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    • 2. 发明授权
    • Test handler and method for operating the same for testing semiconductor devices
    • 用于测试半导体器件的测试处理器和操作方法
    • US08653845B2
    • 2014-02-18
    • US13296421
    • 2011-11-15
    • Jae-Gyun ShimYun-Sung NaIn-Gu JeonTae-Hung KuDong-Han Kim
    • Jae-Gyun ShimYun-Sung NaIn-Gu JeonTae-Hung KuDong-Han Kim
    • G01R31/20
    • G01R31/2893G01R31/2886
    • A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
    • 提供了一种测试处理器,其包括测试托盘,至少一个打开单元和位置改变装置。 测试盘在其侧面对准多个插入件。 每个插件在其上载入至少一个半导体器件。 打开单元在测试托盘的一侧的一部分打开插入件。 位置改变装置移动至少一个开口单元,使得至少一个开口单元可以位于测试托盘的一侧的另一部分,使得至少一个开口单元可以在所述另一个开口单元处打开插入件 测试托盘一侧的一部分。 本发明可以根据半导体器件尺寸,生产成本和部件更换时间的变化来减少更换部件的数量。
    • 6. 发明授权
    • Test handler and method for operating the same for testing semiconductor devices
    • 用于测试半导体器件的测试处理器和操作方法
    • US08159252B2
    • 2012-04-17
    • US12097398
    • 2007-02-09
    • Jae-Gyun ShimYun-Sung NaIn-Gu JeonTae-Hung KuDong-Han Kim
    • Jae-Gyun ShimYun-Sung NaIn-Gu JeonTae-Hung KuDong-Han Kim
    • G01R31/20
    • G01R31/2893G01R31/2886
    • A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.
    • 提供了一种用于操作用于测试半导体器件的测试处理器的测试处理器和方法。 测试处理器包括位于打开装置的一侧的测试托盘,其中排列有多个插入件,其中每个插入件包括装载在其上的至少一个半导体器件,至少一个开口单元,用于在一个部分处打开插入件 并且位置改变装置包括电动机,其包括用于沿着测试托盘的接触表面移动至少一个开口单元的驱动滑轮,使得至少一个打开单元改变测试托盘上的位置并且位于 在测试托盘的一侧的另一部分,以便在测试托盘的一侧的另一部分处打开插入件。