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    • 2. 发明授权
    • Access signal adjustment circuits and methods for memory cells in a cross-point array
    • 交叉点阵列中存储单元的访问信号调整电路和方法
    • US08305796B2
    • 2012-11-06
    • US13425247
    • 2012-03-20
    • Christophe ChevallierChang Hua Siau
    • Christophe ChevallierChang Hua Siau
    • G11C11/00
    • G11C13/0033G11C11/21G11C13/0011G11C13/003G11C13/004G11C13/0069
    • Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to generate access signals to facilitate memory operations in scaled arrays of memory elements, such as memory implemented in third dimensional memory technology formed BEOL directly on top of a FEOL substrate that includes data access circuitry. In at least some embodiments, a non-volatile memory device can include a cross-point array having resistive memory elements disposed among word lines and subsets of bit lines, and an access signal generator. The access signal generator can be configured to modify a magnitude of a signal to generate a modified magnitude for the signal to access a resistive memory element associated with a word line and a subset of bit lines. The modified magnitude can be a function of the position of the resistive memory element in the cross-point array.
    • 本发明的实施例一般涉及半导体和存储器技术,更具体地涉及系统,集成电路和方法,用于产生存取信号以促进存储器元件的按比例排列的存储器操作,诸如在形成的第三维存储器技术中实现的存储器 直接位于包含数据访问电路的FEOL基板之上。 在至少一些实施例中,非易失性存储器件可以包括具有布置在字线和位线子集之间的电阻性存储器元件的交叉点阵列和存取信号发生器。 访问信号发生器可被配置为修改信号的大小以产生用于信号访问与字线和位线子集相关联的电阻性存储器元件的修改幅度。 修改的幅度可以是交叉点阵列中的电阻性存储元件的位置的函数。
    • 8. 发明授权
    • Method for contemporaneous margin verification and memory access for memory cells in cross-point memory arrays
    • 交叉点存储器阵列中存储单元的同期保证金验证和存储器访问的方法
    • US07978501B2
    • 2011-07-12
    • US12927247
    • 2010-11-09
    • Christophe ChevallierChang Hua Siau
    • Christophe ChevallierChang Hua Siau
    • G11C11/00
    • G11C13/0069G11C11/5685G11C13/0007G11C13/0033G11C13/004G11C13/0061G11C16/3418G11C16/3431G11C2013/0054G11C2211/5634G11C2211/5646G11C2213/71G11C2213/77
    • Circuitry and methods for restoring data values in non-volatile memory are disclosed. An integrated circuit includes a memory access circuit and a sensing circuit configured to sense a data signal during a read operation to at least one two-terminal non-volatile cross-point memory array. Each memory array includes a plurality of two-terminal memory cells. A plurality of the memory arrays can be fabricated over the substrate and vertically stacked on one another. Further, the integrated circuit can include a margin manager circuit configured to manage a read margin for the two-terminal memory cells substantially during the read operation, thereby providing for contemporaneous read and margin determination operations. Stored data read from the two-terminal memory cells may have a value of the stored data restored (e.g., re-written to the same cell or another cell) if the value is not associated with a read margin (e.g., a hard programmed or hard erased state).
    • 公开了用于恢复非易失性存储器中的数据值的电路和方法。 集成电路包括存储器访问电路和被配置为在至少一个两端非易失性交叉点存储器阵列的读取操作期间感测数据信号的感测电路。 每个存储器阵列包括多个两端存储单元。 可以在衬底上制造多个存储器阵列并且彼此垂直地堆叠。 此外,集成电路可以包括边缘管理器电路,其被配置为基本上在读取操作期间管理两端存储器单元的读取余量,从而提供同时的读取和余量确定操作。 从两端存储单元读取的存储数据可以具有恢复的存储数据的值(例如,重新写入同一单元或另一单元),如果该值不与读取余量相关联(例如,硬编程或 硬擦除状态)。