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    • 5. 发明授权
    • Advanced detection of memory device removal, and methods, devices and connectors
    • 高级检测存储器件拆卸,以及方法,设备和连接器
    • US08189420B2
    • 2012-05-29
    • US12478422
    • 2009-06-04
    • James CookePeter FeeleyVictor TsaiWilliam H. RadkeNeal GalboChad Cobbley
    • James CookePeter FeeleyVictor TsaiWilliam H. RadkeNeal GalboChad Cobbley
    • G11C5/14
    • G06F13/4068
    • Memory devices, connectors and methods for terminating an operation are provided, including a memory device configured to terminate an internal operation such as a programming or erase operation responsive to receiving a signal during removal of the memory device from a connector, such as a socket. The memory device may be specially configured to generate the removal signal, such as by including a dedicated removal terminal. The memory card may respond to the signal by terminating a programming or erase operation before power is lost. The removal terminal may have a dimension that is different from a dimension of a power terminal through which the memory device receives power. Alternatively, the connector may be specially configured to generate a signal that causes a host to terminate programming or erase operations in the memory device prior to memory card removal, such as by including a switch that is actuated when the memory device moves to a pre-power loss position.
    • 提供了用于终止操作的存储器件,连接器和方法,包括响应于在从诸如插座的连接器移除存储器设备期间接收信号而终止诸如编程或擦除操作之类的内部操作的存储器件。 存储器件可以被特别地配置为产生去除信号,例如通过包括专用的移除终端。 存储卡可以通过在断电之前终止编程或擦除操作来响应信号。 移除终端可以具有不同于存储设备通过其接收电力的功率端子的尺寸的尺寸。 或者,连接器可以被特别地配置成产生一个信号,使得主机在存储卡移除之前终止在存储器设备中的编程或擦除操作,例如通过包括当存储器件移动到预定位置时被致动的开关, 断电位置
    • 6. 发明申请
    • Packaged microelectronic devices with interconnecting units and methods for manufacturing and using the interconnecting units
    • 具有互连单元的封装微电子器件以及用于制造和使用互连单元的方法
    • US20070063335A1
    • 2007-03-22
    • US11516455
    • 2006-09-05
    • Chad Cobbley
    • Chad Cobbley
    • H01L23/48
    • H01L23/3121H01L21/565H01L23/13H01L23/4985H01L24/48H01L24/83H01L2224/4824H01L2224/83H01L2924/00014H01L2924/14H01L2924/15311H01L2924/181H01L2924/3025Y10T29/49146Y10T29/49171H01L2924/00H01L2224/45099H01L2224/45015H01L2924/207
    • Methods and apparatuses for encapsulating a microelectronic die or other components in the fabrication of packaged microelectronic devices. In one aspect of the invention, a packaged microelectronic device assembly includes a microelectronic die, a substrate attached to the die, a protective casing covering a portion of the substrate, and a barrier projecting away from the surface of the substrate. The microelectronic die can have an integrated circuit and a plurality of bond-pads operatively coupled to the integrated circuit. The substrate can have a cap-zone defined by an area that is to be covered by the protective casing, a plurality of contact elements arranged in the cap-zone, a plurality of ball-pads arranged in a ball-pad array outside of the cap-zone, and a plurality of conductive lines coupling the contact elements to the ball-pads. The contact elements are electrically coupled to corresponding bond-pads on the microelectronic die, and the protective casing covers the cap-zone. The barrier on the surface of the substrate is configured so that at least a portion of the barrier is outside of the cap-zone and adjacent to at least a portion of the molded section. The barrier is a seal that inhibits the thermosetting material of the protective casing from covering a portion of the substrate outside of the cap-zone. As such, the barrier prevents thermosetting material from leaking between the substrate and a mold outside of the cap-zone during a molding process.
    • 用于将微电子管芯或其他部件封装在封装的微电子器件的制造中的方法和装置。 在本发明的一个方面,封装的微电子器件组件包括微电子管芯,连接到管芯的衬底,覆盖衬底的一部分的保护壳体以及远离衬底的表面突出的阻挡层。 微电子管芯可以具有集成电路和可操作地耦合到集成电路的多个接合焊盘。 衬底可以具有由被保护壳体覆盖的区域限定的帽区域,布置在帽区域中的多个接触元件,布置在球垫阵列外部的球垫阵列中的多个球垫 帽区,以及将接触元件耦合到球垫的多个导线。 接触元件电耦合到微电子管芯上的相应接合焊盘,并且保护套管覆盖盖区。 衬底表面上的阻挡层被构造成使得阻挡层的至少一部分在帽区域的外部并且与模制部分的至少一部分相邻。 阻挡层是抑制保护壳体的热固性材料在盖帽区域外部覆盖基底的一部分的密封件。 因此,在模制过程中,屏障防止热固性材料在盖区之外的基板和模具之间泄漏。