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71. 发明授权

US5684407A Electronic circuit packaged with a position sensor 失效
标题翻译：电子电路与位置传感器一起包装
公开(公告)号：US5684407A
公开(公告)日：1997-11-04
申请号：US157974
申请日：1993-11-24
申请人： John Zdanys, Jr. , James N. Hufford , Robert F. Gornick
发明人： John Zdanys, Jr. , James N. Hufford , Robert F. Gornick
IPC分类号： G01B7/00 , G01D5/165 , G01R1/00 , H01C13/00 , H05K3/28 , H05K3/34 , H03F1/26
CPC分类号： H05K3/3405 , G01D5/165 , H05K2201/10977 , H05K3/284
摘要： A voltage follower is incorporated within a molded electrical connector interface of a position sensor in a way that does not detract from the dimensions or the performance of the finished sensor. The incorporation of the voltage follower into the housing of the variable resistor provides several advantages over the prior art, including: an immunity to sag; substantially reduced sensitivity to noisy contactors; and short lead length and low output impedance, both of which result in reduced interference from external source.
摘要翻译：电压跟随器以不影响成品传感器的尺寸或性能的方式结合在位置传感器的模制电连接器接口内。将电压跟随器结合到可变电阻器的外壳中提供了与现有技术相比的几个优点，包括：下垂的抗扰性; 大大降低了对噪声接触器的敏感性; 并且引线长度短，输出阻抗低，这两者都减少了外部干扰源。

72. 发明授权

US5659255A Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels 失效
标题翻译：评估具有多个单独测量通道的探针测量网络中的信号条件的方法
公开(公告)号：US5659255A
公开(公告)日：1997-08-19
申请号：US669097
申请日：1996-06-26
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R31/26 , G01R1/00 , G01R1/067 , G01R1/073 , G01R31/02 , G01R31/28 , G01R35/00 , H01L21/66
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005 , G01R1/06772
摘要： A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive planar probing area on the upper face of a base and a reference junction connected to the probing area by a high-frequency transmission structure. The method further includes placing the respective device-probing end of a first one of the measurement channels into contact with the planar probing area, transmitting a high-frequency signal through both the measurement channel and the reference junction and, thereafter, measuring the signal. This step is repeated for the other measurement channels and the signal conditions in the different channels are then evaluated by comparing the measured signals, where such evaluation is facilitated by maintaining, via the high-frequency transmission structure, a transmission line of substantially constant high-frequency transmission characteristic between each device-probing end coming into contact with the planar probing area and the reference junction.
摘要翻译：一种评估具有多个单独测量通道的探针测量网络中的信号状况的方法，其中每个通道通过相应的设备探测端进行通信。该方法包括提供一种组件，其包括在基座的上表面上的导电平面探测区域和通过高频传输结构连接到探测区域的参考点。该方法还包括将测量通道中的第一个测量通道的相应设备探测端与平面探测区域接触，通过测量通道和参考接点两者传输高频信号，然后测量信号。对其他测量通道重复该步骤，然后通过比较测量信号来评估不同通道中的信号条件，其中通过经由高频传输结构维持基本上恒定的高频传输线的传输线，每个设备探测端与平面探测区域和参考接点接触之间的频率传输特性。

73. 发明授权

US5559430A Net radiation sensor 失效
标题翻译：净辐射传感器
公开(公告)号：US5559430A
公开(公告)日：1996-09-24
申请号：US280995
申请日：1994-07-27
申请人： Tapani O. Seppa
发明人： Tapani O. Seppa
IPC分类号： G01K1/02 , G01R1/00 , G01N25/00
CPC分类号： G01K1/024 , G01K2007/422
摘要： A system for determining the sag of an overhead power transmission line to prevent flashover to adjacent objects on earth. A small replica of the transmission line conductor is provided and located in proximity to the transmission line. The temperature of the replica is measured along with the ambient temperature. By appropriate calculations, the ampacity determination is made to determine the maximum permitted current through the transmission line under the particular weather conditions.
摘要翻译：一种用于确定架空电力传输线的下垂以防止闪电到地球上相邻物体的系统。提供传输线路导体的小副本并且位于传输线附近。复制品的温度与环境温度一起测量。通过适当的计算，进行载流容量确定以确定在特定天气条件下通过传输线的最大允许电流。

74. 发明授权

US5557198A Onboard digital locomotive multimeter 失效
标题翻译：机载数字机车万用表
公开(公告)号：US5557198A
公开(公告)日：1996-09-17
申请号：US337859
申请日：1994-11-14
申请人： Jack W. Matthews , William Stevens
发明人： Jack W. Matthews , William Stevens
IPC分类号： G01R19/25 , G01R19/00 , G01R1/00 , G01R21/00
CPC分类号： G01R19/25
摘要： A digital, DC voltage meter device utilized for metering electric power on a locomotive system. This invention will eliminate the need to use a hand held meter to perform these functions. The meter is permanently built into the Voltage test panel, replacing test receptacles with a large 7/10' LED display that can be read day or night. It is designed to operate in temperatures from -32 degrees Fahrenheit to 158 degrees Fahrenheit. A three position spring loaded switch returning to the off position is used to operate the meter. The present invention is a custom DC voltage meter that is capable of measuring two voltage ranges on a locomotive system; 0-1500 Volts ("V") for main generator voltage can be measured when the switch is in the top position; and 0-75 millivolts ("mV") for load test shunt millivoltage can be measured when the switch is in the bottom position. The meter is also capable of displaying the Dynamic Braking Voltage when the locomotive's dynamic brake is engaged.
摘要翻译：一种用于计量机车系统电力的数字直流电压表装置。本发明将消除使用手持式电表来执行这些功能的需要。仪表永久内置在电压测试面板中，用大型+ E，fra 7/10 + EE'LED显示屏替代测试插座，可以日夜阅读。它设计用于在-32华氏度至158华氏度的温度下工作。使用三位置弹簧加载开关返回关闭位置来操作仪表。本发明是能够测量机车系统上的两个电压范围的定制直流电压表; 当开关处于顶部位置时，可以测量主发电机电压的0-1500伏（“V”）并且当开关处于底部位置时，可以测量用于负载测试分流毫伏的0-75毫伏（“mV”）。当机车的动力制动器接合时，仪表还能够显示动态制动电压。

75. 发明授权

US5514959A Electric meter including a switch cover lockable in an open position 失效
标题翻译：电表包括可在闭合位置锁定的开关盖
公开(公告)号：US5514959A
公开(公告)日：1996-05-07
申请号：US364090
申请日：1994-12-27
申请人： Patrick J. Horan , Joseph R. Legere , David J. Miller
发明人： Patrick J. Horan , Joseph R. Legere , David J. Miller
IPC分类号： E05D11/10 , G01R11/02 , G01R11/24 , G01R1/00
CPC分类号： G01R11/02 , E05D11/105 , G01R22/066 , E05Y2900/20 , Y10T16/54028
摘要： An electric meter includes a housing, a switch positioned within an opening in the housing, a hinge pin having a first cross-sectional shape and being connected to the housing, and a switch cover having a passageway receiving the hinge pin therein and permitting pivotal movement of said switch cover between a closed position and an open position. The passageway has a second cross-sectional shape cooperating with the first cross-sectional shape of the hinge pin for locking the switch cover in the open position. The hinge pin preferably includes a generally cylindrical shaft and a ridge extending longitudinally thereon to define the first cross-sectional shape. Accordingly, the passageway of the switch cover is preferably defined by a generally cylindrical portion with a first longitudinally extending channel in communication therewith to define the second cross-sectional shape. The passageway may also include a second longitudinal channel cooperating with the ridge to lock the switch cover in the closed position.
摘要翻译：电表包括壳体，位于壳体内的开口内的开关，具有第一横截面形状并连接到壳体的铰链销，以及开关盖，其具有在其中容纳铰链销并允许枢转运动所述开关盖在关闭位置和打开位置之间。通道具有与铰链销的第一横截面形状配合的第二横截面形状，用于将开关盖锁定在打开位置。铰链销优选地包括大致圆柱形的轴和在其上纵向延伸以限定第一横截面形状的脊。因此，开关盖的通道优选地由具有与其连通的第一纵向延伸通道的大致圆柱形部分限定，以限定第二横截面形状。通道还可以包括与脊相配合的第二纵向通道，以将开关盖锁定在关闭位置。

76. 发明授权

US5440241A Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby 失效
标题翻译：用于测试，烧录和制造晶片级集成电路的方法和由此生产的封装的晶片组件
公开(公告)号：US5440241A
公开(公告)日：1995-08-08
申请号：US847621
申请日：1992-03-06
申请人： Jerrold L. King , Jerry M. Brooks , Warren M. Farnworth , George P. McGill
发明人： Jerrold L. King , Jerry M. Brooks , Warren M. Farnworth , George P. McGill
IPC分类号： G01R1/04 , G01R31/28 , H01L21/66 , H01L23/32 , G01R1/00
CPC分类号： G01R31/2863 , G01R1/04 , H01L22/22 , H01L23/32 , H01L2924/0002
摘要： A method for probe testing and burning-in integrated circuits formed within dice or chips on a silicon wafer and then optionally either: (1) dicing the wafer into individual chips for shipment or (2) mating the wafer for shipment with a facing substrate having a temperature coefficient of expansion (TCE) matching the TCE of the wafer. Advantageously, the facing substrate is used for both probe and burn-in operations as well as being made a part of the wafer package in option No. 2 above where either the whole silicon wafer or a partial silicon wafer meeting threshold die requirements is to be shipped. In addition, probe and burn-in operations are carried out rapidly at high yields only after all integrated circuit manufacture has been completed.
摘要翻译：一种用于探针测试和在硅晶片上形成的骰子或芯片内的燃烧式集成电路的方法，然后可选地：（1）将晶片切割成单独的芯片进行装运，或（2）将晶片与具有正面衬底的对置衬底相配合，与晶片的TCE匹配的温度膨胀系数（TCE）。有利地，面对衬底用于探测和老化操作，并且被制成上述选项2中的晶片封装的一部分，其中满足阈值晶片要求的整个硅晶片或部分硅晶片将是发货。此外，只有在所有集成电路制造完成后，探头和老化操作才能以高产量快速进行。

77. 发明授权

US5436570A Burn-in test probe for fine-pitch packages with side contacts 失效
标题翻译：用于具有侧触点的精细间距封装的老化测试探头
公开(公告)号：US5436570A
公开(公告)日：1995-07-25
申请号：US120688
申请日：1993-09-13
申请人： Yin L. Tan
发明人： Yin L. Tan
IPC分类号： G01R31/28 , G01R35/00 , H01R31/06 , G01R1/00
CPC分类号： G01R35/00 , G01R31/2817 , H01R31/06
摘要： A splay-free test probe for maintaining high conductivity is described. A matrix of electrical pins are molded into the side walls of a probe head. The side surfaces of the probe head are milled such that the longitudinally exposed surfaces of the exposed pins are flushed with the side surfaces of the probe head. The longitudinal exposed surfaces of the pins become the contact surfaces of the test probe. The width of the contact surfaces is less than 50% of the cross-sectional diameter of the pins. Notwithstanding repeated insertions, the test probe ensures splay-free performance. The contact surfaces around the tips of the stainless steel pins are milled at an angle with respect to plane of the side walls of the probe head to facilitate the probe head's entry into the IC socket. While the probe head is inserted into IC socket, the stainless steel contact surfaces of the probe head remove contaminants from the socket pins. In the process, the electrical contact between the IC sockets and the IC pins is improved. The test probe not only can be customized to any specification of IC sockets, but it also ensures that the cross-sectional dimension and electrical conductivity of the IC package is accurately and reliably simulated.
摘要翻译：描述了用于保持高电导率的无喷射测试探针。电引脚的矩阵模制到探头的侧壁中。探针头的侧表面被铣削，使得暴露的销的纵向暴露的表面被探头的侧表面冲洗。销的纵向暴露表面成为测试探针的接触表面。接触表面的宽度小于销的横截面直径的50％。尽管重复插入，测试探头确保无播放性能。不锈钢针尖周围的接触表面相对于探头的侧壁平面成一角度铣削，以方便探针头进入IC插座。当探针头插入IC插座时，探针头的不锈钢接触表面会从插座针头上清除污染物。在此过程中，提高了IC插座与IC引脚之间的电接触。测试探头不仅可以根据IC插座的任何规格进行定制，而且可以确保IC封装的横截面尺寸和电导率准确可靠地模拟。

78. 发明授权

US4743843A Display signal generator device 失效
标题翻译：显示信号发生器装置
公开(公告)号：US4743843A
公开(公告)日：1988-05-10
申请号：US860191
申请日：1986-04-22
申请人： Hideaki Tada
发明人： Hideaki Tada
IPC分类号： H03M1/82 , G01D7/00 , G01R13/00 , G08C13/00 , G09G3/04 , G01R1/00
CPC分类号： G01R13/00 , G01D7/002
摘要： A display signal generator device which allows the pulse width of a digital signal to be constant and the pulse repetition period to be proportional to the analog amount of an input signal so as to produce a signal to be displayed even by an analog or digital display unit 7 or 6, thereby obtaining a digital/analog common signal of average value proportional to the frequency even with the pulse signal. In order to maintain the pulse width constant, only a monostable multivibrator is, for example, added, thereby providing an inexpensive display signal generator device.
摘要翻译： PCT No.PCT / JP85 / 00478 Sec。一九八六年四月二十二日 102（e）日期1986年4月22日PCT提交1985年8月30日PCT公布。第WO86 / 01594号公报日期：1986年3月13日。一种显示信号发生装置，其允许数字信号的脉冲宽度恒定，并且脉冲重复周期与输入信号的模拟量成比例，以产生即将显示的信号通过模拟或数字显示单元7或6，从而获得即使使用脉冲信号也与频率成比例的平均值的数字/模拟公共信号。为了保持脉冲宽度恒定，例如仅添加单稳态多谐振荡器，从而提供便宜的显示信号发生器装置。

79. 发明授权

US4736327A Data display method and apparatus 失效
标题翻译：数据显示方法及装置
公开(公告)号：US4736327A
公开(公告)日：1988-04-05
申请号：US708484
申请日：1985-04-12
申请人： Francis M. Power
发明人： Francis M. Power
IPC分类号： G01R13/20 , G01R13/00 , G06F3/14 , G09G5/18 , G06F15/20 , G01R1/00 , G09G1/06
CPC分类号： G01R13/00
摘要： A digital instrument is represented by an analog-to-digital converter 17 controlled by a CPU 10 to effect measurements at regular intervals. The digital measurements are stored in a history file in a RAM 14, e.g. the most recent 100 or 500 measurements. The measurements are also linearly processed by rounding and range scaling to produce 100 reduced measurements in a second file in the RAM 14. This file is cyclically read out to a digital-to-analog converter 18 to produce a voltage on a terminal 22 for application to an oscilloscope which provides a display from which features of the measurements (e.g. a trend or a periodic component) can be seen. In order to allow for flyback and reset the 100 reduced measurements are held in a file of larger capacity (e.g. 130 or 150 measurements) which is cyclically read out. As the oldest of the 100 measurements is read a driver 19 provides a trigger pulse on a terminal 23 for the oscilloscope external trigger input. Various linear and non-linear algorithms for deriving the second file from the history file are described.
摘要翻译：数字仪器由由CPU 10控制的模拟 - 数字转换器17表示，以以规律的间隔进行测量。数字测量被存储在RAM 14中的历史文件中，例如。最近的100或500次测量。测量也通过舍入和范围缩放进行线性处理，以在RAM14中的第二个文件中产生100个缩减的测量值。该文件被循环地读出到数模转换器18，以在终端22上产生用于应用的电压提供示波器，其提供显示器，从中可以看到测量的特征（例如趋势或周期性分量）。为了允许反激和复位，将100个减少的测量值保持在循环读出的较大容量（例如130或150个测量）的文件中。当读取100个测量中最老的时，驱动器19在示波器外部触发输入的端子23上提供触发脉冲。描述用于从历史文件导出第二文件的各种线性和非线性算法。

80. 发明授权

US4514683A Tamper indicating and theft preventing electrical meter 失效
标题翻译：防篡改指示和防盗电表
公开(公告)号：US4514683A
公开(公告)日：1985-04-30
申请号：US431814
申请日：1982-09-30
申请人： Richard L. Deibert , Gary L. Mikeal
发明人： Richard L. Deibert , Gary L. Mikeal
IPC分类号： G01R11/24 , G01R1/00
CPC分类号： G01R11/24
摘要： A watt-hour meter with a rotatable metering movement responsive to the flow of electrical energy through the meter having a flagging means that indicates if someone has tampered with the meter by attempting to drive the metering movement in reverse and a stop element to prevent the metering movement from rotating in reverse.
摘要翻译：具有响应于通过仪表的电能流动的可旋转计量运动的瓦特计具有标记装置，该标记装置指示是否有人通过反向驱动计量运动和停止元件来篡改仪表，以防止计量从相反的旋转运动。

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