烃的浓度和组成变化的情况下，也能够以良好的响应和良好的精度测定烃的浓度，也可以使用烃测定方法。具有包含由单个或多个化学物质吸收的共同吸收区域的波段的光通过红外线照射设备施加到对象气体。用线传感器检测施加到对象气体的光。使用基于检测到的光的分析仪计算目标气体的共同吸收区域中的吸光度。基于吸光度，使用分析仪计算在目标气体中包含的单个或多个化学物质中吸收共同吸收区域中的波段中的光的化学物质的浓度之和。

39. 发明申请

US20090049679A1 METHOD FOR MANUFACTURING CERAMIC ELECTRONIC COMPONENT AND PLANTING BATH 有权
标题翻译：制造陶瓷电子元件和制造浴的方法
公开(公告)号：US20090049679A1
公开(公告)日：2009-02-26
申请号：US11909736
申请日：2006-02-01
申请人： Akihiro Motoki , Makoto Ogawa , Seiichi Matsumoto , Yoshihiko Takano , Tatsuo Kunishi
发明人： Akihiro Motoki , Makoto Ogawa , Seiichi Matsumoto , Yoshihiko Takano , Tatsuo Kunishi
IPC分类号： H01M4/00
CPC分类号： C25D5/54 , C25D3/30 , C25D11/34 , H01G4/005 , H01G4/1227 , H01G13/00 , Y10T29/42 , Y10T29/43 , Y10T29/435 , Y10T29/49002 , Y10T29/4902
摘要： A method for manufacturing a ceramic electronic component having excellent solderability is provided. In this method, the elution of barium from the ceramic electronic component and the adhesion of ceramic electronic components in tin plating are reduced. The method for manufacturing a ceramic electronic component includes the steps of providing an electronic component of barium-containing ceramic and forming an electrode on the outer surface of the electronic component, the electrode being electroplated with tin. In this method, a plating bath used in the tin plating has a tin ion concentration A in the range of 0.03 to 0.51 mol/L, a sulfate ion concentration B in the range of 0.005 to 0.31 mol/L, a molar ratio B/A of less than one, and a pH in the range of 6.1 to 10.5.
摘要翻译：提供了具有优异的可焊性的陶瓷电子部件的制造方法。在该方法中，钡从陶瓷电子部件的洗脱以及陶瓷电子部件在镀锡中的粘附性降低。制造陶瓷电子部件的方法包括以下步骤：提供含钡陶瓷的电子部件，并在电子部件的外表面上形成电极，电极用锡电镀。在该方法中，镀锡中使用的镀浴的锡离子浓度A为0.03〜0.51mol / L，硫酸根离子浓度B为0.005〜0.31mol / L，摩尔比B / A小于1，pH范围为6.1至10.5。

40. 发明授权

US06352911B1 Thin-film transistor array and method for producing the same 有权
标题翻译：薄膜晶体管阵列及其制造方法
公开(公告)号：US06352911B1
公开(公告)日：2002-03-05
申请号：US09619675
申请日：2000-07-19
申请人： Seiichi Matsumoto
发明人： Seiichi Matsumoto
IPC分类号： H01L2904
CPC分类号： H01L29/78633
摘要： In a thin film transistor array, on a transparent insulating substrate made of glass or the like, a plurality of scanning lines is formed of a first conductive film. A plurality of signal lines is formed of a second conductive film and pixel electrodes are formed on a gate insulating film in a region enclosed with adjacent scanning lines and adjacent signal lines. Thin film transistors are coupled to the pixel electrodes, and light shielding films are formed of the first conductive film and form light shielding overlap portions with peripheral portions facing the signal lines of respective pixel electrodes via the gate insulating film. The light shielding film has portions near the both ends thereof along the signal line projected toward a side of the signal line to form correction overlap portions which overlap the signal lines via the gate insulating film. This allows a correction of an interruption in the signal lines to be effectuated without increasing load to the process and without adversely affecting display.
摘要翻译：在薄膜晶体管阵列中，在由玻璃等制成的透明绝缘基板上，多条扫描线由第一导电膜形成。多个信号线由第二导电膜形成，并且像素电极形成在由相邻扫描线和相邻信号线包围的区域中的栅极绝缘膜上。薄膜晶体管耦合到像素电极，并且光屏蔽膜由第一导电膜形成并且经由栅极绝缘膜形成与各个像素电极的信号线相对的周边部分的遮光重叠部分。遮光膜沿着朝向信号线的一侧投影的信号线的两端附近具有部分，以形成经由栅极绝缘膜与信号线重叠的校正重叠部分。这允许校正信号线中的中断，而不会增加对该过程的负担并且不会不利地影响显示。

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