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    • 2. 发明申请
    • Correction of Non-Uniform Sensitivity in an Image Array
    • 图像阵列中非均匀灵敏度的校正
    • US20120008018A1
    • 2012-01-12
    • US13237105
    • 2011-09-20
    • Dmitri JerdevIgor SubbotinIlia Ovsiannikov
    • Dmitri JerdevIgor SubbotinIlia Ovsiannikov
    • H04N9/64
    • H04N5/3572
    • An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
    • 用于成像器装置(例如,CMOS APS)的改进的非均匀灵敏度校正算法。 该算法提供具有灵活边界的区域,其可以根据在给定应用中使用的透镜的类型而被重新配置。 每个区域内的每个像素乘以一个校正因子,取决于特定的区域,同时从阵列中读出像素。 给定像素所需的灵敏度调整量取决于所使用的透镜的类型,并且相同的校正单元可以与多个透镜一起使用,其中针对每个透镜调整区域边界和校正因子。 此外,该算法基于所使用的透镜的中心与APS阵列之间的未对准来对区域边界进行调整。
    • 3. 发明授权
    • Active photosensitive structure with buried depletion layer
    • 具有埋层耗尽层的主动感光结构
    • US07612393B2
    • 2009-11-03
    • US11653860
    • 2007-01-17
    • Dmitri JerdevNail Khaliullin
    • Dmitri JerdevNail Khaliullin
    • H01L29/80
    • H01L27/14679H01L31/1126
    • An imager pixel has a photosensitive JFET structure having a channel region located above a buried charge accumulation region. The channel region has a resistance characteristic that changes depending on the level of accumulated charge in the accumulation region. During an integration period, incident light causes electrons to be accumulated inside the buried accumulation region. The resistance characteristic of the channel region changes in response to a field created by the charges accumulated in the accumulation region. Thus, when a voltage is applied to one side of the channel, the current read out from the other side is characteristic of the amount of stored charges.
    • 成像器像素具有感光JFET结构,其具有位于掩埋电荷累积区上方的沟道区。 通道区域具有根据累积区域中的累积电荷的电平而变化的电阻特性。 在积分期间,入射光使得电子被积聚在掩埋积聚区域内。 沟道区域的电阻特性响应于由累积区域积累的电荷产生的场而发生变化。 因此,当向通道的一侧施加电压时,从另一侧读出的电流是存储电荷量的特征。
    • 4. 发明授权
    • Lag cancellation in CMOS image sensors
    • CMOS图像传感器的滞后消除
    • US07417677B2
    • 2008-08-26
    • US10636534
    • 2003-08-08
    • Gennadiy A. AgranovDmitri Jerdev
    • Gennadiy A. AgranovDmitri Jerdev
    • H04N5/335H04N5/217
    • H04N5/3597H04N5/374
    • A pixel cell with improved lag characteristics without increased noise. The pixel cell according to embodiments of the invention includes a photo-conversion device and a floating diffusion region switchably coupled to the photo-conversion device. The pixel cell includes a reset transistor, which has a first terminal electrically connected to the floating diffusion region and a second terminal switchably coupled to first and second voltage sources. The first voltage source is higher than the second voltage source. The pixel cell operates by returning a potential on the photo-conversion device to a value approximately equal to a value of a potential barrier between the photo-conversion device and the floating diffusion region prior to generating charge in the photo-conversion device.
    • 具有改进的滞后特性而不增加噪声的像素单元。 根据本发明的实施例的像素单元包括光转换装置和可转换地耦合到光转换装置的浮动扩散区域。 像素单元包括复位晶体管,其具有电连接到浮动扩散区域的第一端子和可切换地耦合到第一和第二电压源的第二端子。 第一电压源高于第二电压源。 像素单元通过在光转换装置中产生电荷之前将光转换装置上的电位返回到大致等于光转换装置和浮动扩散区域之间的势垒的值的值来操作。