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1. 发明申请

US20080127713A1 Method and apparatus for distortion measurement imaging 失效
标题翻译：用于失真测量成像的方法和装置
公开(公告)号：US20080127713A1
公开(公告)日：2008-06-05
申请号：US11606768
申请日：2006-11-30
申请人： Correy Robert Ustanik
发明人： Correy Robert Ustanik
IPC分类号： G01B21/00
CPC分类号： G01B11/161 , G01B7/16 , G01B21/32 , G02F1/1303 , G02F1/1309
摘要： A method of calibrating a measurement an inspection system used in the LCD industry is presented. An assembly is created including two substrates coupled by a transducer. Two fixtures also adhere to the substrates and are connected to an interferometer. An inscription is created by marking at least one of the substrates using a reference point on a support table of the measurement and inspection system as a reference. The transducer is then operated to simulate an LCD glass process such as a thermal process or a glass cutting process. Operating the transducer also generates signals that are measured by the interferometer and represent a first distortion measurement. The inscription is then compared to reference mark to determine a second distortion measurement. A comparison of the first distortion measurement and the second distortion measurement are then used to calibrate the measurement and inspection device.
摘要翻译：提出了一种校准液晶显示器行业使用的检测系统的测量方法。创建包括通过换能器耦合的两个基板的组件。两个固定装置也粘附到基板上并连接到干涉仪。通过使用测量和检查系统的支撑台上的参考点来标记至少一个基板来创建题字作为参考。然后操作传感器以模拟LCD玻璃工艺，例如热处理或玻璃切割工艺。操作换能器还产生由干涉仪测量并且表示第一失真测量的信号。然后将铭文与参考标记进行比较，以确定第二失真测量。然后使用第一失真测量和第二失真测量的比较来校准测量和检查装置。

2. 发明申请

US20130135459A1 APPARATUS AND METHODS FOR DETERMINING SURFACE COMPLIANCE FOR A GLASS SURFACE 有权
标题翻译：用于确定玻璃表面的表面符合性的装置和方法
公开(公告)号：US20130135459A1
公开(公告)日：2013-05-30
申请号：US13307418
申请日：2011-11-30
申请人： En Hong , Philip Robert LeBlanc , Correy Robert Ustanik
发明人： En Hong , Philip Robert LeBlanc , Correy Robert Ustanik
IPC分类号： H04N7/18
CPC分类号： G01N21/958 , G01N21/94
摘要： A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.
摘要翻译：提供了一种用于确定玻璃表面的表面质量的方法。该方法包括使用液滴分配装置在玻璃表面上沉积液滴图案。相邻的液滴具有预定的沉积尺寸和预定的沉积间距。使用视觉装置产生滴液图案的丢弃信息。通过分析丢弃信息来检测出超出参数的条件，并提供失去参数条件的指示。

3. 发明申请

US20080204740A1 Distortion measurement imaging system 有权
标题翻译：失真测量成像系统
公开(公告)号：US20080204740A1
公开(公告)日：2008-08-28
申请号：US12072385
申请日：2008-02-26
申请人： David Berg , Jacques Gollier , Douglas S. Goodman , Correy Robert Ustanik
发明人： David Berg , Jacques Gollier , Douglas S. Goodman , Correy Robert Ustanik
IPC分类号： G01N21/958 , G01B9/00
CPC分类号： G01B11/16 , G01N21/958 , G01N2021/9513 , G02B13/22 , G02F1/1303 , G02F1/1309
摘要： A distortion measurement and inspection system is presented. In one embodiment, a vision system is implemented. The vision system performs dual focal plane imaging where simultaneous imaging of two focal planes is simultaneously performed on a sample substrate and a reference substrate to determine distortion. In addition, a highly reflective background is implemented to provide for more resolution during distortion measurement.
摘要翻译：提出了一种失真测量和检测系统。在一个实施例中，实现视觉系统。视觉系统执行双焦平面成像，其中在样本基板和参考基板上同时执行两个焦平面的同时成像以确定变形。此外，实现高反射背景以在失真测量期间提供更多的分辨率。

4. 发明授权

US09488597B2 Apparatus and methods for determining surface compliance for a glass surface 有权
标题翻译：用于确定玻璃表面的表面柔度的装置和方法
公开(公告)号：US09488597B2
公开(公告)日：2016-11-08
申请号：US13307418
申请日：2011-11-30
申请人： En Hong , Philip Robert LeBlanc , Correy Robert Ustanik
发明人： En Hong , Philip Robert LeBlanc , Correy Robert Ustanik
IPC分类号： G01N21/958 , G01N21/94
CPC分类号： G01N21/958 , G01N21/94
摘要： A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.
摘要翻译：提供了一种用于确定玻璃表面的表面质量的方法。该方法包括使用液滴分配装置在玻璃表面上沉积液滴图案。相邻的液滴具有预定的沉积尺寸和预定的沉积间距。使用视觉装置产生滴液图案的丢弃信息。通过分析丢弃信息来检测出超出参数的条件，并提供失去参数条件的指示。

5. 发明申请

US20120053891A1 METHODS AND APPARATUS FOR ESTIMATING GRAVITY-FREE SHAPES 有权
标题翻译：用于估计无重量形状的方法和装置
公开(公告)号：US20120053891A1
公开(公告)日：2012-03-01
申请号：US12870134
申请日：2010-08-27
申请人： John Steele Abbott, III , Daniel R. Harvey , Correy Robert Ustanik
发明人： John Steele Abbott, III , Daniel R. Harvey , Correy Robert Ustanik
IPC分类号： G06F19/00 , G01G9/00
CPC分类号： G01B11/0608 , G01B5/0004 , G01B5/0016
摘要： Methods and apparatus (100,200) for estimating the gravity-free shape of a flexible object (140) such as a thin sheet of glass are provided. In certain embodiments, an estimate of the gravity-free shape is produced using a bed-of-nails (BON) gauge (100) and then the shape is measured at a higher spatial resolution using a second gauge (200), with the theoretical sag between the pins (110) of the BON gauge being subtracted from the shape measured by the second gauge. In other embodiments, shape measurements are performed on both sides of the object (140) and used to estimate the reliability of the gravity-free shape estimate. In further embodiments, the bed-of-nails gauge (100) uses a least squares minimization procedure in adjusting the heights of the pins (110).
摘要翻译：提供了用于估计诸如薄玻璃板的柔性物体（140）的无重力形状的方法和装置（100,200）。在某些实施例中，使用甲床（BON）规（100）产生无重力形状的估计，然后使用第二规（200）以更高的空间分辨率测量形状，理论上从第二量规测量的形状中减去BON表针的销（110）之间的下垂。在其他实施例中，在对象（140）的两侧执行形状测量，并用于估计无重力形状估计的可靠性。在另外的实施例中，钉床（100）在调整销钉（110）的高度时使用最小二乘法最小化程序。

6. 发明授权

US08904822B2 Thickness control of substrates 有权
标题翻译：基材厚度控制
公开(公告)号：US08904822B2
公开(公告)日：2014-12-09
申请号：US13669994
申请日：2012-11-06
申请人： Philip Robert LeBlanc , Correy Robert Ustanik
发明人： Philip Robert LeBlanc , Correy Robert Ustanik
IPC分类号： C03B17/06 , C03B18/04
CPC分类号： C03B17/064 , C03B17/067 , C03C23/0025
摘要： A thickness of at least one preselected portion of a substrate, such as glass substrate for example, is controlled. A laser beam is directed to the at least one preselected portion of the substrate in a viscous state, thereby increasing a temperature and reducing a viscosity of the at least one preselected portion of the substrate in a viscous state sufficiently to cause the at least one preselected portion of the glass substrate to attain a desired thickness. The laser beam after it is generated can be directed to a reflecting surface from which the laser beam is reflected to the at least one preselected portion of the substrate in the viscous state. The substrate can comprise a glass ribbon produced in a downdraw glass forming process for example, and the laser beam can be directed onto a plurality of preselected portions of the glass ribbon.
摘要翻译：对诸如玻璃基板的基板的至少一个预选部分的厚度进行控制。激光束以粘性状态被引导到衬底的至少一个预选部分，从而在粘性状态下充分地增加温度并降低衬底的至少一个预选部分的粘度，以使得至少一个预选玻璃基板的一部分以达到期望的厚度。产生之后的激光束可以被引导到反射表面，激光束从该反射表面被反射到粘性状态的基底的至少一个预选部分。衬底可以包括以例如下拉玻璃形成工艺制造的玻璃带，并且激光束可以被引导到玻璃带的多个预选部分上。

7. 发明授权

US07762119B2 Method and apparatus for distortion measurement imaging 失效
标题翻译：用于失真测量成像的方法和装置
公开(公告)号：US07762119B2
公开(公告)日：2010-07-27
申请号：US11606768
申请日：2006-11-30
申请人： Correy Robert Ustanik
发明人： Correy Robert Ustanik
IPC分类号： G01B3/30
CPC分类号： G01B11/161 , G01B7/16 , G01B21/32 , G02F1/1303 , G02F1/1309
摘要： A method of calibrating a measurement an inspection system used in the LCD industry is presented. An assembly is created including two substrates coupled by a transducer. Two fixtures also adhere to the substrates and are connected to an interferometer. An inscription is created by marking at least one of the substrates using a reference point on a support table of the measurement and inspection system as a reference. The transducer is then operated to simulate an LCD glass process such as a thermal process or a glass cutting process. Operating the transducer also generates signals that are measured by the interferometer and represent a first distortion measurement. The inscription is then compared to reference mark to determine a second distortion measurement. A comparison of the first distortion measurement and the second distortion measurement are then used to calibrate the measurement and inspection device.
摘要翻译：提出了一种校准液晶显示器行业使用的检测系统的测量方法。创建包括通过换能器耦合的两个基板的组件。两个固定装置也粘附到基板上并连接到干涉仪。通过使用测量和检查系统的支撑台上的参考点来标记至少一个基板来创建题字作为参考。然后操作传感器以模拟LCD玻璃工艺，例如热处理或玻璃切割工艺。操作换能器还产生由干涉仪测量并且表示第一失真测量的信号。然后将铭文与参考标记进行比较，以确定第二失真测量。然后使用第一失真测量和第二失真测量的比较来校准测量和检查装置。

8. 发明授权

US07567344B2 Apparatus and method for characterizing defects in a transparent substrate 有权
标题翻译：用于表征透明基板中的缺陷的装置和方法
公开(公告)号：US07567344B2
公开(公告)日：2009-07-28
申请号：US11729299
申请日：2007-03-28
申请人： Philip Robert LeBlanc , Vitor Marino Schneider , Correy Robert Ustanik
发明人： Philip Robert LeBlanc , Vitor Marino Schneider , Correy Robert Ustanik
IPC分类号： G01N21/00
CPC分类号： G01N21/896 , G01N2021/8812 , G01N2021/8825 , G01N2021/8835 , G01N2201/06113
摘要： An apparatus and method for detecting defects in a transparent substrate by simultaneously using a combination of bright field and dark field light sources for illuminating the substrate. The apparatus is capable of detecting both inclusions and surface defects simultaneously while the substrate is in motion, simplifying the characterization of substrates in a manufacturing setting.
摘要翻译：一种用于通过同时使用用于照射衬底的亮场光源和暗场光源的组合来检测透明衬底中的缺陷的装置和方法。该装置能够在基板运动时同时检测夹杂物和表面缺陷，简化了制造设置中的基板的表征。

9. 发明授权

US09031813B2 Methods and apparatus for estimating gravity-free shapes 有权
标题翻译：估计无重力形状的方法和装置
公开(公告)号：US09031813B2
公开(公告)日：2015-05-12
申请号：US12870134
申请日：2010-08-27
申请人： John Steele Abbott, III , Daniel R Harvey , Correy Robert Ustanik
发明人： John Steele Abbott, III , Daniel R Harvey , Correy Robert Ustanik
IPC分类号： G01B7/00 , G01B15/00 , G01B5/20 , G01G9/00 , G01B11/06 , G01B5/00
CPC分类号： G01B11/0608 , G01B5/0004 , G01B5/0016
摘要： Methods and apparatus (100,200) for estimating the gravity-free shape of a flexible object (140) such as a thin sheet of glass are provided. In certain embodiments, an estimate of the gravity-free shape is produced using a bed-of-nails (BON) gauge (100) and then the shape is measured at a higher spatial resolution using a second gauge (200), with the theoretical sag between the pins (110) of the BON gauge being subtracted from the shape measured by the second gauge. In other embodiments, shape measurements are performed on both sides of the object (140) and used to estimate the reliability of the gravity-free shape estimate. In further embodiments, the bed-of-nails gauge (100) uses a least squares minimization procedure in adjusting the heights of the pins (110).
摘要翻译：提供了用于估计诸如薄玻璃板的柔性物体（140）的无重力形状的方法和装置（100,200）。在某些实施例中，使用甲床（BON）规（100）产生无重力形状的估计，然后使用第二规（200）以更高的空间分辨率测量形状，理论上从第二量规测量的形状中减去BON表针的销（110）之间的下垂。在其他实施例中，在对象（140）的两侧执行形状测量，并用于估计无重力形状估计的可靠性。在另外的实施例中，钉床（100）在调整销钉（110）的高度时使用最小二乘法最小化程序。

10. 发明申请

US20140123703A1 THICKNESS CONTROL OF SUBSTRATES 有权
标题翻译：基板厚度控制
公开(公告)号：US20140123703A1
公开(公告)日：2014-05-08
申请号：US13669994
申请日：2012-11-06
申请人： Philip Robert LeBlanc , Correy Robert Ustanik
发明人： Philip Robert LeBlanc , Correy Robert Ustanik
IPC分类号： C03B29/00 , C03B17/06
CPC分类号： C03B17/064 , C03B17/067 , C03C23/0025
摘要： A thickness of at least one preselected portion of a substrate, such as glass substrate for example, is controlled. A laser beam is directed to the at least one preselected portion of the substrate in a viscous state, thereby increasing a temperature and reducing a viscosity of the at least one preselected portion of the substrate in a viscous state sufficiently to cause the at least one preselected portion of the glass substrate to attain a desired thickness. The laser beam after it is generated can be directed to a reflecting surface from which the laser beam is reflected to the at least one preselected portion of the substrate in the viscous state. The substrate can comprise a glass ribbon produced in a downdraw glass forming process for example, and the laser beam can be directed onto a plurality of preselected portions of the glass ribbon.
摘要翻译：对诸如玻璃基板的基板的至少一个预选部分的厚度进行控制。激光束以粘性状态被引导到衬底的至少一个预选部分，从而在粘性状态下充分地增加温度并降低衬底的至少一个预选部分的粘度，以使得至少一个预选玻璃基板的一部分以达到期望的厚度。产生之后的激光束可以被引导到反射表面，激光束从该反射表面被反射到粘性状态的基底的至少一个预选部分。衬底可以包括以例如下拉玻璃形成工艺制造的玻璃带，并且激光束可以被引导到玻璃带的多个预选部分上。

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