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    • 3. 发明授权
    • System for evaluating and/or improving performance of a CMP pad dresser
    • 用于评估和/或改善CMP抛光垫修整器性能的系统
    • US09475169B2
    • 2016-10-25
    • US14223726
    • 2014-03-24
    • Chien-Min Sung
    • Chien-Min Sung
    • B24B49/00B24D18/00B24B53/02B24B1/00B24B49/18B24B53/017B24D3/28
    • B24B49/186B24B53/017B24D3/28
    • Methods and systems for evaluating and/or increasing CMP pad dresser performance are provided. In one aspect, for example, a method of identifying overly-aggressive superabrasive particles in a CMP pad dresser can include positioning a CMP pad dresser having a plurality of superabrasive particles on an indicator substrate such that at least a portion of the plurality of superabrasive particles of the CMP pad dresser contact the indicator substrate, and moving the CMP pad dresser across the indicator substrate in a first direction such that the portion of the plurality of superabrasive particles create a first marking pattern on the substrate, wherein the first marking pattern identifies a plurality of working superabrasive particles from among the plurality of superabrasive particles.
    • 提供了用于评估和/或增加CMP垫修整器性能的方法和系统。 在一个方面,例如,在CMP抛光修整器中识别过度侵蚀性超研磨颗粒的方法可以包括将具有多个超研磨颗粒的CMP抛光垫修整器定位在指示剂基底上,使得多个超研磨颗粒的至少一部分 所述CMP抛光修整器与所述指示器基板接触,并且沿着第一方向移动所述CMP抛光垫修整器穿过所述指示器基板,使得所述多个超级磨料颗粒的所述部分在所述基板上形成第一标记图案,其中所述第一标记图案标识 多个超研磨颗粒中的多个工作超研磨颗粒。
    • 5. 发明授权
    • CMP pad dresser having leveled tips and associated methods
    • 具有调平技巧和相关方法的CMP抛光垫修整器
    • US09138862B2
    • 2015-09-22
    • US13802112
    • 2013-03-13
    • Chien-Min Sung
    • Chien-Min Sung
    • B24B53/017
    • B24B53/017B24B37/044H01L21/31055H01L21/3212
    • CMP pad dressers having leveled tips and associated methods are provided. In one aspect, for example, a method can include pressing a CMP pad dresser against a CMP pad, where the dresser includes a monolayer of a plurality of superabrasive particles protruding from a matrix layer. The difference in protrusion distance between the highest protruding tip and the second highest protruding tip of the monolayer of superabrasive particles is less than or equal to about 10 microns and the difference in protrusion distance between the highest 10 protruding tips of the monolayer of superabrasive particles are within about 20 microns or less. The method can further include rotating the dresser against the CMP pad such that asperities are cut into the CMP pad having a maximum cutting depth of about 60 microns.
    • 提供具有调平尖端和相关方法的CMP抛光垫修整器。 在一个方面,例如,一种方法可以包括将CMP垫修整器压靠在CMP垫上,其中修整器包括从矩阵层突出的多个超级磨料颗粒的单层。 超级磨料颗粒单层的最高突出尖端和第二高突出尖端之间的突出距离的差异小于或等于约10微米,并且超级磨料颗粒单层的最高10个突出尖端之间的突出距离的差异为 在约20微米以内。 该方法还可以包括将修整器旋转抵靠在CMP垫上,使得粗糙度被切割成具有大约60微米的最大切割深度的CMP垫。
    • 8. 发明申请
    • CHEMICAL MECHANICAL POLISHING CONDITIONER
    • 化学机械抛光调理器
    • US20140302756A1
    • 2014-10-09
    • US14248109
    • 2014-04-08
    • Chien-Min SungWen-Ting Yeh
    • Chien-Min SungWen-Ting Yeh
    • B24B53/017
    • B24B53/017
    • The present invention (utility model application in Taiwan) relates to a chemical mechanical polishing pad dresser, comprising: a substrate; a bonding layer disposed on the substrate; an electroplating layer disposed on the bonding layer; a fixed template disposed on the electroplating layer having a plurality of apertures; and a plurality of abrasive particles corresponding to and set in the apertures, wherein the plurality of abrasive particle fixed in the bonding layer and the substrate by means of the electroplating layer. Therefore, the present invention is not only to avoid damaging the abrasive particles due to the high temperature heating in the production process, but also to solve the corrosion problem of the surface of the chemical mechanical polishing pad dresser by the fixed template and the electroplating layer and to solve simultaneously the pollution problem generating on the polished workpieces by using conventional brazing bonding layer; and, the present invention can also provide to adjust the abrasive particles arrangement and protrude rate through the fixed template, so as to enhance the grinding performance and quality of the chemical mechanical polishing pad dresser.
    • 本发明(台湾实用新型申请)涉及一种化学机械抛光垫修整器,包括:基材; 设置在所述基板上的接合层; 设置在所述接合层上的电镀层; 设置在具有多个孔的电镀层上的固定模板; 以及对应于并设置在所述孔中的多个磨料颗粒,其中所述多个研磨颗粒通过所述电镀层固定在所述粘合层和所述基底中。 因此,本发明不仅是为了避免在生产过程中由于高温加热而损害磨料颗粒,而且还通过固定模板和电镀层来解决化学机械抛光垫修整器表面的腐蚀问题 并通过使用传统的钎焊层同时解决抛光工件产生的污染问题; 并且本发明还可以提供通过固定模板来调节磨料颗粒排列和突出率,从而提高化学机械抛光垫修整器的研磨性能和质量。