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1. 发明授权

US11885837B2 Ultra-low leakage test verification circuit 有权
公开(公告)号：US11885837B2
公开(公告)日：2024-01-30
申请号：US17991190
申请日：2022-11-21
申请人： Automatic Timing & Controls, Inc.
发明人： Roger Clarke
IPC分类号： G01R19/165 , G01R31/52 , G01R31/327 , G01R31/26
CPC分类号： G01R19/16519 , G01R19/16523 , G01R31/2621 , G01R31/327 , G01R31/52
摘要： A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.

2. 发明授权

US11506692B2 Ultra-low leakage test verification circuit 有权
公开(公告)号：US11506692B2
公开(公告)日：2022-11-22
申请号：US16948405
申请日：2020-09-17
申请人： Automatic Timing & Controls, Inc.
发明人： Roger Clarke
IPC分类号： G01R19/165 , G01R31/52 , G01R31/327 , G01R31/26
摘要： A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.

3. 发明申请

US20020135748A1 Adjustable mirror for collimated beam laser sensor 失效
标题翻译：准直光束激光传感器可调镜
公开(公告)号：US20020135748A1
公开(公告)日：2002-09-26
申请号：US09815880
申请日：2001-03-23
申请人： AUTOMATIC TIMING & CONTROLS, INC.
发明人： George D. LaPolice
IPC分类号： G01C003/00 , G01C003/08 , G01C005/00
CPC分类号： G01S17/48 , G01S7/4813 , G01S7/4816 , G01S17/026
摘要： A laser diode (22) emits laser light which is collimated into parallel rays with a collimating lens (24). The collimated beams travel about 5 to 50 cm before being reflected back to an adjustable mirror (28), to a fixed mirror (30), and then on to a photoreceiver (34). The adjustable mirror (28) is pivoted by turning an adjusting screw (40). The adjustable mirror (28) has a toothed cam (48) on its backside that mate with the threads of the adjusting screw (40). When the adjusting screw (40) is turned, it forces the cam to move with it, thus changing the angle of the adjustable mirror (28). A ball lens (32) focuses the reflected light onto the photoreceiver (34). The photoreceiver (34) and laser diode (22) are synchronized so that the receiver (34) can only receive light during appropriate windows of time corresponding to when the laser light was emitted. The photoreceiver (34) has the ability to tell when it is and when it is not receiving laser light and has the ability to initiate action based upon that information.
摘要翻译：激光二极管（22）发射与准直透镜（24）准直成平行光的激光。准直光束行进约5至50厘米，然后被反射回可调节镜（28），固定在反光镜（30）上，然后再转到光接收器（34）上。可调镜（28）通过转动调节螺钉（40）来枢转。可调镜（28）在其后侧具有与调节螺钉（40）的螺纹配合的齿形凸轮（48）。当调节螺钉（40）转动时，它迫使凸轮随之移动，从而改变可调镜（28）的角度。球透镜（32）将反射光聚焦到光接收器（34）上。光接收器（34）和激光二极管（22）被同步，使得接收器（34）只能在对应于激光发射时的合适的时间窗口内接收光。光接收器（34）具有能够判断何时以及何时不接收激光并具有基于该信息启动动作的能力。

4. 发明申请

US20220082594A1 ULTRA-LOW LEAKAGE TEST VERIFICATION CIRCUIT 有权
公开(公告)号：US20220082594A1
公开(公告)日：2022-03-17
申请号：US16948405
申请日：2020-09-17
申请人： Automatic Timing & Controls, Inc.
发明人： Roger Clarke
IPC分类号： G01R19/165
摘要： A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.

5. 发明申请

US20230090456A1 ULTRA-LOW LEAKAGE TEST VERIFICATION CIRCUIT 有权
公开(公告)号：US20230090456A1
公开(公告)日：2023-03-23
申请号：US17991190
申请日：2022-11-21
申请人： Automatic Timing & Controls, Inc.
发明人： Roger Clarke
IPC分类号： G01R19/165 , G01R31/52 , G01R31/327 , G01R31/26
摘要： A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.

6. 发明授权

US2850686A Magnetic coupling devices 失效
标题翻译：磁耦合装置
公开(公告)号：US2850686A
公开(公告)日：1958-09-02
申请号：US41978554
申请日：1954-03-30
申请人： AUTOMATIC TIMING CONTROLS INC
发明人： MACGEORGE WILLIAM D
IPC分类号： G01D5/06 , G01F23/60
CPC分类号： G01D5/06 , G01F23/60

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