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    • 1. 发明授权
    • Detection of the conduction state of an RC-IGBT
    • 检测RC-IGBT的导通状态
    • US08729914B2
    • 2014-05-20
    • US12943079
    • 2010-11-10
    • Daniel Domes
    • Daniel Domes
    • G01R19/14
    • H03K17/18
    • A circuit arrangement includes: a reverse conducting IGBT configured to allow for conducting a load current in a forward direction and in a reverse direction, the IGBT having a load current path and a gate electrode; a gate control unit connected to the gate electrode and configured to activate or deactivate the IGBT by charging or, respectively, discharging the gate electrode in accordance with a gate control signal; a gate driver unit configured to detect whether the IGBT conducts current in the forward direction or the reverse direction by sensing a gate current caused by a change of a voltage drop across the load path due to a changing of the reverse conducting IGBT into its reverse conducting state, the gate control unit further configured to deactivate the IGBT or to prevent an activation of the IGBT via its gate electrode when the gate driver unit detects that the IGBT is in its reverse conducting state.
    • 电路装置包括:反向导通IGBT,被配置为允许在正向和反向导通负载电流,所述IGBT具有负载电流路径和栅电极; 栅极控制单元,连接到所述栅电极并且被配置为通过根据栅极控制信号充电或分别放电所述栅电极来激活或去激活所述IGBT; 栅极驱动器单元,被配置为通过检测由于反向导通IGBT变为其反向导通而在负载路径上的电压降的变化引起的栅极电流来检测IGBT是正向还是反向导通电流 状态,门控制单元还被配置为当栅极驱动器单元检测到IGBT处于其反向导通状态时,通过其栅电极去激活IGBT或者防止IGBT的激活。
    • 8. 发明授权
    • Detection of the zero crossing of the load current in a semiconductor device
    • 检测半导体器件中负载电流的过零点
    • US08471600B2
    • 2013-06-25
    • US13249604
    • 2011-09-30
    • Daniel Domes
    • Daniel Domes
    • H03K5/153
    • H03K17/18H03K17/13
    • A circuit arrangement includes a reverse conducting transistor having a gate electrode and a load current path between an emitter and collector electrode. The transistor is configured to allow for conducting a load current in a forward direction and in a reverse direction through the load current path and activated or deactivated by a respective signal at the gate electrode. The circuit arrangement further includes a gate control unit and a monitoring unit. The gate control unit is connected to the gate electrode and configured to deactivate the transistor or prevent an activation of the transistor via the gate electrode when the transistor is in a reverse conducting state. The monitoring unit is configured to detect a sudden rise of a collector-emitter voltage of the reverse conducting transistor which occurs, when the load current crosses zero, while the transistor is deactivated or activation is prevented by the gate control unit.
    • 电路装置包括具有栅电极和发射极和集电极之间的负载电流路径的反向导通晶体管。 晶体管被配置为允许通过负载电流路径在正向和反向导通负载电流,并且通过栅电极处的相应信号被激活或去激活。 电路装置还包括门控制单元和监视单元。 栅极控制单元连接到栅电极并且被配置为当晶体管处于反向导通状态时,使晶体管停止晶体管或经由栅极电极的激活。 监视单元被配置为检测当负载电流跨越零时发生的反向导通晶体管的集电极 - 发射极电压的突然上升,同时晶体管被禁用或门控制单元的启动被阻止。
    • 9. 发明申请
    • Semiconductor Arrangement
    • 半导体安排
    • US20130043593A1
    • 2013-02-21
    • US13210453
    • 2011-08-16
    • Daniel Domes
    • Daniel Domes
    • H01L23/535
    • H01L25/072H01L23/3735H01L23/49833H01L24/29H01L24/32H01L24/45H01L24/48H01L24/73H01L24/83H01L2224/291H01L2224/29339H01L2224/2939H01L2224/32225H01L2224/45124H01L2224/45147H01L2224/48132H01L2224/48227H01L2224/48228H01L2224/4846H01L2224/48472H01L2224/73265H01L2224/83801H01L2224/8384H01L2924/00011H01L2924/01013H01L2924/01014H01L2924/01015H01L2924/01047H01L2924/1301H01L2924/13055H01L2924/1306H01L2924/13062H01L2924/13091H01L2924/19107H01L2924/3011H02M7/003H01L2924/014H01L2924/00H01L2924/00012H01L2924/01005H01L2924/01201H01L2924/00014
    • A semiconductor arrangement includes a circuit carrier, a bonding wire and at least N half bridge circuits. N is an integer that amounts to at least 1. The circuit carrier includes a first metallization layer, a second metallization layer, an intermediate metallization layer arranged between the first metallization layer and the second metallization layer, a first insulation layer arranged between the intermediate metallization layer and the second metallization layer, and a second insulation layer arranged between the first metallization layer and the intermediate metallization layer. Each of the half bridge circuits includes a first circuit node, a second circuit node and a third circuit node, a controllable first semiconductor switch and a controllable second semiconductor switch. The controllable first semiconductor switch has a first main contact electrically connected to the first circuit node, a second main contact electrically connected to the third circuit node, and a gate contact for controlling an electric current between the first main contact and the second main contact. Accordingly, the controllable second semiconductor switch has a first main contact electrically connected to the second circuit node, a second main contact electrically connected to the third circuit node, and a gate contact for controlling an electric current between the first main contact and the second main contact. The first semiconductor switch and the second semiconductor switch of each of the half bridge circuits are arranged on that side of the first metallization layer facing away from the second insulation layer. The bonding wire is directly bonded to the intermediate metallization layer at a first bonding location.
    • 半导体装置包括电路载体,接合线和至少N个半桥电路。 N是等于至少为1的整数。电路载体包括第一金属化层,第二金属化层,布置在第一金属化层和第二金属化层之间的中间金属化层,布置在中间金属化层之间的第一绝缘层 层和第二金属化层,以及布置在第一金属化层和中间金属化层之间的第二绝缘层。 半桥电路中的每一个包括第一电路节点,第二电路节点和第三电路节点,可控制的第一半导体开关和可控的第二半导体开关。 可控制的第一半导体开关具有电连接到第一电路节点的第一主触点,与第三电路节点电连接的第二主触头,以及用于控制第一主触点和第二主触点之间的电流的栅极触点。 因此,可控制的第二半导体开关具有电连接到第二电路节点的第一主触头,与第三电路节点电连接的第二主触点,以及用于控制第一主触点和第二主触点之间的电流的栅极触点 联系。 每个半桥电路的第一半导体开关和第二半导体开关被布置在第一金属化层的背离第二绝缘层的一侧。 接合线在第一接合位置处直接接合到中间金属化层。