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    • 5. 发明授权
    • Apparatus and method for inspecting circuit structures
    • 用于检查电路结构的装置和方法
    • US07880875B2
    • 2011-02-01
    • US12280922
    • 2007-02-28
    • Kees ModdemeyerHenri Johannes Petrus VinkPieter Willem Herman de Jager
    • Kees ModdemeyerHenri Johannes Petrus VinkPieter Willem Herman de Jager
    • G01N21/00
    • G01N21/8806G01N21/956
    • An apparatus is described for scanning a circuit structure. The apparatus has a linear sensor (16) for detecting light intensity as a function of position along the sensor. A transport mechanism (12) moves a circuit structure (10), such as a PCB or a wafer relative to the sensor. The circuit structure is illuminated with an illumination system (14) that comprises a hollow cylinder (144) with a mainly diffusively and/or specularly reflecting inner wall surface. The cylinder is arranged in parallel with the sensor and has a first slit (40) and a second slit (42) located so that a virtual plane runs through the sensor, the first and second slit to a location for the circuit structure under inspection. The illumination system furthermore comprises a linear light source (146) in the cylinder or the inner wall of the cylinder. In an embodiment the illumination system comprises a splitting mirror (22) in the cylinder to reflect light to the circuit structure.
    • 描述了用于扫描电路结构的装置。 该装置具有用于根据传感器检测作为位置的函数的光强度的线性传感器(16)。 传送机构(12)相对于传感器移动诸如PCB或晶片的电路结构(10)。 电路结构用包括具有主要扩散和/或镜面反射的内壁表面的中空圆柱体(144)的照明系统(14)照亮。 气缸与传感器平行布置,并且具有第一狭缝(40)和第二狭缝(42),第一狭缝(40)和第二狭缝(42)定位成使得虚拟平面穿过传感器,第一和第二狭缝到被检查的电路结构的位置。 照明系统还包括气缸中的线性光源(146)或气缸的内壁。 在一个实施例中,照明系统包括在气缸中的反射镜(22)以将光反射到电路结构。