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    • 53. 发明授权
    • Method and apparatus for accelerating sparse matrix operations in full accuracy circuit simulation
    • 用于在全精度电路仿真中加速稀疏矩阵运算的方法和装置
    • US09449129B2
    • 2016-09-20
    • US13873621
    • 2013-04-30
    • Freescale Semiconductor, Inc.
    • Kiran Kumar GullapalliSteven D. Hamm
    • G06F7/60G06F17/50
    • G06F17/5036G06F17/5022
    • A system and method of accelerating sparse matrix operations in full accuracy simulation of a circuit includes determining repetitive blocks of the circuit, determining a set of values of a current block, determining whether the state of the current block is sufficiently close to the state of a stored block solution when the corresponding values are within a predetermined error range, and performing a reduced computation using the stored block solution to provide a solution for the current block when the states are sufficiently close to each other. The reduced computation includes retrieving previously stored solutions and performing substantially simplified matrix and vector operations while maintaining accuracy of the solution. Reduced precision versions of the values may be used to generate a hash index used to store the block solutions. Stored redundant device information may also be used to simplify device solutions in a similar manner.
    • 在电路的全精度仿真中加速稀疏矩阵运算的系统和方法包括确定电路的重复块,确定当前块的一组值,确定当前块的状态是否足够接近于当前块的状态 当相应的值在预定的误差范围内时,使用存储的块解来执行减少的计算,以便当状态彼此充分接近时为当前块提供解决方案。 减少的计算包括检索先前存储的解决方案并执行基本上简化的矩阵和向量操作,同时保持解决方案的准确性。 可以使用精简版本的精简版本来生成用于存储块解决方案的散列索引。 存储的冗余设备信息也可以用于以类似的方式简化设备解决方案。
    • 54. 发明授权
    • Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangement
    • 用于半导体器件的逻辑内置自检的电路布置和操作这种电路布置的方法
    • US09448283B2
    • 2016-09-20
    • US14421889
    • 2012-08-22
    • Heiko AhrensClaudia LatzelBernhard Richter
    • Heiko AhrensClaudia LatzelBernhard Richter
    • G01R31/28G01R31/3177G01R31/3185G01R31/3187
    • G01R31/3177G01R31/318547G01R31/318575G01R31/3187
    • A circuit arrangement for Logic Built-In Self-Test (LBIST) includes a clock source configured to generate a system clock, a first clock division circuitry configured to derive a first punched-out clock and a plurality of scan chains operable at the first punched-out clock. Each scan chain has an associated output circuitry responsive to a leading edge of the first punched-out clock. The circuit arrangement includes a second clock division circuitry configured to derive a second punched-out clock. The second punched-out clock has a delay of one or more system clock periods relative to the first punched-out clock. A compacting logic is configured to compact signals received from the scan chains. A sequential retiming element connects the compacting logic to an input circuitry of a MISR. The sequential retiming element is responsive to a trailing edge of the second punched-out clock. The input circuitry is responsive to a leading edge of the second punched-out clock.
    • 用于逻辑内置自检(LBIST)的电路装置包括被配置为产生系统时钟的时钟源,被配置为导出第一冲出时钟的第一时钟分频电路和可在第一冲压时操作的多个扫描链 - 时钟。 每个扫描链具有响应于第一冲出时钟的前沿的相关联的输出电路。 电路装置包括被配置为导出第二冲出时钟的第二时钟分频电路。 第二冲出时钟相对于第一冲出时钟具有一个或多个系统时钟周期的延迟。 压缩逻辑被配置为压缩从扫描链接收的信号。 连续重新定时元件将压实逻辑连接到MISR的输入电路。 顺序重新定时元件响应于第二冲出时钟的后沿。 输入电路响应于第二冲出时钟的前沿。
    • 55. 发明申请
    • LOW JITTER PULSE OUTPUT FOR POWER METER
    • 低功率脉冲串脉冲输出
    • US20160266180A1
    • 2016-09-15
    • US15025042
    • 2013-09-27
    • Martin MIENKINARadomir KOZUBLudek SLOSARCIKLukas VACULIK
    • MARTIN MIENKINARADOMIR KOZUBLUDEK SLOSARCIKLUKAS VACULIK
    • G01R21/127G01R21/133
    • G01R21/127G01R21/133G01R22/06G01R35/04G06F1/26
    • There is provided an energy consumption meter device (1) comprising the processor (8) arranged to receive input data from the sampling unit. The processor calculates at a calculation step [n] an energy contribution value using ΔE using a sampled voltage value and a sampled current value. The processor will calculate an energy value E[n] using a reminder value which was calculated at a previous calculation step [n−1]. The processor will then calculate a relative delay Td′ using the threshold value, the reminder value and the energy value, and generate an output pulse at an output time tpulse which is delayed for the relative delay Td′ with respect to the calculation time step[n]. By delaying the output pulse with a value which is a closest proximity of Td, the cycle-by-cycle jitter is less or equal to the clock frequency of the timer tclk.
    • 提供了一种能量消耗计装置(1),包括处理器(8),其被布置成从采样单元接收输入数据。 处理器使用采样电压值和采样电流值,使用ΔE在计算步骤[n]计算能量贡献值。 处理器将使用在先前的计算步骤[n-1]计算的提醒值来计算能量值E [n]。 然后,处理器将使用阈值,提醒值和能量值来计算相对延迟Td',并且在相对于计算时间步长相对于延迟Td'延迟的输出时间tpulse处产生输出脉冲[ n]。 通过以与Td最接近的值延迟输出脉冲,逐周期抖动小于或等于定时器tclk的时钟频率。
    • 56. 发明授权
    • Teleconferencing environment having auditory and visual cues
    • 具有听觉和视觉线索的电话会议环境
    • US09445050B2
    • 2016-09-13
    • US14543031
    • 2014-11-17
    • FREESCALE SEMICONDUCTOR, INC.
    • Edward O. TravisDouglas M. Reber
    • H04N7/14H04N7/15H04L29/06G10L17/00
    • H04N7/15G10L17/005H04L65/403H04N7/147
    • A teleconferencing environment is provided in which both audio and visual cues are used to identify active participants and presenters. Embodiments provide an artificial environment, configurable by each participant in a teleconference, that directs the attention of a user to an identifier of an active participant or presenter. This direction is provided, in part, by stereo-enhanced audio that is associated with a position of a visual identifier of an active participant or presenter that has been placed on a window of a computer screen. The direction is also provided, in part, by promotion and demotion of attendees between attendee, active participant, and current presenter and automatic placement of an image related to an attendee on the screen in response to such promotion and demotion.
    • 提供电话会议环境,其中使用音频和视觉线索来识别活动参与者和演示者。 实施例提供了可由电话会议中的每个参与者配置的人造环境,其将用户的注意力引导到主动参与者或演示者的标识符。 该方向部分地由与被放置在计算机屏幕的窗口上的主动参与者或演示者的视觉标识符的位置相关联的立体声增强音频提供。 方向也部分通过参加者,积极参与者和现任主持人的参与者的升级和降级,以及响应于这种升级和降级在屏幕上自动放置与参加者相关的图像。
    • 57. 发明授权
    • Method of bond pad protection during wafer processing
    • 晶圆加工过程中焊盘保护的方法
    • US09443782B1
    • 2016-09-13
    • US14823069
    • 2015-08-11
    • FREESCALE SEMICONDUCTOR, INC.
    • Robert F. SteimleDwight L. DanielsVeera M. Gunturu
    • H01L21/00H01L23/31H01L21/02H01L21/82H01L21/56H01L23/00
    • H01L23/3157H01L21/02013H01L21/50H01L21/561H01L21/6835H01L21/78H01L21/82H01L23/04H01L23/10H01L23/564H01L2221/68377
    • A method for protecting terminal elements on a wafer during wafer level fabrication processes entails applying a protective coating to the terminal elements prior to further processing operations. These processing operations may include back side grinding of the wafer and/or saw-to-reveal operations to expose the terminal elements from a cap wafer of a wafer structure. The protective coating can protect the terminal elements from potentially damaging contaminants, such as debris from the grinding or saw-to-reveal operations. Furthermore, the protective coating can protect the bond pads from coming into contact with a rapidly oxidizing environment when exposed to water. The protective coating may be a hot-water soluble thermoplastic material the melts from a solid form to a liquid form at a relatively low temperature to enable application of the protective coating in liquid form onto the terminal elements and clean removal of the protective coating from the terminal elements.
    • 在晶片级制造过程中保护晶片上的端子元件的方法需要在进一步处理操作之前对端子元件施加保护涂层。 这些处理操作可以包括晶片的背面研磨和/或锯到显示操作,以从晶片结构的盖晶片露出端子元件。 保护涂层可以保护端子元件免受潜在的破坏性污染物,例如磨削或锯切操作中的碎屑。 此外,当暴露于水时,保护涂层可以保护接合垫不与快速氧化环境接触。 保护性涂层可以是热水可溶的热塑性材料,其在相对较低的温度下从固体形式熔化成液体形式,以使得能够将液体形式的保护涂层施加到端子元件上,并将保护涂层从 终端元素。
    • 58. 发明授权
    • Simulation system and method for testing a simulation of a device against one or more violation rules
    • 用于根据一个或多个违规规则测试设备的仿真的仿真系统和方法
    • US09443041B2
    • 2016-09-13
    • US14398885
    • 2012-09-13
    • Mehul ShroffPeter AbramowitzXavier Hours
    • Mehul ShroffPeter AbramowitzXavier Hours
    • G06F17/50G06F11/26
    • G06F17/5009G06F11/261G06F17/5022G06F17/5045G06F17/5081
    • A simulation system for testing a simulation of a device against one or more violation rules is described. The simulation system comprises a device simulator for executing the simulation of the device using a device design, a device model and a simulation scenario; and one or more violation monitor for each violation rule. At least one of the violation monitors comprises a violation information detector and a threshold controller. The violation information detector is arranged to detect one or more violations of the respective violation rule of the one or more violation rules during the executing the simulation of the device and, for each violation, determine information representing the respective violation, wherein the detecting the one or more violations comprises comparing a simulated parameter against a threshold. The threshold controller is arranged to determine the threshold for the respective violation rule of the one or more violation rules in dependence on a temporal characteristic of a violation associated with the respective violation rule. A method of testing a simulation of a device against one or more violation rules is also described.
    • 描述了用于针对一个或多个违规规则来测试设备的模拟的仿真系统。 该仿真系统包括:使用设备设计,设备模型和仿真场景执行设备仿真的设备模拟器; 以及每个违规规则的一个或多个违规监视器。 至少一个违规监视器包括违规信息检测器和阈值控制器。 违规信息检测器被布置为在执行设备的仿真期间检测对一个或多个违规规则的相应违规规则的一个或多个违反,并且对于每个违规,确定表示相应违反的信息,其中检测一个 或更多违法行为包括将模拟参数与阈值进行比较。 阈值控制器被设置为根据与相应违反规则相关联的违规的时间特征来确定一个或多个违规规则的相应违规规则的阈值。 还描述了针对一个或多个违规规则测试设备的模拟的方法。